Probe head and probe card having same
Proposed are a probe head and a probe card having the same. According to the present disclosure, the probe head of the probe card includes: an upper guide plate having an upper guide hole; a lower guide plate having a lower guide hole; and an intermediate guide plate having an intermediate guide hole and provided between the upper guide plate and the lower guide plate, wherein each of a plurality of probes sequentially passes through the upper guide hole, the intermediate guide hole, and the lower guide hole, and the intermediate guide plate is made of an anodic oxide film.
1. A probe head of a probe card, the probe head comprising:
an upper guide plate having an upper guide hole;
a lower guide plate having a lower guide hole; and
an intermediate guide plate having an intermediate guide hole and provided between the upper guide plate and the lower guide plate,
wherein each of a plurality of probes sequentially passes through the upper guide hole, the intermediate guide hole, and the lower guide hole by insertion of each of the plurality of probes,
wherein at least one of the upper guide plate, the lower guide plate, and the intermediate guide plate includes a first anodic oxide film, a film provided on the first anodic oxide film, and a second anodic oxide film disposed over the first anodic oxide film,
wherein the first anodic oxide film and the second anodic oxide film are bonded to each other by the film, and
wherein the first anodic oxide film includes a first barrier layer and first vertical pores, the second anodic oxide film includes a second barrier layer and second vertical pores, and the first and second barrier layers have a symmetrical structure.
2. The probe head of claim 1 , wherein the film comprises the same hole as at least one of the upper guide hole, the lower guide hole, and the intermediate guide hole.
3. The probe head of claim 2 , wherein the film is a photosensitive film capable of lithography.
4. The probe head of claim 1 , wherein the upper guide hole and the lower guide hole are disposed in different horizontal positions to elastically deform a first portion of each of the plurality of probes between the upper guide hole and the intermediate guide hole, and
wherein a second portion and a third portion of each of the plurality of probes extend in a vertical direction, the second portion being between the intermediate guide hole and the lower guide hole and the third portion being below the lower guide hole.
5. The probe head of claim 4 , wherein each of the upper guide plate and the intermediate guide plate is made of a transparent material.
6. The probe head of claim 1 , wherein each of the upper guide plate, the lower guide plate, and the intermediate guide plate includes the first anodic oxide film, the film, and the second anodic oxide film.
7. A probe card, comprising:
a space transformer having a probe connection pad electrically connected to each of a plurality of probes; and
a probe head provided below the space transformer,
wherein the probe head comprises:
an upper guide plate having an upper guide hole;
a lower guide plate having a lower guide hole; and
an intermediate guide plate having an intermediate guide hole and provided between the upper guide plate and the lower guide plate,
wherein each of the plurality of probes sequentially passes through the upper guide hole, the intermediate guide hole, and the lower guide hole by insertion of each of the plurality of probes,
wherein at least one of the upper guide plate, the lower guide plate, and the intermediate guide plate includes a first anodic oxide film, a film provided on the first anodic oxide film, and a second anodic oxide film disposed over the first anodic oxide film,
wherein the first anodic oxide film and the second anodic oxide film are bonded to each other by the film, and
wherein the first anodic oxide film includes a first barrier layer and first vertical pores, the second anodic oxide film includes a second barrier layer and second vertical pores, and the first and second barrier layers have a symmetrical structure.
8. A guide plate of a probe card, the guide plate comprising:
a first anodic oxide film, a film provided on the first anodic oxide film, and a second anodic oxide film disposed over the first anodic oxide film,
wherein the first anodic oxide film and the second anodic oxide film are bonded to each other by the film, and
wherein the first anodic oxide film includes a first barrier layer and first vertical pores, the second anodic oxide film includes a second barrier layer and second vertical pores, and the first and second barrier layers have a symmetrical structure.