IP Library › Granted Patent US 11,796,594
Granted Patent B2
US 11,796,594 · App. 17/204,355 · Granted Oct 24, 2023

PWM capture function for event analysis

Inventors: Flemming Johansen (Kolding, DK); Lars Opstrup Poulsen (Morud, DK)
Assignee: SCHNEIDER ELECTRIC IT CORPORATION
G01R31/3277H03K3/017
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Quick Facts
Patent No.
US 11,796,594
App. No.
17/204,355
Granted
Oct 24, 2023
Kind
B2
Abstract

According to one example, an electrical device is provided comprising electrical-device components, a first memory configured to store data temporarily, a second memory, the second memory being non-volatile memory, and a control device configured to acquire data indicative of at least one parameter of at least one electrical-device component of the electrical-device components responsive to a sample condition being met, store the acquired data in the first memory, determine that a fault condition exists based on the acquired data, the fault condition being indicative of a fault of one or more of the electrical-device components, and store the acquired data in the second memory responsive to determining that the fault condition exists.

Claims (39)

1. An electrical device comprising:

electrical-device components including one or more switching devices;

a first memory configured to store data temporarily;

a second memory, the second memory being non-volatile memory; and

a control device configured to:

provide pulse-width modulation (PWM) signals to the one or more switching devices;

acquire data indicative of at least one parameter of at least one electrical-device component of the electrical-device components responsive to a sample condition being met, wherein the sample condition includes a transition in at least one PWM signal of the PWM signals;

store the acquired data in the first memory;

determine that a fault condition exists based on the acquired data, the fault condition being indicative of a fault of one or more of the electrical-device components; and

store the acquired data in the second memory responsive to determining that the fault condition exists.

2. The electrical device of claim 1 , wherein the first memory is a buffer.

3. The electrical device of claim 2 , wherein the buffer is a first-in, first-out buffer.

4. The electrical device of claim 1 , wherein the second memory includes ferroelectric random-access memory.

5. The electrical device of claim 1 , wherein the fault condition is indicative of a fault of at least one of the one or more switching devices.

6. The electrical device of claim 1 , wherein the sample condition includes a threshold period of time elapsing since previously acquired data indicative of the at least one parameter of the at least one electrical-device component was most recently acquired by the control device.

7. The electrical device of claim 1 , further comprising a microprocessor configured to provide the acquired data to a visualization system to analyze the fault condition.

8. The electrical device of claim 1 , wherein the electrical-device components include a peak-current detector, and wherein the fault condition includes a peak current being exceeded.

9. The electrical device of claim 1 , wherein the electrical-device components include a desaturation detector, and wherein the fault condition includes a desaturation condition being detected.

10. The electrical device of claim 1 , wherein the acquired data indicative of the at least one parameter of the at least one electrical-device component includes at least one of current data, voltage data, or temperature data.

11. The electrical device of claim 10 , wherein the acquired data includes current data, and wherein the current data is indicative of a current through each switching device of the one or more switching devices.

12. The electrical device of claim 10 , wherein the acquired data includes voltage data, and wherein the voltage data is indicative of a voltage across each switching device of the one or more switching devices.

13. The electrical device of claim 10 , wherein the acquired data includes temperature data, and wherein the temperature data is indicative of an ambient temperature of the at least one electrical-device component of the electrical-device components.

14. A non-transitory computer-readable medium storing thereon sequences of computer-executable instructions for operating an electrical device having electrical-device components including one or more switching devices, a first memory configured to store data temporarily, and a second memory, the second memory being non-volatile memory, and the sequences of computer-executable instructions including instructions that instruct at least one device to:

provide pulse-width modulation (PWM) signals to the one or more switching devices;

acquire data indicative of at least one parameter of at least one electrical-device component of the electrical-device components responsive to a sample condition being met, the sample condition including a transition in at least one PWM signal of the PWM signals;

store the acquired data in the first memory;

determine that a fault condition exists based on the acquired data, the fault condition being indicative of a fault of one or more of the electrical-device components; and

store the acquired data in the second memory responsive to determining that the fault condition exists.

15. The non-transitory computer-readable medium of claim 14 , wherein the sample condition being met includes a threshold period of time elapsing since previously acquired data indicative of the at least one parameter of the at least one electrical-device component was most recently acquired.

16. The non-transitory computer-readable medium of claim 14 , wherein the fault condition includes a peak current being exceeded.

17. The non-transitory computer-readable medium of claim 14 , wherein the fault condition includes a desaturation condition being detected.

18. A method of operating an electrical device having electrical-device components including one or more switching devices, a first memory configured to store data temporarily, and a second memory, the second memory being non-volatile memory, the method comprising:

providing pulse-width modulation (PWM) signals to the one or more switching devices;

acquiring data indicative of at least one parameter of at least one electrical-device component of the electrical-device components responsive to a sample condition being met, the sample condition including a transition in at least one PWM signal of the PWM signals;

storing the acquired data in the first memory;

determining that a fault condition exists based on the acquired data, the fault condition being indicative of a fault of one or more of the electrical-device components; and

storing the acquired data in the second memory responsive to determining that the fault condition exists.

19. The method of claim 18 , wherein the fault condition includes a desaturation condition being detected.

20. The method of claim 18 , wherein the fault condition includes a peak current being exceeded.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2021
From: JOHANSEN, FLEMMING; POULSEN, LARS OPSTRUP
To: SCHNEIDER ELECTRIC IT CORPORATION
Reel/Frame 055631/0343 →
Continuity (2)
Provisional Application 63110167 · Nov 5, 2020
Related Publication 20220137136A1 · May 5, 2022