Sample manager, system and method

1. A liquid chromatography system comprising:

a solvent delivery system;

a sample manager having a thermal chamber, the thermal chamber including:

a sampling mechanism mounted within the thermal chamber, the sampling mechanism including;

a sample platter mounted therein, the sample platter configured to rotate about a first vertical axis, the sample platter including at least one carrier bay for receiving a sample vial carrier having an array of sample vials loaded therein;

a needle arm configured to rotate about a second vertical axis that is in a fixed position within the thermal chamber, wherein a combination of the rotation of the needle arm and the rotation of the sample platter provides complete coverage over the at least one carrier bay of the sample platter when the second vertical axis of rotation of the needle arm remains in the fixed position; and

a sample delivery system in fluidic communication with the solvent delivery system, the sample delivery system including a sample needle attached to the needle arm, the sample delivery system configured to transfer a first sample from a first sample vial carrier located in the sample platter into a chromatographic flow stream;

a liquid chromatography column located downstream from the solvent delivery system and the sample delivery system; and

a detector located downstream from the liquid chromatography column.

2. The liquid chromatography system of claim 1 , wherein the needle arm includes a belt and pulley drive mechanism.

3. The liquid chromatography system of claim 1 , wherein the needle arm includes a magnetic encoder configured to determine rotational position of the needle arm.

4. The liquid chromatography system of claim 1 , wherein the sample delivery system includes a fluidic tube located between the sample needle and the liquid chromatography column, wherein the fluidic tube includes a coiled portion configured to expand and contract during rotation of the needle arm.

5. The liquid chromatography system of claim 1 , wherein the sample platter is circular and wherein the at least one bay includes a first bay, a second bay, a third bay and a fourth bay disposed equidistant about a perimeter of the circular sample platter.

6. The liquid chromatography system of claim 1 , further comprising a control system, the control system configured to control the rotational movement of each of the sample platter and the needle arm, the control system configured to control a calibration process that includes the steps of:

moving the sample platter so that a first opening in the sample platter aligns with the sample needle on the needle arm;

moving the needle arm above the aligned first opening and recording a first encoder position of each of the sample platter and the needle arm;

moving the sample platter so that a second opening in the sample platter aligns with the sample needle on the needle arm;

moving the needle arm above the aligned second opening and recording a second encoder position of each of the sample platter and the needle arm; and

with the known first and second encoder positions, back-calculating the geometric parameters of the sample platter and the needle arm to calibrate the movement of the sample platter and the needle arm.

7. The liquid chromatography system of claim 1 , wherein the combination of the rotation of the needle arm and the rotation of the sample platter is configured to move the sample needle directly above any location covered by a respective perimeter of the at least one carrier bay.

8. The liquid chromatography system of claim 1 , wherein the combination of the rotation of the needle arm and the rotation of the sample platter is configured to provide complete coverage of the needle arm over an entirety of a working portion surface area of the sample platter.

9. A liquid chromatography sample manager comprising:

a thermal chamber;

a sample platter mounted in the thermal chamber, the sample platter configured to rotate about a first vertical axis, the sample platter including at least one carrier bay for receiving a sample vial carrier having an array of sample vials loaded therein;

a needle arm mounted within the thermal chamber, the needle arm configured to rotate about a second vertical axis that is in a fixed position within the thermal chamber, wherein a combination of the rotation of the needle arm and the rotation of the sample platter provides complete coverage over the at least one carrier bay of the sample platter when the second vertical axis of rotation of the needle arm remains in the fixed position; and

a sample delivery system in fluidic communication with a solvent delivery system, the sample delivery system including a sample needle attached to the needle arm, the sample delivery system configured to transfer a first sample from a first sample vial carrier located in the sample platter into a chromatographic flow stream.

10. The liquid chromatography sample manager of claim 9 , wherein the needle arm includes a belt and pulley drive mechanism.

11. The liquid chromatography sample manager of claim 9 , wherein the needle arm includes a magnetic encoder configured to determine rotational position of the needle arm.

12. The liquid chromatography sample manager of claim 9 , wherein the sample delivery system includes a fluidic tube located between the sample needle and a liquid chromatography column, wherein the fluidic tube includes a coiled portion configured to expand and contract during rotation of the needle arm.

13. The liquid chromatography sample manager of claim 9 , wherein the sample platter is circular and wherein the at least one bay includes a first bay, a second bay, a third bay and a fourth bay disposed equidistant about a perimeter of the circular sample platter.

14. The liquid chromatography sample manager of claim 9 , further comprising a control system, the control system configured to control the rotational movement of each of the sample platter and the needle arm, the control system configured to control a calibration process that includes the steps of:

moving the sample platter so that a first opening in the sample platter aligns with the sample needle on the needle arm;

moving the needle arm above the aligned first opening and recording a first encoder position of each of the sample platter and the needle arm;

moving the sample platter so that a second opening in the sample platter aligns with the sample needle on the needle arm;

moving the needle arm above the aligned second opening and recording a second encoder position of each of the sample platter and the needle arm; and

with the known first and second encoder positions, back-calculating the geometric parameters of the sample platter and the needle arm to calibrate the movement of the sample platter and the needle arm.

15. The liquid chromatography sample manager of claim 9 , wherein the needle arm is configured to rotate about the second vertical axis at least 45 degrees and wherein the sample platter is configured to rotate about the first vertical axis 360 degrees.

16. The liquid chromatography sample manager of claim 9 , wherein the combination of the rotation of the needle arm and the rotation of the sample platter is configured to move the sample needle directly above any location covered by a respective perimeter of the at least one carrier bay.

17. The liquid chromatography sample manager of claim 9 , wherein the combination of the rotation of the needle arm and the rotation of the sample platter is configured to provide complete coverage of the needle arm over an entirety of a working portion surface area of the sample platter.

18. A method of calibrating a sample manager comprising:

rotating a sample platter within the sample manager about a first vertical axis so that a first opening in the sample platter aligns with a sample needle on a needle arm, the sample platter including at least one carrier bay for receiving a sample vial carrier having an array of sample vials loaded therein;

rotating the needle arm about a second vertical axis that is in a fixed position within a thermal chamber above the aligned first opening and recording a first encoder position of each of the sample platter and the needle arm, wherein a combination of the rotation of the needle arm and the rotation of the sample platter provides complete coverage over the at least one carrier bay of the sample platter when the second vertical axis of rotation of the needle arm remains in the fixed position;

moving the sample platter so that a second opening in the sample platter aligns with the sample needle on the needle arm;

moving the needle arm above the aligned second opening and recording a second encoder position of each of the sample platter and the needle arm; and

with the known first and second encoder positions, back-calculating the geometric parameters of the sample platter and the needle arm to calibrate the movement of the sample platter and the needle arm.

19. The method of claim 18 , wherein the combination of the rotating of the needle arm and the rotating of the sample platter is configured to move the sample needle directly above any location covered by a respective perimeter of the at least one carrier bay.

20. The method of claim 18 , wherein the combination of the rotating of the needle arm and the rotating of the sample platter is configured to provide complete coverage of the needle arm over an entirety of a working portion surface area of the sample platter.