Microtexture region characterization systems and methods
View Patent ↗The present disclosure provides methods and systems for the characterization of a microtexture of a sample, component, or the like. The methods may include methods of determining a service life limiting region of a component, determining a treatment method for a component, and/or selecting components from a batch of components for use in production. The characterization may include calculating a microtexture level indicator from ultrasonic C-scan images for various samples, regions, components, or the like. The microtexture level indicator may include at least one of an average peak factor, a standard deviation of peak amplitude, and/or a baseband bandwidth.
1. A method, comprising:
scanning a plurality of regions of a component with an ultrasonic transducer;
calculating a peak factor for each region in the plurality of regions, the peak factor configured to compare a local peak amplitude to a mean amplitude; and
determining a limiting region in the plurality of regions, the limiting region corresponding to a maximum peak factor.
2. The method of claim 1 , wherein the peak factor comprises at least one of an average peak factor, a standard deviation of peak amplitudes, and a baseband bandwidth.
3. The method of claim 1 , wherein the scanning is performed in a tank filled with a fluid, and wherein the component is disposed in the tank.
4. The method of claim 1 , wherein the peak factor of each region in the plurality of regions corresponds to an average peak factor over a range of peaks from the scanning.
5. The method of claim 1 , further comprising comparing the peak factor of the plurality of regions.
6. The method of claim 1 , wherein the limiting region is a service life limiting region of the component.
7. A method, comprising:
scanning a plurality of samples with an ultrasonic transducer, each sample in the plurality of samples being different;
calculating a peak factor for each sample in the plurality of samples, the peak factor configured to compare a local peak amplitude to mean amplitude; and
determining a microtexture level of each sample in the plurality of samples based on the peak factor.
8. The method of claim 7 , wherein each sample in the plurality of samples corresponds to a different heat treatment of an alloy.
9. The method of claim 7 , further comprising selecting a heat treatment for an alloy corresponding to a lowest microtexture level in the plurality of samples.
10. The method of claim 7 , wherein the peak factor comprises at least one of an average peak factor, a standard deviation of peak amplitudes, and a baseband bandwidth.
11. The method of claim 7 , further comprising comparing the peak factor for each sample in the plurality of samples.
12. The method of claim 7 , wherein the scanning is performed in a tank filled with a fluid, and wherein the sample is disposed in the tank.
13. A method, comprising:
scanning a batch of components with an ultrasonic transducer;
calculating a peak factor for each component in the batch of components, the peak factor configured to compare a local peak amplitude to mean amplitude; and
scrapping a portion of the batch of components in response to the peak factor of each component in the portion of the batch of components exceeding a peak factor threshold.
14. The method of claim 13 , further comprising scanning a plurality of regions of a component in the batch of components with the ultrasonic transducer prior to scanning a remaining portion of the batch of components; and characterizing a limiting region in the plurality of regions, the limiting region corresponding to a maximum peak factor.
15. The method of claim 14 , wherein the peak factor for each component is determined from the limiting region in the plurality of regions.
16. The method of claim 13 , wherein the peak factor comprises at least one of an average peak factor, a standard deviation of peak amplitudes, and a baseband bandwidth.
17. The method of claim 13 , further comprising comparing the microtexture level indicator for each component in the batch of components.
18. The method of claim 13 , wherein the scanning is performed in a tank filled with a fluid, and wherein the component is disposed in the tank.