IP Library Granted Patent US 11,916,065
Granted Patent B2
US 11,916,065 · App. 17/425,348 · Granted Feb 27, 2024

Semiconductor device and method for operating semiconductor device

Inventors: Kei Takahashi (Isehara, JP); Takeshi Aoki (Ebina, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/0629H01L29/7869H03F3/16H02J7/0029
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Quick Facts
Patent No.
US 11,916,065
App. No.
17/425,348
Granted
Feb 27, 2024
Kind
B2
Abstract

A novel comparison circuit, a novel amplifier circuit, a novel battery control circuit, a novel battery protection circuit, a power storage device, a semiconductor device, an electronic device, and the like are provided. The semiconductor device includes a capacitor, a first amplifier circuit including a first output terminal electrically connected to a first electrode of the capacitor, and a second amplifier circuit including an input terminal, a second output terminal, a first transistor, and a second transistor; a second electrode of the capacitor is electrically connected to the input terminal; the input terminal is electrically connected to a gate of the first transistor and one of a source and a drain of the second transistor; one of a source and a drain of the first transistor is electrically connected to the second output terminal; the second transistor has a function of supplying a potential to the input terminal and holding the potential; and a channel formation region of the second transistor includes a metal oxide containing at least one of indium and gallium.

Claims (33)

1. A semiconductor device comprising:

a first amplifier circuit comprising a first output, terminal;

a capacitor; and

a second amplifier circuit comprising an input terminal, a second output terminal, a first transistor, and a second transistor,

wherein the first output terminal is electrically connected to a first electrode of the capacitor,

wherein a second electrode of the capacitor is electrically connected to a gate of the first transistor and one of a source and a drain of the second transistor through the input terminal,

wherein one of a source and a drain of the first transistor is electrically connected to the second output terminal, and

wherein a channel formation region of the second transistor comprises a metal oxide containing at least one of indium and gallium.

2. A semiconductor device comprising:

a first amplifier circuit comprising a first output, terminal;

a capacitor; and

a second amplifier circuit comprising an input terminal, a second output terminal, a first transistor, a second transistor, and a circuit,

wherein the first output terminal is electrically connected to a first electrode of the capacitor,

wherein a second electrode of the capacitor is electrically connected to a gate of the first transistor and one of a source and a drain of the second transistor through the input terminal,

wherein one of a source and a drain of the first transistor is electrically connected to the second output terminal,

wherein a channel formation region of the second transistor comprises a metal oxide containing at least one of indium and gallium,

wherein the other of the source and the drain of the first transistor is electrically connected to a low potential wiring, and

wherein the circuit is electrically connected to the second output terminal and a high potential wiring.

3. The semiconductor device according to claim 2 ,

wherein the circuit comprises a third transistor,

wherein the second output terminal is electrically connected to one of a source and a drain of the third transistor, and

wherein the high potential wiring is electrically connected to the other of the source and the drain of the third transistor.

4. The semiconductor device according to claim 1 ,

wherein the other of the source and the drain of the first transistor is electrically connected to a low potential wiring.

5. The semiconductor device according to claim 1 ,

wherein the second amplifier circuit further comprises a resistor,

wherein one electrode of the resistor is electrically connected to the second output terminal, and

wherein the other electrode of the resistor is electrically connected to a high potential wiring.

6. The semiconductor device according to claim 2 ,

wherein the circuit comprises a third transistor and a fourth transistor,

wherein one of a source and a drain of the third transistor is electrically connected to the second output terminal,

wherein the other of the source and the drain of the third transistor is electrically connected to one of a source and a drain of the fourth transistor, and

wherein the other of the source and the drain of the fourth transistor is electrically connected to the high potential wiring.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2021
From: TAKAHASHI, KEI; AOKI, TAKESHI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 056972/0878 →
Priority Claims (2)
JP 2019-033161 · Feb 26, 2019 · national
JP 2019-123630 · Jul 2, 2019 · national
Continuity (1)
Related Publication 20220102340A1 · Mar 31, 2022