IP Library › Granted Patent US 11,923,312
Granted Patent B2
US 11,923,312 · App. 16/366,661 · Granted Mar 5, 2024

Patternable die attach materials and processes for patterning

Inventors: Bai Nie (Chandler, AZ); Gang Duan (Chandler, AZ); Srinivas Pietambaram (Chandler, AZ); Jesse Jones (Chandler, AZ); Yosuke Kanaoka (Chandler, AZ); Hongxia Feng (Chandler, AZ); Dingying Xu (Chandler, AZ); Rahul Manepalli (Chandler, AZ); Sameer Paital (Chandler, AZ); Kristof Darmawikarta (Chandler, AZ); Yonggang Li (Chandler, AZ); Meizi Jiao (Chandler, AZ); Chong Zhang (Chandler, AZ); Matthew Tingey (Hillsboro, OR); Jung Kyu Han (Chandler, AZ); Haobo Chen (Gilbert, AZ)
Assignee: Intel Corporation
H01L23/5389H01L21/4853H01L21/4857H01L21/565H01L21/78H01L23/3121H01L23/5381H01L23/5383H01L23/5386H01L23/562H01L24/19H01L24/20H01L2224/214H01L2924/3511H01L2924/381
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Quick Facts
Patent No.
US 11,923,312
App. No.
16/366,661
Granted
Mar 5, 2024
Kind
B2
Abstract

A die assembly is disclosed. The die assembly includes a die, one or more die pads on a first surface of the die and a die attach film on the die where the die attach film includes one or more openings that expose the one or more die pads and that extend to one or more edges of the die.

Claims (20)

1. A die assembly, comprising:

a die;

one or more die pads on a first surface of the die; and

a die attach film on the first surface of the die but not along sides of the die, wherein the die attach film includes one or more openings that expose the one or more die pads and that extend to one or more edges of the die, the one or more openings exposing sidewalls of the one or more die pads, and wherein the die attach film has an uppermost surface above an uppermost surface of the one or more die pads.

2. The die assembly of claim 1 , further comprising one or more die pads attached to a second surface of the die.

3. The die assembly of claim 1 , wherein the one or more openings include one or more channels that contain an underfill material.

4. The die assembly of claim 1 , wherein the one or more openings include one or more channels that contain an underfill material that is different from the die attach film material.

5. The die assembly of claim 1 , wherein the one or more die pads are through silicon via (TSV) backside die pads.

6. The die assembly of claim 1 , wherein the die assembly is surrounded by mold.

7. A system, comprising:

one or more storage components; and

one or more integrated circuit die including a die assembly that includes:

a die in a die mount space;

one or more die pads attached to a first surface of the die; and

a die attach film on the first surface of the die but not along sides of the die, wherein the die attach film includes one or more openings that expose the one or more die pads and that extend to one or more edges of the die, the one or more openings exposing sidewalls of the one or more die pads, and wherein the die attach film has an uppermost surface above an uppermost surface of the one or more die pads.

8. The system claim 7 , further comprising one or more die pads attached to a second surface of the die.

9. The system of claim 7 , wherein the one or more openings include one or more channels that contain an underfill material.

10. The system of claim 7 , wherein the one or more openings include one or more channels that contain an underfill material that is different from the die attach film material.

11. The system of claim 7 , wherein the one or more die pads are through silicon via (TSV) backside die pads.

12. The system of claim 7 , wherein the die assembly is surrounded by mold.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2020
From: NIE, BAI; DUAN, GANG; PIETAMBARAM, SRINIVAS; JONES, JESSE; KANAOKA, YOSUKE; FENG, HONGXIA; XU, DINGYING; MANEPALLI, RAHUL; PAITAL, SAMEER; DARMAWIKARTA, KRISTOF; LI, YONGGANG; JIAO, MEIZI; ZHANG, CHONG; TINGEY, MATTHEW; HAN, JUNG KYU; CHEN, HAOBO
To: INTEL CORPORATION
Reel/Frame 051491/0023 →
Continuity (1)
Related Publication 20200312771A1 · Oct 1, 2020