Semiconductor device package and a method of manufacturing the same
A semiconductor device package comprises a semiconductor device, a first encapsulant surrounding the semiconductor device, a second encapsulant covering the semiconductor device and the first encapsulant, and a redistribution layer extending through the second encapsulant and electrically connected to the semiconductor device.
1. A semiconductor device package, comprising:
a semiconductor device including a top surface;
a first encapsulant layer accommodating the semiconductor device and comprising an inner sidewall above the top surface of the semiconductor device;
a second encapsulant layer adjacent to the top surface of the semiconductor device and the inner sidewall of the first encapsulant layer;
a redistribution layer disposed within the second encapsulant layer, the redistribution layer including a patterned conductive layer; and
a connection element disposed on the patterned conductive layer,
wherein the inner sidewall of the first encapsulant layer is inclined with respect to the top surface of the semiconductor device from a cross-sectional view, and
wherein the connection element is a solder ball, and a portion of the connection element is lower than a top surface of the second encapsulant layer.
2. The semiconductor device package of claim 1 , wherein a cross sectional profile of the patterned conductive layer in its entirety resembles a T-shape from a cross-sectional view.
3. The semiconductor device package of claim 1 , wherein the patterned conductive layer is disposed on the top surface of the semiconductor device and extends to a vertical projection area of the inner sidewall of the first encapsulant layer.
4. The semiconductor device package of claim 3 , wherein the patterned conductive layer laterally extends beyond the vertical projection area of the inner sidewall of the first encapsulant layer.
5. The semiconductor device package of claim 1 , wherein the first encapsulant layer includes a top surface adjacent to the inner sidewall, and the redistribution layer extends beyond a level of the top surface of the first encapsulant layer.
6. The semiconductor device package of claim 5 , wherein the redistribution layer includes an inner via having a top end proximal to the solder ball and a bottom end proximal to the top surface of the semiconductor device, and the top end has a top width greater than a bottom width of the bottom end.
7. The semiconductor device package of claim 5 , wherein a portion of the patterned conductive layer below the top surface of the first encapsulant layer comprises a step profile.
8. The semiconductor device package of claim 1 , wherein the second encapsulant layer is in contact with the top surface of the semiconductor device and the inner sidewall of the first encapsulant layer.
9. The semiconductor device package of claim 8 , wherein the inner sidewall of the first encapsulant layer forms an obtuse angle with the top surface of the semiconductor device.
10. The semiconductor device package of claim 9 , wherein the first encapsulant layer includes a top surface adjacent to the inner sidewall, and the second encapsulant layer is in contact with the top surface of the first encapsulant layer.
11. The semiconductor device package of claim 1 , wherein the semiconductor device includes a bottom surface opposite to the top surface of the semiconductor device, and an edge of the bottom surface of the semiconductor device is spaced apart from the first encapsulant layer.
12. The semiconductor device package of claim 11 , wherein a bottom surface of the first encapsulant layer is lower than the bottom surface of the semiconductor device.
13. The semiconductor device package of claim 12 , wherein the first encapsulant layer includes fillers.
14. A semiconductor device package, comprising:
a semiconductor device including a top surface;
a second encapsulant layer adjacent to the top surface of the semiconductor device, the second encapsulant layer including a sidewall above the top surface of the semiconductor device and non-perpendicular to the top surface of the semiconductor device from a cross-sectional view;
a redistribution layer disposed within the second encapsulant layer, the redistribution layer including a patterned conductive layer;
a connection element disposed on the patterned conductive layer; and
a first encapsulant layer accommodating the semiconductor device and the second encapsulant layer,
wherein the connection element is a solder ball, and a portion of the connection element is lower than the top surface of the second encapsulant layer, and
wherein the sidewall of the second encapsulant layer forms an interface with the first encapsulant layer, and wherein the interface forms an obtuse angle with the top surface of the semiconductor device in the second encapsulant layer.
15. The semiconductor device package of claim 14 , wherein the second encapsulant layer is in contact with a top surface of the first encapsulant layer.
16. A semiconductor device package, comprising:
a semiconductor device including a top surface;
a second encapsulant layer adjacent to the top surface of the semiconductor device, the second encapsulant layer including a sidewall above the top surface of the semiconductor device and non-perpendicular to the top surface of the semiconductor device from a cross-sectional view;
a redistribution layer disposed within the second encapsulant layer, the redistribution layer including a patterned conductive layer;
a connection element disposed on the patterned conductive layer;
a first encapsulant layer accommodating the semiconductor device and the second encapsulant layer; and
a recess recessed from a bottom surface of the first encapsulant layer,
wherein the connection element is a solder ball, and a portion of the connection element is lower than the top surface of the second encapsulant layer, and
wherein the sidewall of the second encapsulant layer forms an interface with the first encapsulant layer, and wherein the interface forms an obtuse angle with the top surface of the semiconductor device in the second encapsulant layer.
17. The semiconductor device package of claim 16 , wherein a cross sectional profile of the second encapsulant layer above the top surface of the semiconductor device resembles a T-shape.
18. The semiconductor device package of claim 16 , wherein an adhesive layer is disposed in the recess.
19. The semiconductor device package of claim 18 , wherein the adhesive layer laterally overlaps with the semiconductor device.