IP Library › Granted Patent US 11,792,545
Granted Patent B2
US 11,792,545 · App. 17/678,268 · Granted Oct 17, 2023

Electronic circuit for compensating a voltage level against a variation of temperature, and an image sensor including the same

Inventors: Jaehoon Jun (Suwon-si, KR); Han Yang (Seoul, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H04N25/709H04N25/75
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Quick Facts
Patent No.
US 11,792,545
App. No.
17/678,268
Granted
Oct 17, 2023
Kind
B2
Abstract

An image sensor including: a pixel array including first and second pixels connected to a column line; a row driver to provide the first pixel with a first selection signal based on a clamp voltage, and to provide the second pixel with a second selection signal based on a selection voltage, wherein the first pixel outputs a first output voltage in response to the first selection signal, and the second pixel outputs a second output voltage in response to the second selection signal, wherein the first and second output voltages are output as a pixel signal through the column line, wherein a voltage of the pixel signal corresponds to a voltage obtained by clamping the second output voltage with the first output voltage, and wherein a change in a voltage level of the first output voltage due to a temperature is compensated for by the clamp voltage.

Claims (57)

1. An image sensor, comprising:

a pixel array including a first pixel and a second pixel, wherein the first pixel and the second pixel are connected to a column line;

a row driver configured to provide the first pixel with a first selection signal based on a clamp voltage, and to provide the second pixel with a second selection signal based on a selection voltage,

wherein the first pixel outputs a first output voltage in response to the first selection signal, and the second pixel outputs a second output voltage in response to the second selection signal,

wherein the first output voltage and the second output voltage are output as a pixel signal through the column line,

wherein a voltage of the pixel signal corresponds to a voltage obtained by clamping the second output voltage with the first output voltage, and

wherein a change in a voltage level of the first output voltage due to a temperature is compensated for by the clamp voltage.

2. The image sensor of claim 1 , further comprising:

a clamp voltage generating circuit configured to generate the clamp voltage.

3. The image sensor of claim 2 , wherein the clamp voltage generating circuit includes:

a bandgap reference circuit configured to generate a first voltage; and

a buffer circuit configured to generate the clamp voltage based on the first voltage.

4. The image sensor of claim 3 , wherein a voltage level of the first voltage decreases as the temperature increases.

5. The image sensor of claim 3 , wherein the clamp voltage generating circuit further includes:

a temperature feedback circuit configured to generate a second voltage based on a temperature signal including information about a temperature change and to adjust the second voltage to correspond to the temperature change, and

wherein, as the temperature increases, a voltage level of the clamp voltage is decreased by the first voltage and the second voltage.

6. The image sensor of claim 1 , wherein the first pixel includes a first select transistor connected with the column line,

wherein the second pixel includes a second select transistor connected with the column line,

wherein the row driver provides the first selection signal, which is based on the clamp voltage, to a gate terminal of the first select transistor and provides the second selection signal, which is based on the selection voltage, to a gate terminal of the second select transistor,

wherein the first select transistor has a threshold voltage, a voltage level of which decreases as the temperature increases, and

wherein a change in the voltage level of the first output voltage due to a variation in the temperature, is compensated for by the clamp voltage.

7. The image sensor of claim 1 , wherein the row driver includes:

a selection controller configured to provide the clamp voltage or the selection voltage based on a plurality of control signals.

8. An electronic circuit, comprising:

a clamp voltage generating circuit configured to generate a first voltage, wherein a voltage level of the first voltage decreases as a temperature increases; and

a transistor directly connected to a column line of a pixel array and configured to output a second voltage based on the first voltage, wherein a voltage level of a threshold voltage of the transistor decreases as the temperature increases,

wherein a change in a voltage level of the second voltage, which results from a change in the temperature, is compensated for by using the first voltage.

9. The electronic circuit of claim 8 , wherein the clamp voltage generating circuit includes:

a bandgap reference circuit configured to generate a third voltage; and

a buffer circuit configured to generate the first voltage based on the third voltage.

10. The electronic circuit of claim 9 , wherein a voltage level of the third voltage decreases as the temperature increases.

11. The electronic circuit of claim 9 , wherein the clamp voltage generating circuit includes:

a temperature feedback circuit configured to generate a fourth voltage based on a temperature signal including information about a temperature change.

12. The electronic circuit of claim 11 , wherein the temperature feedback circuit adjusts a level of the fourth voltage to correspond to temperature change, and

wherein, as the temperature increases, a voltage level of the first voltage is decreased by the third voltage and the fourth voltage.

13. The electronic circuit of claim 11 , further comprising:

a temperature sensor configured to sense the temperature change and to generate the temperature signal.

14. The electronic circuit of claim 13 , wherein the temperature sensor includes a thermocouple, a resistance thermometer, a thermistor, an integrated circuit temperature sensor, a magnetic temperature sensor, a thermopile, or a pyroelectric temperature sensor.

15. The electronic circuit of claim 9 , wherein the bandgap reference circuit includes:

a first current generator including a first resistor, and configured to generate a first current proportional to the temperature;

a second current generator configured to output a second current that is a mirrored version of the first current to an output node at which the first voltage is formed;

a second resistor connected with the output node, and configured to receive the second current; and

a bipolar junction transistor connected with the second resistor.

16. The electronic circuit of claim 15 , wherein the clamp voltage generating circuit further includes:

a temperature feedback circuit configured to generate a fourth voltage based on a temperature signal including information about a temperature change,

wherein a voltage level of a voltage across the second resistor increases as the temperature increases, and

wherein the temperature change is sensed based on the increased voltage level.

17. The electronic circuit of claim 15 , wherein a voltage level of the third voltage decreases as the temperature increases.

18. An operating method of an electronic device, comprising:

generating a clamp voltage, wherein a voltage level of the clamp voltage decreases as a temperature increases;

applying the clamp voltage to a transistor that is directly connected to a column line of a pixel array, wherein a voltage level of a threshold voltage of the transistor decreases as the temperature increases; and

compensating for a change in a voltage level of an output voltage of the transistor, which is due to a change in the threshold voltage, based on the clamp voltage.

19. The method of claim 18 , wherein the generating of the clamp voltage includes:

sensing a temperature change;

generating a temperature compensation voltage based on the temperature change; and

generating the clamp voltage based on the temperature compensation voltage and a first voltage that a bandgap reference circuit generates.

20. The method of claim 19 , wherein the temperature change is based on a change in a voltage level of an internal voltage of the bandgap reference circuit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2022
From: JUN, JAEHOON; YANG, HAN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 059074/0802 →
Priority Claims (1)
KR 10-2021-0088933 · Jul 7, 2021 · national
Continuity (1)
Related Publication 20230020850A1 · Jan 19, 2023