IP Library › Granted Patent US 11,805,026
Granted Patent B2
US 11,805,026 · App. 16/993,678 · Granted Oct 31, 2023

Channel training using a replica lane

Inventors: Stanley Ames Lackey, Jr. (Boxborough, MA); Damon Tohidi (Markham, CA); Gerald R. Talbot (Boxborough, MA); Edoardo Prete (Arlington, MA)
Assignees: Advanced Micro Devices, Inc.; ATI Technologies ULC
H04L41/147H04L7/06H04L7/10H04L25/14H04L43/0823H04L43/0852H04L43/50H04L7/0041H04L7/043
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Quick Facts
Patent No.
US 11,805,026
App. No.
16/993,678
Granted
Oct 31, 2023
Kind
B2
Abstract

Systems, apparatuses, and methods for utilizing training sequences on a replica lane are described. A transmitter is coupled to a receiver via a communication channel with a plurality of lanes. One of the lanes is a replica lane used for tracking the drift in the optimal sampling point due to temperature variations, power supply variations, or other factors. While data is sent on the data lanes, test patterns are sent on the replica lane to determine if the optimal sampling point for the replica lane has drifted since a previous test. If the optimal sampling point has drifted for the replica lane, adjustments are made to the sampling point of the replica lane and to the sampling points of the data lanes.

Claims (43)

1. An apparatus comprising:

circuitry configured to convey data via a channel comprising a plurality of lanes; and

control logic comprising circuitry configured to:

send, simultaneously, a test pattern on a first lane of the channel and system data on a second lane of the channel;

in response to an indication that a sampling point of the first lane is misaligned:

use adjustment information to adjust the first lane; and

convey the adjustment information via the channel for use in adjusting the second lane of the channel.

2. The apparatus as recited in claim 1 , wherein the adjustment information is based on data received via the channel.

3. The apparatus as recited in claim 1 , wherein the adjustment information corresponds to a delay setting for the first lane.

4. The apparatus as recited in claim 1 , wherein the adjustment information is configured to adjust the sampling point of the first lane.

5. The apparatus as recited in claim 1 , wherein the first lane is a replica lane and the second lane is a data lane, wherein the replica lane is not utilized for carrying system data.

6. An apparatus comprising:

circuitry configured to convey data via a channel comprising a plurality of lanes; and

control logic comprising circuitry configured to:

send, simultaneously, a test pattern on a first lane of the channel and system data on a second lane of the channel;

in response to an indication that a sampling point of the first lane is misaligned:

use adjustment information to adjust the first lane and

perform, using the adjustment information for the first lane, a first adjustment to the sampling point of the second lane.

7. The apparatus as recited in claim 6 , wherein the indication is received via the channel.

8. The apparatus as recited in claim 6 , wherein the first adjustment corresponds to adjustment information received via the channel.

9. The apparatus as recited in claim 7 , wherein the adjustment information is configured to adjust the sampling point of the first lane.

10. The apparatus as recited in claim 6 , wherein the first lane is a replica lane and the second lane is a data lane, wherein the replica lane is not utilized for carrying system data.

11. An apparatus comprising:

circuitry configured to receive data via a channel comprising a plurality of lanes; and

control logic comprising circuitry configured to:

receive, simultaneously, a test pattern on a first lane of the channel and system data on a second lane of the channel;

in response to an indication that a sampling point of the first lane is misaligned:

use adjustment information to adjust the first lane; and

convey the adjustment information via the channel for use in adjusting the second lane of the channel.

12. The apparatus as recited in claim 11 , wherein the adjustment information is based on sampling the test pattern received via the first lane.

13. The apparatus as recited in claim 11 , wherein the adjustment information corresponds to a delay setting for the first lane.

14. The apparatus as recited in claim 11 , wherein the adjustment information is configured to adjust the sampling point of the first lane.

15. The apparatus as recited in claim 11 , wherein the first lane is a replica lane and the second lane is a data lane, wherein the replica lane is not utilized for receiving system data.

16. An apparatus comprising:

circuitry configured to receive data via a channel comprising a plurality of lanes; and

control logic comprising circuitry configured to:

receive, simultaneously, a test pattern on a first lane of the channel and system data on a second lane of the channel;

in response to an indication that a sampling point of the first lane is misaligned

perform, using adjustment information for the first lane, a first adjustment to the sampling point of the second lane.

17. The apparatus as recited in claim 16 , wherein the first adjustment corresponds to adjustment information received via the channel.

18. The apparatus as recited in claim 16 , wherein the first adjustment corresponds to a delay setting for the first lane.

19. The apparatus as recited in claim 16 , wherein the adjustment information is configured to adjust the sampling point of the first lane.

20. The apparatus as recited in claim 16 , wherein the first lane is a replica lane and the second lane is a data lane, wherein the replica lane is not utilized for receiving system data.

Continuity (2)
Continuation 15192287 · Jun 24, 2016
Related Publication 20210028995A1 · Jan 28, 2021
Cited By (1)
US 12,549,463