IP Library › Granted Patent US 11,847,956
Granted Patent B2
US 11,847,956 · App. 18/084,224 · Granted Dec 19, 2023

Scan driver

Inventor: Hai Jung In (Yongin-si, KR)
Assignee: Samsung Display Co., Ltd.
G09G3/2096G09G2310/0267G09G2310/08G09G2330/021
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Quick Facts
Patent No.
US 11,847,956
App. No.
18/084,224
Granted
Dec 19, 2023
Kind
B2
Abstract

A scan driver is disclosed that includes a plurality of stages for supplying scan signals to scan lines. A first stage among the stages includes: a first sub-stage circuit for generating a first scan signal, based on an input signal, a first clock signal, a second clock signal, a first power source, and a second power source; and a first charge pump circuit for supplying a bias voltage to the first sub-stage circuit, based on a third power source. The first sub-stage circuit includes: a first driver for controlling voltages of a first node and a second node, based on the input signal, the first clock signal, the second clock signal, the first power source, and the second power source; a second driver for controlling a voltage of an output node, based on the voltage of the first node, the voltage of the second node, the first power source, and the second power source; and an output unit for outputting the first scan signal through a first output terminal, based on the voltage of the output node, the first power source, and the second power source.

Claims (77)

1. A scan driver comprising:

a plurality of stages configured to supply scan signals to scan lines,

wherein a first stage among the stages includes:

a first sub-stage circuit configured to generate a first scan signal, based on an input signal, a first clock signal, a second clock signal, a first power source, and a second power source; and

a first charge pump circuit configured to supply a bias voltage to the first sub-stage circuit, based on a third power source, and

wherein the first sub-stage circuit includes:

a first driver configured to control voltages of a first node and a second node, based on the input signal, the first clock signal, the second clock signal, the first power source, and the second power source;

a second driver configured to control a voltage of an output node, based on the voltage of the first node, the voltage of the second node, the first power source, and the second power source; and

an output unit configured to output the first scan signal through a first output terminal, based on the voltage of the output node, the first power source, and the second power source.

2. The scan driver of claim 1 , wherein the output unit includes an n-type transistor and a p-type transistor, and

wherein the first charge pump circuit supplies the bias voltage to a back-gate electrode of the n-type transistor included in the output unit.

3. The scan driver of claim 1 , wherein a voltage level of the third power source is lower than a voltage level of the first power source and is higher than a voltage level of the second power source, and

wherein a voltage level of the bias voltage is lower than the voltage level of the second power source.

4. The scan driver of claim 1 , wherein the first driver includes:

a first transistor connected between a first input terminal to which the input signal is supplied and an input node, the first transistor including a gate electrode connected to a second input terminal to which the first clock signal is supplied;

a second transistor including a first electrode connected to a first power input terminal to which a voltage of the first power source is supplied and a gate electrode connected to the second node;

a third transistor connected between a second electrode of the second transistor and the input node, the third transistor including a gate electrode connected to a third input terminal to which the second clock signal is supplied;

a fourth transistor connected between the second node and the second input terminal, the fourth transistor including a gate electrode connected to the input node;

a fifth transistor connected between the second node and a second power input terminal to which a voltage of the second power source is supplied, the fifth transistor including a gate electrode connected to the second input terminal; and

a sixth transistor connected between the input node and the first node, the sixth transistor including a gate electrode connected to the second power input terminal.

5. The scan driver of claim 4 , wherein the first driver further includes a first capacitor connected between the first power input terminal and the second node.

6. The scan driver of claim 1 , wherein the second driver includes:

a seventh transistor connected between a first power input terminal to which a voltage of the first power source is supplied and the output node, the seventh transistor including a gate electrode connected to the second node; and

an eighth transistor connected between the output node and a third input terminal to which the second clock signal is supplied, the eighth transistor including a gate electrode connected to the first node.

7. The scan driver of claim 6 , wherein the second driver further includes a second capacitor connected between the output node and the first node.

8. The scan driver of claim 1 , wherein the output unit includes:

a ninth transistor connected between a first power input terminal to which a voltage of the first power source is supplied and the first output terminal, the ninth transistor including a gate electrode connected to the output node; and

a tenth transistor connected between the first output terminal and a second power input terminal to which a voltage of the second power source is supplied, the tenth transistor including a gate electrode connected to the output node.

9. The scan driver of claim 8 , wherein the ninth transistor is a p-type transistor, and the tenth transistor is an n-type transistor.

10. The scan driver of claim 1 , wherein the first charge pump circuit includes:

an eleventh transistor connected between a third power input terminal to which a voltage of the third power source is supplied and a third node, the eleventh transistor including a gate electrode connected to the third power input terminal;

a twelfth transistor including a first electrode connected to a third input terminal to which the second clock signal is supplied and a gate electrode connected to the third node;

a third capacitor connected between a second electrode of the twelfth transistor and the third node;

a fourth capacitor including a first electrode connected to any one of a first power input terminal to which a voltage of the first power source is supplied, a second power input terminal to which a voltage of the second power source is supplied, and the third power input terminal; and

a thirteenth transistor connected between a second electrode of the fourth capacitor and the third node, the thirteenth transistor including a gate electrode connected to the third node.

11. The scan driver of claim 1 , wherein the first charge pump circuit includes:

a fourteenth transistor including a first electrode connected to a third power input terminal to which a voltage of the third power source is supplied and a gate electrode connected to a second input terminal to which the first clock signal is supplied;

an eleventh transistor connected between a second electrode of the fourteenth transistor and a third node, the eleventh transistor including a gate electrode connected to a second power input terminal to which a voltage of the second power source is supplied;

a twelfth transistor including a first electrode connected to a third input terminal to which the second clock signal is supplied and a gate electrode connected to the third node; and

a third capacitor connected between a second electrode of the twelfth transistor and the third node.

12. The scan driver of claim 11 , wherein the first charge pump circuit further includes:

a fourth capacitor including a first electrode connected to any one of a first power input terminal to which a voltage of the first power source is supplied, the second power input terminal, and the third power input terminal; and

a thirteenth transistor connected between a second electrode of the fourth capacitor and the third node, the thirteenth transistor including a gate electrode connected to the third node.

13. The scan driver of claim 12 , wherein the bias voltage corresponds to a voltage of a node to which the second electrode of the fourth capacitor is connected.

14. The scan driver of claim 11 , wherein the first charge pump circuit further includes:

a fourth capacitor including a first electrode connected to any one of a first power input terminal to which a voltage of the first power source is supplied, the second power input terminal, and the third power input terminal;

a thirteenth transistor including a first electrode connected to a second electrode of the fourth transistor, a second electrode, and a gate electrode; and

a fifteenth transistor connected between a node to which the second electrode and the gate electrode of the thirteenth transistor are connected and the third node, the fifteenth transistor including a gate electrode connected to the third node.

15. A scan driver comprising:

a plurality of sub-stage circuits configured to supply scan signals to scan lines and a plurality of charge pump circuits configured to generate a bias voltage,

wherein each of the sub-stage circuits includes:

a first driver configured to control voltages of a first node and a second node, based on an input signal, a first clock signal, a second clock signal, a first power source, and a second power source;

a second driver configured to control a voltage of an output node, based on the voltage of the first node, the voltage of the second node, the first power source, and the second power source; and

an output unit configured to output a scan signal through an output terminal, based on the voltage of the output node, the first power source, and the second power source, and

wherein a first sub-stage circuit configured to generate a first scan signal as the scan signal and a second sub-stage circuit configured to generate a second scan signal as the scan signal among the sub-stage circuits are commonly connected to a first charge pump circuit among the charge pump circuits.

16. The scan driver of claim 15 , wherein the first charge pump circuit supplies the bias voltage to each of the output unit included in the first sub-stage circuit and the output unit included in the second sub-stage circuit.

17. A scan driver comprising:

a plurality of stages configured to supply first sub-scan signals to first sub-scan lines, and supply second sub-scan signal to second sub-scan lines,

wherein a first stage among the stages includes:

a first sub-stage circuit configured to generate a (1-1)th sub-scan signal and a (2-1)th sub-scan signal, based on an input signal, a first clock signal, a second clock signal, a fourth clock signal, a first power source, and a second power source; and

a first charge pump circuit configured to supply a bias voltage to the first sub-stage circuit, based on a third power source,

wherein the first sub-stage circuit includes:

a first driver configured to control voltages of a first node and a second node, based on the input signal, the first clock signal, the second clock signal, the first power source, and the second power source;

a second driver configured to control a voltage of an output node, based on the voltage of the first node, the voltage of the second node, the first power source, and the fourth clock signal;

a first sub-output unit configured to output the (1-1)th sub-scan signal through a (1-1)th sub-output terminal, based on the voltage of the output node, the first power source, and the second power source; and

a second sub-output unit configured to output the (2-1)th sub-scan signal through a (2-1)th sub-output terminal, based on the voltage of the first node, the voltage of the second node, the first power source, and the second clock signal, and

wherein the (1-1)th sub-scan signal has a pulse of a high level, and the (2-1)th sub-scan signal has a pulse of a low level.

18. The scan driver of claim 17 , wherein the first sub-output unit includes:

a ninth transistor connected between a first power input terminal to which a voltage of the first power source is supplied and the (1-1)th sub-output terminal, the ninth transistor including a gate electrode connected to the output node; and

a tenth transistor connected between the (1-1)th sub-output terminal and a fifth input terminal to which the fourth clock signal is supplied, the tenth transistor including a gate electrode connected to the output node, and

wherein the ninth transistor is a p-type transistor, and the tenth transistor is an n-type transistor.

19. The scan driver of claim 18 , wherein the second sub-output unit includes:

a sixteenth transistor connected between the first power input terminal and the (2-1)th sub-output terminal, the sixteenth transistor including a gate electrode connected to the second node; and

a seventeenth transistor connected between a third input terminal to which the second clock signal is supplied and the (2-1)th sub-output terminal, the seventeenth transistor including a gate electrode connected to the first node.

20. The scan driver of claim 17 , wherein the first stage among the stages receives the fourth clock signal, and

a second stage among the stages receives a third clock signal, and

wherein the fourth clock signal is a signal shifted from the third clock signal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2022
From: IN, HAI JUNG
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 062146/0179 →
Priority Claims (1)
KR 10-2022-0025477 · Feb 25, 2022 · national
Continuity (1)
Related Publication 20230274687A1 · Aug 31, 2023