IP Library Granted Patent US 11,754,548
Granted Patent B2
US 11,754,548 · App. 16/822,880 · Granted Sep 12, 2023

Method of in vitro cellular assay, cell circuit board, and method of manufacturing cell circuit board

Inventors: Waka Lin (Tokyo, JP); Shusaku Shiomoto (Kanagawa, JP)
Assignee: Ricoh Company, Ltd.
G01N33/4836C12N5/0619C12N2506/45
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Quick Facts
Patent No.
US 11,754,548
App. No.
16/822,880
Granted
Sep 12, 2023
Kind
B2
Abstract

A method of in vitro cellular assay includes measuring an electrical activity of at least two cell populations in a plurality of cell populations that are disposed to be spaced apart from each other and connected to each other via a neurite, in which at least one of the at least two cell populations for which the electrical activity is measured is a cell population including at least one kind of neural cell, and the at least two cell populations each exhibit different electrical activity properties at a point when the electrical activity is measured.

Claims (22)

1. A method of in vitro cellular assay, comprising:

measuring an electrical activity of at least two cell populations in a plurality of cell populations that are disposed to be spaced apart from each other and connected to each other via a neurite, wherein each cell population is a group of cells comprising two or more cells,

and checking for synchronization of burst of electrical activity between the at least two cell populations,

wherein the electrical activity is at least one selected from the group consisting of a burst frequency of synchronized bursts of the cell population, a burst amplitude, a burst pattern, a burst periodicity, an oscillation frequency of neural oscillation, an oscillation amplitude, and an oscillation phase,

wherein at least one of the at least two cell populations for which the electrical activity is measured is a cell population including at least one kind of neural cell, and

wherein the at least two cell populations each exhibit different electrical activity properties at a point when the electrical activity is measured.

2. The method according to claim 1 , wherein, at the point when the electrical activity is measured, the cell populations each exhibit at least one different electrical activity property selected from the group consisting of a firing frequency, a firing spike amplitude, a firing pattern, a burst frequency, a burst amplitude, a burst pattern, a burst periodicity, an oscillation frequency, an oscillation amplitude, and an oscillation phase.

3. The method according to claim 1 , wherein the neural cell is differentiation-induced from a stem cell.

4. The method according to claim 1 , wherein the plurality of cell populations are all derived from a stem cell.

5. The method according to claim 3 , wherein the stem cell is an induced pluripotent stem cell.

6. The method according to claim 1 , wherein the at least two cell populations are all cell populations including neural cells.

7. The method according to claim 1 , wherein the measurement of the electrical activity is performed using an electrode.

8. The method according to claim 1 , further comprising adding an agent of interest to at least one of the at least two cell populations.

9. The method according to claim 8 , further comprising assessing an effect of a candidate agent on the cell populations according to a result of the measurement of the electrical activity.

10. The method according to claim 1 , further comprising cutting the neurite.

11. The method of claim 1 , wherein the electrical activity is a burst frequency of synchronized bursts of the cell population.

12. The method of claim 1 , wherein the electrical activity is a burst amplitude.

13. The method of claim 1 , wherein the electrical activity is a burst pattern.

14. The method of claim 1 , wherein the electrical activity is a burst periodicity.

15. The method of claim 1 , wherein the electrical activity is an oscillation frequency of neural oscillation.

16. The method of claim 1 , wherein the electrical activity is an oscillation amplitude.

17. The method of claim 1 , wherein the electrical activity is an oscillation phase.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 18, 2020
From: LIN, WAKA; SHIOMOTO, SHUSAKU
To: RICOH COMPANY, LTD.
Reel/Frame 052156/0132 →
Priority Claims (2)
JP 2019-052464 · Mar 20, 2019 · national
JP 2019-171697 · Sep 20, 2019 · national
Continuity (1)
Related Publication 20200300835A1 · Sep 24, 2020