Test kit for testing a device under test
A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having at least an interposer substrate sandwiched by a top socket and a nest.
1. A test kit for testing a device under test (DUT), comprising:
a socket structure, for containing the DUT; and
a plunger assembly detachably coupled with the socket structure, wherein the plunger assembly comprises a multi-layered structure comprising at least an interposer substrate sandwiched by a top socket and a nest, wherein the socket structure comprises a bottom socket and an annular socket base secured to a top surface of the bottom socket, wherein the annular socket base surrounds perimeter of the interposer substrate and the top socket.
2. The test kit for testing a DUT according to claim 1 , wherein the plunger assembly further comprises a pressing member coupled to an upper side of the nest.
3. The test kit for testing a DUT according to claim 2 , wherein the pressing member is made of metal.
4. The test kit for testing a DUT according to claim 1 , wherein the socket base comprises a central through hole that allows passage of the DUT and a lower portion of the plunger assembly that vacuum grips the DUT and places the DUT to test site on the socket structure.
5. The test kit for testing a DUT according to claim 4 , wherein the socket base comprises an inner portion around an upper surface of the bottom socket, and wherein a lower portion of the nest is engaged and in direct contact with the inner portion of the socket base.
6. The test kit for testing a DUT according to claim 1 , wherein the nest is made of an electrostatic-discharge (ESD) control material or a static-dissipative material.
7. The test kit for testing a DUT according to claim 2 further comprising:
at least one nozzle for vacuum gripping or holding the DUT, wherein the at least one nozzle penetrates through the nest, the interposer substrate and the top socket.
8. The test kit for testing a DUT according to claim 7 , wherein the at least one nozzle communicates with a connecting chamber disposed between the nest and the pressing member.
9. The test kit for testing a DUT according to claim 1 , wherein the top socket comprises a plurality of pogo pins for electrically connecting the interposer substrate to the DUT.
10. A test kit for testing a device under test (DUT), comprising:
a socket structure, for containing the DUT; and
a plunger assembly detachably coupled with the socket structure, wherein the plunger assembly comprises a multi-layered structure comprising a top socket, at least an interposer substrate mounted on the top socket, a nest, and a reflector disposed between the interposer substrate and the nest, wherein the socket structure comprises a bottom socket and an annular socket base secured to a top surface of the bottom socket, wherein the annular socket base surrounds perimeter of the interposer substrate and the top socket.
11. The test kit for testing a DUT according to claim 10 , wherein the interposer substrate comprises an antenna structure on its top side that directly faces the reflector.
12. The test kit for testing a DUT according to claim 11 , wherein the reflector is spaced a distance d apart from the interposer substrate.
13. The test kit for testing a DUT according to claim 11 , wherein a radio frequency (RF) signal can be transferred from one antenna to an adjacent antenna of the antenna structure via reflection of the reflector such that a non-conductive loopback test is implemented in the plunger assembly.
14. The test kit for testing a DUT according to claim 10 , wherein the reflector is composed of a conductive material.
15. The test kit for testing a DUT according to claim 10 , wherein the plunger assembly further comprises a pressing member coupled to an upper side of the nest.
16. The test kit for testing a DUT according to claim 15 , wherein the pressing member is made of metal.
17. The test kit for testing a DUT according to claim 10 , wherein the socket base comprises a central through hole that allows passage of the DUT and a lower portion of the plunger assembly that vacuum grips the DUT and places the DUT to test site on the socket structure.
18. The test kit for testing a DUT according to claim 17 , wherein the socket base comprises an inner portion around an upper surface of the bottom socket, and wherein a lower portion of the nest is engaged and in direct contact with the inner portion of the socket base.
19. The test kit for testing a DUT according to claim 10 , wherein the nest is made of an electrostatic-discharge (ESD) control material or a static-dissipative material.
20. The test kit for testing a DUT according to claim 10 further comprising:
at least one nozzle for vacuum gripping or holding the DUT, wherein the at least one nozzle penetrates through the nest, the reflector, the interposer substrate and the top socket.
21. The test kit for testing a DUT according to claim 10 , wherein the top socket comprises s a plurality of pogo pins for electrically connecting the interposer substrate to the DUT.