Supercontinuum radiation source and associated metrology devices
A supercontinuum radiation source including a modulator being operable to modulate pump laser radiation including a train of radiation pulses to provide modulated pump laser radiation, the modulation being such to selectively provide a burst of the pulses; and a hollow-core photonic crystal fiber being operable to receive the modulated pump laser radiation and excite a working medium contained within the hollow-core photonic crystal fiber so as to generate supercontinuum radiation.
1. A radiation source comprising:
a modulator configured to modulate pump laser radiation comprising a train of radiation pulses to provide modulated pump laser radiation, the modulation being such to selectively provide one or more bursts of the pulses, the one or more bursts having a temporal delay longer than a temporal delay between successive individual pump pulses; and
a hollow-core photonic crystal fiber configured to receive the modulated pump laser radiation having the one or more bursts and excite a working medium contained within the hollow-core photonic crystal fiber so as to generate broadband radiation.
2. The radiation source as claimed in claim 1 , wherein a period between successive individual pulses of the train of radiation pulses prior to modulation is the same as a period between successive individual pulses of the burst of pulses of the modulated pump laser radiation.
3. The radiation source as claimed in claim 1 , wherein the modulation is such that a temporal delay between successive bursts is over 2 times greater than a temporal delay between successive individual pump pulses.
4. The radiation source as claimed in claim 3 , configured so that the number of pump pulses per burst and the temporal delay between bursts is controllable.
5. The radiation source as claimed in claim 1 , wherein the modulator comprises an opto-mechanical and/or electro-optical modulator.
6. The radiation source as claimed in claim 1 , wherein the modulator comprises one or more selected from: one or more acoustic-optical filters, one or more flip/galvo mirrors, one or more motorized shutters or one or more rotating blades.
7. The radiation source as claimed in claim 1 , wherein the modulator is configured to provide one or more intermediate pulses between successive bursts and/or provide a variable burst length of each burst.
8. The radiation source as claimed in claim 7 , wherein one or more parameters of the one or more intermediate pulses and/or variable burst length is optimized for high uniformity of average output power of the radiation source over a time period of less than 60 seconds.
9. The radiation source as claimed in claim 7 , wherein one or more parameters of the one or more intermediate pulses and/or variable burst length is optimized for high uniformity of average output power of the radiation source over a time period of less than 1 second.
10. The radiation source as claimed in claim 1 , further comprising a pump laser configured to output the train of pump pulses.
11. The radiation source as claimed in claim 1 , wherein the modulator is configured to receive a control signal, and modulate the pump laser radiation in dependence of the control signal.
12. The radiation source as defined in claim 1 , wherein the broadband radiation comprises a wavelength range of 200 nm to 2000 nm, or a sub-range of at least 400 nm within this range.
13. A metrology device comprising:
a substrate support configured to support a substrate;
the radiation source of claim 11 ;
an optical system configured to direct the broadband radiation from the radiation source to the substrate; and
a processor operable to generate the control signal.
14. The metrology device as claimed in claim 13 , wherein the processor is configured to synchronize generation of a burst of pulses with performance of a measurement by the metrology device.
15. The metrology device as claimed in claim 13 , wherein the metrology device is operable as scatterometer metrology apparatus.
16. The metrology device as claimed in claim 13 , wherein the metrology device is operable as a level sensor or an alignment sensor.
17. A lithographic apparatus comprising at least one metrology device as claimed in claim 16 for performing alignment and/or levelling metrology.
18. A method comprising:
modulating pump laser radiation comprising a train of radiation pulses to provide modulated pump laser radiation, the modulation being such to selectively provide one or more bursts of the pulses, the one or more bursts having a temporal delay longer than a temporal delay between successive individual pump pulses;
receiving the modulated pump laser radiation having the one or more bursts in a hollow-core photonic crystal fiber; and
exciting a working medium contained within the hollow-core photonic crystal fiber using the modulated pump laser radiation having the one or more bursts so as to generate broadband radiation.
19. The method as claimed in claim 18 , wherein a period between successive individual pulses of the train of radiation pulses prior to modulation is the same as a period between successive individual pulses of the burst of pulses of the modulated pump laser radiation.
20. The method as claimed in claim 18 , wherein the modulation is such that a temporal delay between successive bursts is over 2 times greater than a temporal delay between successive individual pump pulses.