IP Library › Granted Patent US 11,804,708
Granted Patent B2
US 11,804,708 · App. 16/812,048 · Granted Oct 31, 2023

Fast triggering electrostatic discharge protection

Inventors: Jauwen Chen (Cupertino, CA); Sunitha Venkataraman (San Jose, CA); Ting Ku (San Jose, CA)
Assignee: NVIDIA CORP.
H02H9/046H01L27/0255H01L27/0277H01L27/0281
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Quick Facts
Patent No.
US 11,804,708
App. No.
16/812,048
Granted
Oct 31, 2023
Kind
B2
Abstract

An electrostatic discharge protection circuit is disclosed. It comprises a stacked drain-ballasted NMOS devices structure and a gate bias circuit. The gate bias circuit includes an inverter, a first gate bias output terminal, and a second gate bias output terminal. The first gate bias output terminal is coupled to a gate of a first one of the drain-ballasted NMOS devices. The second gate bias output terminal runs from an output of the inverter to a gate of a second one of the drain-ballasted NMOS devices.

Claims (15)

1. An electrostatic discharge protection circuit for an IO pad, the electrostatic discharge protection circuit comprising:

a connection between the IO pad and a circuit ground, the connection consisting of a stacked drain-ballasted NMOS devices structure;

wherein a channel of each of the NMOS devices is coupled to a channel of a tuning transistor, the channel of the tuning transistor being directly connected to the circuit ground;

a gate bias circuit comprising:

an inverter directly connected to a power supply rail at its inverting input terminal;

a first gate bias output terminal coupled via a series of diodes to the IO pad and to a gate of a first one of the drain-ballasted NMOS devices; and

a second gate bias output terminal from an output of the inverter to a gate of a second one of the drain-ballasted NMOS devices.

2. The electrostatic discharge protection circuit of claim 1 , wherein the inverter comprises:

an NMOS device;

a PMOS device; and

a drain of the NMOS device coupled to a drain of the PMOS device at a node, the node forming the second gate bias output terminal.

3. The electrostatic discharge protection circuit of claim 2 , wherein a substrate of the PMOS device is coupled to the series of diodes and a substrate of the NMOS device is directly connected to the circuit ground.

4. The electrostatic discharge protection circuit of claim 2 , wherein both of a gate of the PMOS device and a gate of the NMOS device are directly connected via an inverting input terminal of the inverter to the power supply rail.

5. The electrostatic discharge protection circuit of claim 1 , wherein the series of diodes form a voltage level changer between the TO pad and the first gate bias output terminal.

6. The electrostatic discharge protection circuit of claim 1 , wherein the inverter is coupled to invert, at the second gate bias output terminal, a composite of a signal from the power supply rail and a signal from the IO pad.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 7, 2020
From: CHEN, JAUWEN; VENKATARAMAN, SUNITHA; KU, TING
To: NVIDIA CORP.
Reel/Frame 053431/0427 →
Continuity (1)
Related Publication 20210281067A1 · Sep 9, 2021