IP Library › Granted Patent US 11,798,614
Granted Patent B2
US 11,798,614 · App. 17/463,274 · Granted Oct 24, 2023

Automated voltage demarcation (VDM) adjustment for memory device

Inventors: Yi-Min Lin (San Jose, CA); Fangfang Zhu (San Jose, CA); Chih-Kuo Kao (Fremont, CA)
Assignee: MICRON TECHNOLOGY, INC.
G11C11/4074G11C11/4076G11C11/4096G11C29/42
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Quick Facts
Patent No.
US 11,798,614
App. No.
17/463,274
Granted
Oct 24, 2023
Kind
B2
Abstract

A system can include a memory devices and a processing device coupled with the memory devices. The processing device can receive a command and determine whether the command includes a value for a voltage associated with a read at the memory device. The processing device can also, responsive to the command failing to specify the value, select a second value, from multiple values, for the voltage associated with the read at the memory device based at on a duration subsequent to a previous write operation satisfying a threshold criterion. The processing device can also apply the voltage having the second value at memory cells of the memory device to determine a logic state for the memory cells.

Claims (67)

1. A system comprising:

a memory device; and

a processing device, operatively coupled with the memory device, to perform operations comprising:

receiving a memory access command with respect to a set of memory cells of the memory device;

determining whether the memory access command specifies a first voltage demarcation (VDM) value;

responsive to determining that the memory access command does not specify the first VDM value, determining a period of time elapsed since a most recent write operation performed with respect to the set of memory cells;

responsive to determining that the period of time is below a first threshold period of a plurality of periods, comparing the period of time to a second threshold period of the plurality of periods, wherein the first threshold period is a highest threshold period of the plurality of periods;

responsive to determining that the period of time exceeds the second threshold period, selecting a second VDM value of a plurality of predefined VDM values corresponding to respective threshold periods, wherein the second VDM value corresponds to the second threshold period; and

utilizing the second VDM value for performing a memory access operation specified by the memory access command.

2. The system of claim 1 , wherein the operations further comprise:

responsive to determining that the memory access command specifies the first VDM value, utilizing the first VDM value for performing a memory access operation specified by the memory access command.

3. The system of claim 1 , wherein the operations further comprise:

determining whether a register stores a first configuration or a second configuration, wherein selecting the second VDM is performed responsive to determining the register stores the first configuration.

4. The system of claim 3 , wherein the operations further comprise:

responsive to determining the register stores the second configuration, selecting a default VDM value.

5. The system of claim 1 , wherein determining the time elapsed since the most recent write operation further comprises:

storing a first time value associated with performing a previous write operation at the memory device; and

calculating a difference between a current time value and the first time value.

6. The system of claim 5 , wherein the operations further comprise:

receiving a second memory access command to perform a write operation;

storing a third time value associated with performing the write operation corresponding to the second memory access command; and

calculating a difference between the current time value and the third time value.

7. The system of claim 1 , wherein the operations further comprise:

receiving a second memory access command;

determining whether the second memory access command specifies a third VDM value;

responsive to determining that the memory access command does not specify the third VDM value, selecting, based on a second period of time elapsed since the most recent write operation performed with respect to the set of memory cells, a fourth VDM value from the plurality of predefined VDM values; and

utilizing the fourth VDM value for performing a second memory access operation specified by the second memory access command.

8. The system of claim 1 , wherein the memory access command is one of: a read command or a write command.

9. A method, comprising:

receiving a memory access command with respect to a set of memory cells of a memory device;

determining whether the memory access command specifies a first voltage demarcation (VDM) value;

responsive to determining that the memory access command does not specify the first VDM value, determining a period of time elapsed since a most recent write operation performed with respect to the set of memory cells;

responsive to determining that the period of time is below a first threshold period of a plurality of periods, comparing the period of time to a second threshold period of the plurality of periods, wherein the first threshold period is a highest threshold period of the plurality of periods;

responsive to determining that the period of time exceeds the second threshold period, selecting a second VDM value of a plurality of predefined VDM values corresponding to respective threshold periods, wherein the second VDM value corresponds to the second threshold period; and

utilizing the second VDM value for performing a memory access operation specified by the memory access command.

10. The method of claim 9 , further comprising:

responsive to determining that the memory access command specifies the first VDM value, utilizing the first VDM value for performing a memory access operation specified by the memory access command.

11. The method of claim 9 , further comprising:

determining whether a register stores a first configuration or a second configuration, wherein selecting the second VDM value is performed responsive to determining the register stores the first configuration.

12. The method of claim 11 , further comprising:

responsive to determining the register stores the second configuration, selecting a default VDM value.

13. The method of claim 9 , wherein to determine a duration subsequent to a previous write operation, the method further comprises:

storing a first time value associated with performing the previous write operation at the memory device; and

calculating a difference between a current time value and the first time value.

14. The method of claim 13 , further comprising:

receiving a second memory access command to perform a write operation;

storing a third time value associated with performing the write operation corresponding to the second memory access command; and

calculating a difference between the current time value and the third time value.

15. The method of claim 9 , further comprising:

receiving a second memory access command;

determining whether the second memory access command specifies a third VDM value;

responsive to determining that the memory access command does not specify the third VDM value, selecting, based on a second period of time elapsed since the most recent write operation performed with respect to the set of memory cells, a fourth VDM value from the plurality of predefined VDM values; and

utilizing the fourth VDM value for performing a second memory access operation specified by the second memory access command.

16. The method of claim 9 , wherein the command is one of: a read command or a write command.

17. A non-transitory computer readable medium comprising instructions, which when executed by a processing device, cause the processing device to perform operations comprising:

receive a memory access command with respect to a set of memory cells of a memory device;

determining whether the memory access command specifies a first voltage demarcation (VDM) value;

responsive to determining that the memory access command does not specify the first VDM value, determining a period of time elapsed since a most recent write operation performed with respect to the set of memory cells;

responsive to determining that the period of time is below a first threshold period of a plurality of periods, comparing the period of time to a second threshold period of the plurality of periods, wherein the first threshold period is a highest threshold period of the plurality of periods;

responsive to determining that the period of time exceeds the second threshold period, selecting a second VDM value of a plurality of predefined VDM values corresponding to respective threshold periods, wherein the second VDM value corresponds to the second threshold period; and

utilizing the second VDM value for performing a memory access operation specified by the memory access command.

18. The non-transitory computer readable medium of claim 17 , wherein the operations further comprise:

responsive to determining that the memory access command specifies the first VDM value, utilizing the first VDM value for performing a memory access operation specified by the memory access command.

19. The non-transitory computer readable medium of claim 17 , wherein the operation further comprise:

determining whether a register stores a first configuration or a second configuration, wherein selecting the second VDM value is performed responsive to determining the register stores the first configuration.

20. The non-transitory computer readable medium of claim 19 , wherein the operations further comprise:

responsive to determining the register stores the second configuration, selecting a default VDM value.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2021
From: LIN, YI-MIN; ZHU, FANGFANG; KAO, CHIH-KUO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 057661/0224 →
Continuity (1)
Related Publication 20230069439A1 · Mar 2, 2023