Wafer level package
Provided are a wafer level package and a method of manufacturing the same, wherein an underfill sufficiently fills a space between a redistribution substrate and a semiconductor chip, thereby reducing warpage. The wafer level package includes a redistribution substrate including at least one redistribution layer (RDL), a semiconductor chip on the redistribution substrate, and an underfill filling a space between the redistribution substrate and the semiconductor chip. The underfill covers side surfaces of the semiconductor chip. The redistribution substrate includes a trench having a line shape and extending in a first direction along a first side surface of the semiconductor chip.
1. A package comprising:
a semiconductor chip on a package substrate, the package substrate including a trench having a line shape, the trench extending in a first direction along a first side surface of the semiconductor chip on the package substrate; and
an underfill filling a space between the package substrate and the semiconductor chip, the underfill filling the trench,
wherein the trench is disposed on a portion of the package substrate to overlap with at least a portion of the semiconductor chip in a second direction perpendicular to the first direction.
2. The package of claim 1 , wherein
the semiconductor chip is mounted on the package substrate in a flip-chip structure using bumps, and
the underfill fills in between the bumps.
3. The package of claim 2 , wherein
the first side surface of the semiconductor chip corresponds to a dispensing region of the package substrate to which the underfill is dispensed, and
the trench is formed only on the dispensing region.
4. The package of claim 1 , wherein
the underfill covers side surfaces of the semiconductor chip, and
the first side surface of the semiconductor chip is one of the side surfaces of the semiconductor chip.
5. The package of claim 1 , wherein
the trench is longer than the semiconductor chip in the first direction.
6. The package of claim 5 , wherein
the trench protrudes from both sides of the semiconductor chip in the first direction.
7. The package of claim 1 , wherein
a width of an upper portion of the trench is equal to a width of a lower portion of the trench, or
a width of the trench becomes narrower from the upper portion of the trench to the lower portion of the trench downwardly.
8. The package of claim 1 , wherein a cross-section of the trench in a direction perpendicular to the first direction is a triangle, a quadrangle, a trapezoid, or a semicircle.
9. The package of claim 1 , further comprising:
a sealant covering the semiconductor chip and the underfill; and
an external connection member disposed on a lower surface of the package substrate in a fan-out structure.
10. The package of claim 1 , wherein the package substrate includes a silicon wafer or a glass wafer.
11. A package comprising:
a semiconductor chip;
a substrate, the semiconductor chip being mounted on the substrate, the substrate including at least one trench each having a line shape, the trench extending in a first direction along a first side surface of the semiconductor chip;
an underfill filling a space between the substrate and the semiconductor chip and the at least one trench, the underfill covering side surfaces of the semiconductor chip; and
a sealant covering and sealing the semiconductor chip and the underfill,
wherein the at least one trench is disposed on a portion of the substrate to overlap with at least a portion of the semiconductor chip in a second direction perpendicular to the first direction.
12. The package of claim 11 , further comprising:
a plurality of external connection members disposed on a lower surface of the substrate, and
wherein the package has a fan-out structure in which some of the plurality of the external connection members are disposed outside of a chip area corresponding to the semiconductor chip.
13. The package of claim 11 , wherein
the at least one trench is longer than the semiconductor chip in the first direction.
14. The package of claim 13 , wherein
the at least one trench comprises two trenches spaced apart from each other in the first direction.
15. A package comprising:
a semiconductor chip;
a substrate, the substrate including a first trench having a line shape, the first trench extending in a first direction along a first side surface of the semiconductor chip, the semiconductor chip being on the substrate;
a chip stack structure on the substrate and having at least one memory chip, the semiconductor chip being spaced apart from the chip stack structure; and
an underfill filling a space between the substrate and the semiconductor chip and, the underfill filling the first trench,
wherein the first trench is disposed on a portion of the substrate to overlap with at least a portion of the semiconductor chip in a second direction perpendicular to the first direction.
16. The package of claim 15 , wherein
the underfill fills a space between the chip stack structure and the substrate, and
the substrate includes a second trench having a line shape, the second trench extending along any one side surface of the chip stack structure.
17. The package of claim 16 , further comprising:
the first side surface of the semiconductor chip corresponds to a first dispensing region of the substrate to which the underfill is dispensed,
the any one side surface of the chip stack structure corresponds to a second dispensing region of the substrate to which the underfill is dispensed,
the first trench is formed only in the first dispensing region, and
the second trench is formed only in the second dispensing region.
18. The package of claim 15 , wherein
the underfill covers side surfaces of the semiconductor chip and side surfaces of the chip stack structure,
the chip stack structure includes a plurality of memory chips, and
the semiconductor chip is a control chip.