Resistive memory array with localized reference cells
A structure includes an array of nonvolatile memory cells, wordlines and bitlines connected to the nonvolatile memory cells, sense amplifiers connected to the nonvolatile memory cells, and reference cells connected to the sense amplifiers. Each of the reference cells has a transistor connected to a variable resistor, one of the wordlines, a reference bitline separate from the bitlines, and the sense amplifiers.
1. A structure comprising:
an array of nonvolatile memory cells;
wordlines and bitlines connected to the nonvolatile memory cells;
sense amplifiers connected to the nonvolatile memory cells;
reference cells connected to the sense amplifiers;
a reference bitline connected to the reference cells, wherein the reference bitline is separate from the bitlines; and
a variable resistor connected to the reference cells, wherein each of the reference cells comprises a transistor connected to the variable resistor, one of the wordlines, the reference bitline, and the sense amplifiers.
2. The structure according to claim 1 , wherein the transistor is directly connected by only wiring to the reference bitline without components being between the transistor and the reference bitline.
3. The structure according to claim 1 , wherein the reference cells are each connected to a plurality of the sense amplifiers.
4. The structure according to claim 1 , wherein the reference cells are each connected to a different one of the wordlines.
5. The structure according to claim 1 , wherein the transistor includes:
a drain connected to ground through the variable resistor, forming the reference bitline;
a gate connected to one of the wordlines; and
a source connected to the sense amplifiers and to a reference current source.
6. The structure according to claim 1 , wherein the nonvolatile memory cells comprise a resistive memory element, and wherein the reference cells are identical to the nonvolatile memory cells except the reference cells lacks the resistive memory element.
7. The structure according to claim 1 , wherein the reference cells are at a same location within the array as the nonvolatile memory cells with which the reference cells share one of the wordlines.
8. A structure comprising:
an array of magnetic random access memory (MRAM) cells;
wordlines and bitlines connected to the MRAM cells;
sense amplifiers connected to the MRAM cells;
reference cells connected to the sense amplifiers;
a reference bitline connected to the reference cells, wherein the reference bitline is separate from the bitlines; and
a variable resistor connected to the reference cells, wherein each of the reference cells comprises a transistor connected to the variable resistor, the wordlines, the reference bitline, and the sense amplifiers.
9. The structure according to claim 8 , wherein the transistor is directly connected by only wiring to the reference bitline without components being between the transistor and the reference bitline.
10. The structure according to claim 8 , wherein the reference cells are each connected to a plurality of the sense amplifiers.
11. The structure according to claim 8 , wherein the reference cells are each connected to a different one of the wordlines.
12. The structure according to claim 8 , wherein the transistor includes:
a drain connected to ground through the variable resistor, forming the reference bitline;
a gate connected to one of the wordlines; and
a source connected to the sense amplifiers and to a reference current source.
13. The structure according to claim 8 , wherein the MRAM cells comprise a resistive magnetic tunnel junction (MTJ) memory element, and wherein the reference cells are identical to the MRAM cells except the reference cells lacks the resistive MTJ memory element.
14. The structure according to claim 8 , wherein the reference cells are at a same location within the array as the MRAM cells with which the reference cells share one of the wordlines.
15. A structure comprising:
an array of magnetic random access memory (MRAM) cells;
wordlines and bitlines connected to the MRAM cells;
sense amplifiers connected to the MRAM cells;
reference cells connected to the sense amplifiers;
a reference bitline connected to the reference cells, wherein the reference bitline is separate from the bitlines; and
a variable resistor connected to the reference cells, wherein the variable resistor comprises switches connected to resistive polysilicon resistors, wherein each of the reference cells comprises a transistor connected to the variable resistor, the wordlines, the reference bitline, and the sense amplifiers.
16. The structure according to claim 15 , wherein the transistor is directly connected by only wiring to the reference bitline without components being between the transistor and the reference bitline.
17. The structure according to claim 15 , wherein the reference cells are each connected to a plurality of the sense amplifiers.
18. The structure according to claim 15 , wherein the reference cells are each connected to a different one of the wordlines.
19. The structure according to claim 15 , wherein the transistor includes:
a drain connected to ground through the variable resistor, forming the reference bitline;
a gate connected to one of the wordlines; and
a source connected to the sense amplifiers and to a reference current source.
20. The structure according to claim 15 , wherein the MRAM cells comprise a resistive magnetic tunnel junction (MTJ) memory element, and wherein the reference cells are identical to the MRAM cells except the reference cells lacks the resistive MTJ memory element.