Device interface board supporting devices with multiple different standards to interface with the same socket
An automated test equipment (ATE) apparatus comprising a tester processor operable to generate commands and data for coordinating testing of a plurality of devices under test (DUTs). The ATE further comprises a field programmable gate array (FPGA) communicatively coupled to the tester processor, wherein the FPGA comprises routing logic operable to route signals associated with the commands and data in the FPGA based on a type of the device under test (DUT). Further, the ATE comprises a connector module communicatively coupled to the FPGA comprising a socket to which the DUT connects and further comprising circuitry for routing the signals to a set of pins on the DUT, wherein the set of pins are associated with a first type of DUT. The circuitry can support multiple different DUT types having a common form factor but different pinout assignments.
1. An automated test equipment (ATE) system comprising:
a system controller communicatively coupled to a tester processor, wherein the system controller is operable to transmit instructions to the tester processor;
a field programmable gate array (FPGA) communicatively coupled to the tester processor, wherein the FPGA is operable to internally generate commands and data transparently from the tester processor for testing a device under test (DUT), and wherein the FPGA comprises routing logic operable to route signals associated with the commands and data in the FPGA based on a physical communication interface type of the DUT; and
connection hardware operable to physically connect to different physical communication interface types implemented for devices under test (DUTs) wherein the connection hardware comprises a connector module communicatively coupled to the FPGA, wherein the connector module comprises a socket operable to receive and to connect to the DUT and circuitry for routing the signals via the socket to a set of pins on the DUT, wherein the set of pins is associated with a first physical communication interface type of DUT, wherein the connector module further comprises circuitry for re-routing the signals via the socket to a different set of pins on the DUT, wherein the different set of pins is associated with a second physical communication interface type of DUT which is different from the first physical communication interface type of DUT.
2. The ATE of claim 1 , wherein the first physical communication interface type of DUT comprises a U.2 interface standard DUT.
3. The ATE of claim 1 , wherein the first physical communication interface type of DUT comprises a U.3 interface standard DUT.
4. The ATE of claim 1 , wherein the routing logic comprises a lane swizzle module operable to rewire lanes associated with the signals to lanes that match up with the physical communication interface type of the DUT connected to the connector module.
5. The ATE of claim 1 , wherein the routing logic comprises a lane mask module operable to mask lanes associated with pins on the DUT that are unused.
6. The ATE of claim 1 , wherein the circuitry for routing the signals to the set of pins on the DUT comprises at least two multiplexers and a lane exchange module.
7. The ATE of claim 1 , wherein the second physical communication interface type of DUT comprises a U.3 interface standard.
8. An automated test equipment (ATE) apparatus comprising:
a tester processor operable to generate commands and data for coordinating testing of a plurality of devices under test (DUTs);
a field programmable gate array (FPGA) communicatively coupled to the tester processor, wherein the FPGA comprises routing logic operable to route signals associated with the commands and data in the FPGA based on a physical communication interface type of the DUTs; and
connection hardware operable to physically connect to different physical communication interface types implemented for the DUTs, wherein the connection hardware comprises a connector module communicatively coupled to the FPGA, wherein the connector module comprises a socket operable to receive and to connect to a device under test (DUT) of the DUTs and comprises circuitry for routing the signals via the socket to a set of pins on the DUT, wherein the set of pins is associated with a first physical communication interface type of DUT, wherein the connector module further comprises circuitry for re-routing the signals via the socket to a different set of pins on the DUT, wherein the different set of pins is associated with a second physical communication interface type of DUT.
9. The ATE of claim 8 , wherein the first physical communication interface type of DUT comprises a U.2 interface standard DUT.
10. The ATE of claim 8 , wherein the first physical communication interface type of DUT comprises a U.3 interface standard DUT.
11. The ATE of claim 8 , wherein the circuitry for routing the signals in the connector module supports multiple different physical communication interface types having a common form factor but different pinout assignments.
12. The ATE of claim 8 , wherein the circuitry for routing the signals to the set of pins on the DUT comprises at least two multiplexers and a lane exchange module.
13. A method for testing devices under test (DUTs), the method comprising:
receiving instructions from a system controller at a tester processor, wherein a tester board comprising a field programmable gate array (FPGA) and the tester processor are coupled to the system controller, and wherein the tester processor is operable to coordinate testing of a device under test (DUT);
generating commands and data for testing the DUT;
routing signals associated with the commands and the data in the FPGA based on a physical communication interface type of the DUT;
transmitting, to connection hardware operable to physically connect to different physical communication interface types implemented for the DUTs, the signals via a socket over lanes corresponding to a set of pins on the DUT, wherein the set of pins is associated with a first physical communication interface type of DUT, wherein the connection hardware comprises a connector module communicatively coupled to the FPGA, and wherein the connector module comprises the socket operable to receive and to connect to the DUT; and
for a second physical communication interface type of DUT, re-routing the signals via the socket to a different set of pins on the DUT, wherein the different set of pins is associated with the second physical communication interface type of DUT which is different from the first physical communication interface type of DUT.
14. The method of claim 13 , wherein the first physical communication interface type of DUT is a U.2 interface standard DUT.
15. The method of claim 13 , wherein the second physical communication interface type of DUT is a U.3 interface standard DUT.
16. The method of claim 13 , wherein the routing comprises:
rewiring the signals to the lanes corresponding to the set of pins.
17. The method of claim 16 , wherein the routing further comprises:
masking lanes corresponding to a particular set of pins on the DUT that are unused.
18. The method of claim 13 , wherein the routing is performed by firmware programmed on the FPGA.