Circuit testing and diagnosis
Systems and methods for testing a lightning protection circuit are provided. Aspects include providing an alternating current (AC) test signal source coupled to a circuit under test, the circuit under test comprising a lightning protection circuit having a threshold voltage, a first filter, and a second filter, providing a direct current (DC) voltage supply in series with a filtering device, the filtering device coupled to the AC test signal source, providing a first capacitor coupled between the AC test signal source and the circuit under test, operating the DC voltage supply and the AC test signal source to provide a first test signal to the circuit under test, wherein the first test signal comprise a first voltage that exceeds the threshold voltage, measuring a first impedance of the circuit under test responsive to providing the first test signal, wherein the first impedance corresponds to the first filter.
1. A system comprising:
an alternating current (AC) test signal source coupled to a circuit under test, wherein the circuit under test comprising a lightning protection circuit having a threshold voltage, a first filter, and a second filter;
a direct current (DC) voltage supply;
a filtering device coupled between the DC voltage supply and the AC test signal source;
a first capacitor coupled between the AC test signal source and the circuit under test; and
a controller configured to:
operate the DC voltage supply and the AC test signal source to provide a first test signal to the circuit under test, wherein the first test signal includes a first voltage that exceeds the threshold voltage; and
measure a first impedance of the circuit under test responsive to providing the first test signal to the circuit under test, wherein the first impedance corresponds to an impedance of the first filter.
2. The system of claim 1 , wherein the controller is further configured to:
operate the DC voltage supply and the AC test signal source to provide a second test signal to the circuit under test, wherein the second test signal comprises a second voltage that is below the threshold voltage;
measure a second impedance of the circuit under test responsive to providing the second test signal to the circuit under test, wherein the second impedance corresponds to the first filter, the lightning protection circuit, and the second filter; and
determining at least one fault for the circuit under test based on the first impedance and the second impedance.
3. The system of claim 1 , wherein the lightning protection circuit is in series between the first filter and the second filter.
4. The system of claim 3 , wherein the first filter is closer to an external input of the circuit under test than the second filter.
5. The system of claim 1 , wherein the lightning protection circuit is configured to block the first test signal based on the first voltage exceeding the threshold voltage.
6. The system of claim 1 , wherein the lightning protection circuit is configured to clip the first test signal based on the first voltage exceeding the threshold voltage.
7. The system of claim 1 , wherein the filtering device comprises a line impedance stabilization network (LISN).
8. The system of claim 1 , wherein the first filter comprises a high-intensity radiated field (HIRF) filter.
9. The system of claim 1 , wherein the second filter comprises an electromagnetic interference (EMI) filter.
10. The system of claim 1 , wherein the first capacitor has a capacitance of at least 100 micro-Farads.