IP Library › Granted Patent US 11,860,032
Granted Patent B2
US 11,860,032 · App. 17/384,915 · Granted Jan 2, 2024

Photodetector device having avalanche photodiodes two-dimensionally arranged on a compound semiconductor layer and quenching element connected in series to the photodiodes

Inventors: Takuya Fujita (Hamamatsu, JP); Yusei Tamura (Hamamatsu, JP); Kenji Makino (Hamamatsu, JP); Takashi Baba (Hamamatsu, JP); Koei Yamamoto (Hamamatsu, JP)
Assignee: HAMAMATSU PHOTONICS K.K.
G01J1/44H01L27/1446H01L31/02027H01L31/107G01J2001/442G01J2001/4466
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Quick Facts
Patent No.
US 11,860,032
App. No.
17/384,915
Granted
Jan 2, 2024
Kind
B2
Abstract

A photodetector device includes an avalanche photodiode array substrate formed from compound semiconductor. A plurality of avalanche photodiodes arranged to operate in a Geiger mode are two-dimensionally arranged on the avalanche photodiode array substrate. A circuit substrate includes a plurality of output units which are connected to each other in parallel to form at least one channel. Each of the output units includes a passive quenching element and a capacitative element. The passive quenching element is connected in series to at least one of the plurality of avalanche photodiodes. The capacitative element is connected in series to at least one of the avalanche photodiodes and is connected in parallel to the passive quenching element.

Claims (19)

1. A photodetector device comprising:

a first layer in which a plurality of avalanche photodiodes arranged to operate in a Geiger mode are two-dimensionally arranged, the first layer being formed from compound semiconductor; and

a second layer including a plurality of output units connected to each other in parallel to form at least one channel, overlapping the first layer, and being formed from silicon,

wherein each of the output units includes a quenching element connected in series to at least one of the plurality of avalanche photodiodes.

2. The photodetector device according to claim 1 ,

wherein each of the avalanche photodiodes has an active area surrounded by an insulating portion when viewed from the thickness direction of the first layer, and the insulating portion is formed from a trench.

3. The photodetector device according to claim 2 ,

wherein the active area of each of the avalanche photodiodes is formed in a circular shape when viewed from the thickness direction, and

the insulating portion is formed in an annular shape along an edge of the active area.

4. The photodetector device according to claim 2 ,

wherein the first layer is formed from a third layer and a fourth layer disposed on the third layer in such a manner that the third layer is located between the second layer and the fourth layer,

the third layer has a surface facing the second layer, is formed from compound semiconductor, and includes a buffer layer, an absorption layer, an electric field relaxing layer, and

the trench reaches the fourth layer from the surface of the third layer.

5. The photodetector device according to claim 1 ,

wherein the second layer includes a plurality of channels, each of which is formed from the plurality of output units connected to each other in parallel.

6. The photodetector device according to claim 1 ,

wherein the first layer and the second layer are connected through a bump electrode.

7. The photodetector device according to claim 1 ,

wherein the quenching element includes a passive quenching element.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2021
From: FUJITA, TAKUYA; TAMURA, YUSEI; MAKINO, KENJI; BABA, TAKASHI; YAMAMOTO, KOEI
To: HAMAMATSU PHOTONICS K.K.
Reel/Frame 056974/0772 →
Priority Claims (1)
JP 2018-011824 · Jan 26, 2018 · national
Continuity (2)
Continuation 16963312
Related Publication 20210356319A1 · Nov 18, 2021
Cited By (1)
US 12,247,870