IP Library › Granted Patent US 11,810,286
Granted Patent B2
US 11,810,286 · App. 17/213,361 · Granted Nov 7, 2023

Display control device and storage medium

Inventors: Kazuhiro Ota (Toyokawa, JP); Takeshi Sonohara (Toyokawa, JP)
Assignee: SINTOKOGIO, LTD.
G06T7/0004G06F3/14G06T3/40G06T7/62G06T7/73G06T11/001G06V10/245G06V10/987G09G5/38G06T2207/30116G06T2207/30204G09G2354/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,810,286
App. No.
17/213,361
Granted
Nov 7, 2023
Kind
B2
Abstract

Provided is the technique that allows an operator or the like to easily grasp a defect contained in a mold. A display control device is configured to carry out: a determination process in which a feature amount of each of defects contained in a mold is determined with reference to an image obtained by image capture of a mold; and a display process in which the image is displayed on a display such that each of the defects in the image is emphasized by a method which is determined according to the determined feature amount.

Claims (28)

1. A display control device comprising:

a controller,

the controller being configured to carry out

a determination process in which a feature amount of each defect contained in a mold is determined based on an image of the mold, the image being obtained by image capture of the mold; and

a display process in which the image is displayed on a display such that each defect contained in the mold is emphasized, each defect being emphasized by a method determined based on the feature amount, determined in the determination process, of each defect contained in the mold.

2. The display control device according to claim 1 , wherein

the feature amount, determined in the determination process, of each defect includes at least a size of the defect, and

in the display process, the controller is configured to cause each defect to be emphasized by superimposing, on the image, a defect figure indicating each defect and superimposing, on the image, a marker indicating each defect having a size not greater than a threshold value.

3. The display control device according to claim 2 , wherein

in the display process, the controller is configured to change at least one of a color, a shape, a position, a size, or a blinking pattern of the marker, which represents the defect, based on the feature amount of the defect indicated by the marker or the feature amount of each defect included in a defect group.

4. The display control device according to claim 1 , wherein

the feature amount, determined in the determination process, of each defect includes at least a size of the defect and a position of the defect, and

in the display process, the controller is configured to cause

each defect to be emphasized by superimposing, on the image, a defect figure indicating each of the defects, and

a defect group, which includes defects in close proximity to each other and having a size not greater than a threshold value, to be emphasized by superimposing, on the image, a marker indicating the defect group.

5. The display control device according to claim 1 , wherein

the feature amount, determined in the determination process, of each defect includes at least a size the defect, and

in the display process, the controller is configured to cause each defect to be emphasized such that, for each defect having a size greater than a threshold value, a defect figure having a size equivalent to the size of the defect is superimposed on the image, and an enlarged image obtained by enlarging a region including a defect having a size not greater than the threshold value is superimposed on the image.

6. The display control device according to claim 5 , wherein

the controller is configured to change at least one of a color, a shape, a position, a size, or a blinking pattern of the enlarged image based on the feature amount of the defect included in the enlarged image or based on the feature amount of each defect included in a defect group.

7. The display control device according to claim 1 , wherein

the feature amount, determined in the determination process, of each defects includes at least a size of the defects and a position of the defects, and

in the display process, the controller is configured to cause each defect to be emphasized such that, for each defect having a size greater than a threshold value, a defect figure of a size equivalent to the size of the defect is superimposed on the image, and an enlarged image obtained by enlarging a region containing a defect group is superimposed on the image, the defect group including defects in close proximity to each other and having a size not greater than the threshold value.

8. The display control device according to claim 1 , wherein

the controller comprises:

at least one processor configured to carry out the determination process and the display process in accordance with a program; and

at least one memory storing the program.

9. A computer-readable non-transitory storage medium storing a control program for controlling the display control device recited in claim 1 , the control program being configured to cause the controller to carry out the determination process and the display process.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2021
From: OTA, KAZUHIRO; SONOHARA, TAKESHI
To: SINTOKOGIO, LTD.
Reel/Frame 055746/0123 →
Priority Claims (2)
JP 2020-061042 · Mar 30, 2020 · national
JP 2021-027727 · Feb 24, 2021 · national
Continuity (1)
Related Publication 20210304392A1 · Sep 30, 2021