Specimen inspection apparatus and specimen inspection method
According to an embodiment of a specimen inspection apparatus, the specimen inspection apparatus may comprise: a radiation unit; a reflection unit; a focus adjusting unit; a reception unit; and a control unit. The specimen inspection apparatus may comprise: a radiation unit for emitting a terahertz wave; a reflection unit for changing the path of a terahertz wave emitted from the radiation unit; a focus adjusting unit for forming an irradiation region on a specimen according to the path of the terahertz wave; a reception unit for receiving individual terahertz waves obtained by reflection, by the specimen, of the terahertz wave irradiated onto the first region; and a control unit for controlling the distance between at least two elements among the plurality of elements, and detecting whether the specimen is defective, according to the reflectivity difference between the terahertz waves.
1. A specimen inspection apparatus comprising:
one or more light sources configured to irradiate terahertz waves;
a mirror configured to change a path of the terahertz waves irradiated from the one or more light sources;
one or more lenses configured to form a first region on a specimen along the path of the terahertz waves, wherein a distance between the mirror and the one or more lenses is a first distance, the first region includes a second region and a third region, and the second region is spaced apart from the third region by a second distance;
a sensor configured to receive the terahertz waves, which are irradiated onto the first region and respectively reflected from the specimen; and
a processor configured to control at least one of the first distance and the second distance and detect whether the specimen is defective according to a difference between reflectivity of the terahertz waves,
wherein, when the first distance ranges from 57 mm to 61 mm, the second region has a diameter ranging from 64 mm to 67 mm, and the third region respectively has an appropriate diameter,
wherein the appropriate diameter refers to a diameter allowing the detection of whether or not the specimen is defective.
2. The specimen inspection apparatus of claim 1 , wherein the appropriate diameter has a deviation ranging from 0.2% to 2% on the basis of a minimum value thereof.
3. The specimen inspection apparatus of claim 2 , wherein the appropriate diameter of the third region ranges from 67.5 mm to 68.5 mm.
4. The specimen inspection apparatus of claim 2 , wherein, when the first distance ranges from 58 mm to 60 mm, the appropriate diameter of the third region ranges from 67.5 mm to 68.5 mm or from 75.4 mm to 75.8 mm.
5. The specimen inspection apparatus of claim 2 , wherein, when the first distance ranges from 59 mm to 60 mm, the appropriate diameter of the third region ranges from 67.5 mm to 68.5 mm, from 75.4 mm to 75.8 mm, or from 87 mm to 87.6 mm.
6. The specimen inspection apparatus of claim 2 , wherein, when the first distance is 60 mm, the appropriate diameter of the third region ranges from 68 mm to 103 mm.
7. The specimen inspection apparatus of claim 2 , wherein, when the first distance ranges from 60 mm to 61 mm, the appropriate diameter of the third region ranges from 102.5 mm to 102.8 mm.
8. The specimen inspection apparatus of claim 2 , wherein a light source of the terahertz waves is a continuous-type or pulsed-type.
9. The specimen inspection apparatus of claim 2 , wherein a wavelength of the terahertz waves ranges from 30 μm to 3 mm.
10. The specimen inspection apparatus of claim 2 , wherein the second distance is determined based on an angle at which the mirror is rotated according to a signal from the processor.
11. The specimen inspection apparatus of claim 2 , wherein:
the specimen includes an electronic element or a transparent electrode; and
the electronic element or the transparent electrode includes any one of a transparent polymer substrate, glass, and quartz which are coated with a metal material.
12. The specimen inspection apparatus of claim 11 , wherein the metal material includes at least one of indium tin oxide, indium zinc oxide, fluorine-doped tin oxide, and metal nanowires.
13. A specimen inspection method comprising:
irradiating, by one or more light sources, terahertz waves;
changing, via a mirror, a path of the terahertz waves irradiated from the one or more light sources;
forming, via one or more lenses, a first region on a specimen using the terahertz waves, wherein a distance between the mirror and the one or more lenses is a first distance, the first region includes a second region and a third region, and the second region is spaced apart from the third region by a second distance;
receiving, via a sensor, the terahertz waves, which are irradiated onto the first region and respectively reflected from the specimen; and
controlling, via a processor, at least one of the first distance and the second distance and detecting whether the specimen is defective according to a difference between reflectivity of the terahertz waves,
wherein, when the first distance ranges from 57 mm to 61 mm, the second region has a diameter ranging from 64 mm to 67 mm, and the third region respectively has an appropriate diameter,
wherein the appropriate diameter refers to a diameter allowing the detection of whether or not the specimen is defective.