IP Library › Granted Patent US 11,776,744
Granted Patent B2
US 11,776,744 · App. 17/235,246 · Granted Oct 3, 2023

Multilayer ceramic capacitor and manufacturing method thereof

Inventors: Young Joo Oh (Seoul, KR); Jung Rag Yoon (Goseong-gun, KR); Min Kee Kim (Yongin-si, KR); In Hee Cho (Anseong-si, KR)
Assignee: SAMHWA CAPACITOR CO., LTD.
H01G4/012C04B35/468H01G4/008H01G4/1227H01G4/30C04B2235/66
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Quick Facts
Patent No.
US 11,776,744
App. No.
17/235,246
Granted
Oct 3, 2023
Kind
B2
Abstract

Provided is a multilayer ceramic capacitor having dielectric layers and internal electrode layers laminated alternately on one another. Each internal electrode layer comprises a common ceramic material containing 3 to 25% by weight of rare earth elements, and through the rare earth elements, high dielectric layers are formed on the interfaces between the dielectric layers and the internal electrode layers.

Claims (13)

1. A multilayer ceramic capacitor having dielectric layers and internal electrode layers laminated alternately on one another, wherein each internal electrode layer comprises a common ceramic material containing 3 to 25% by weight of rare earth oxide, and through the rare earth oxide, high dielectric layers are formed on interfaces between the dielectric layers and the internal electrode layers,

wherein the common ceramic material further comprises 70 to 90% by weight of barium titanate (BaTiO 3 ) as a base material, 0.3 to 1.0% by weight of nickel oxide (NiO), 0 to 1.5% by weight of barium carbonate (BaCO 3 ), and 0 to 1.8% by weight of silicon dioxide (SiO 2 ).

2. The multilayer ceramic capacitor according to claim 1 , wherein grain sizes of the high dielectric layers and thicknesses of the dielectric layers satisfy the following relation expression 1:

0.1≤ D c /t d ≤1  [Relation expression 1]

(wherein D c represents the grain sizes of the high dielectric layers and t d represents the thicknesses of the dielectric layers).

3. The multilayer ceramic capacitor according to claim 1 , wherein grain sizes of the high dielectric layers and thicknesses of the dielectric layers satisfy the following relation expression 2:

0.4 ≤D c /t d ≤0.8  [Relation expression 2]

(wherein D c represents the grain sizes of the high dielectric layers and t d represents the thicknesses of the dielectric layers).

4. The multilayer ceramic capacitor according to claim 1 , wherein grain sizes of the high dielectric layers are in a range of 200 to 400 nm.

5. The multilayer ceramic capacitor according to claim 1 , wherein thicknesses of the dielectric layers are in a range of 0.5 to 2 μm.

6. The multilayer ceramic capacitor according to claim 1 , wherein the rare earth oxide comprises one or more rare earth elements selected from the group consisting of lanthanum (La), samarium (Sm), and neodymium (Nd).

7. The multilayer ceramic capacitor according to claim 1 , wherein the rare earth oxide is lanthanum oxide (La 2 O 3 ).

8. The multilayer ceramic capacitor according to claim 1 , wherein the dielectric layers and the internal electrode layers are alternately laminated on one another to form 300 to 1,000 layers.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2021
From: OH, YOUNG JOO; YOON, JUNG RAG; KIM, MIN KEE; CHO, IN HEE
To: SAMHWA CAPACITOR CO., LTD.
Reel/Frame 055975/0567 →
Priority Claims (2)
KR 10-2020-0059740 · May 19, 2020 · national
KR 10-2021-0033315 · Mar 15, 2021 · national
Continuity (1)
Related Publication 20210366653A1 · Nov 25, 2021