IP Library Granted Patent US 11,933,735
Granted Patent B2
US 11,933,735 · App. 17/440,896 · Granted Mar 19, 2024

Optical detection device, optical detection method, method for designing optical detection device, sample classification method, and defect detection method

Inventor: Tsuyoshi Konishi (Osaka, JP)
Assignee: OSAKA UNIVERSITY
G01N21/8806G01J3/18G01J3/42G01N21/31G01N2021/8845G01N2021/8854
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Quick Facts
Patent No.
US 11,933,735
App. No.
17/440,896
Granted
Mar 19, 2024
Kind
B2
Abstract

An optical detection device is an optical detection device that detects a desired wavelength component included in input light, and includes: a spectrometer including, for instance, a diffraction grating that receives the input light as an input and outputs an alignment of spectra each of which is a duplication of a spectrum of the input light; a second slit array including an array of three or more slits that pass light beams of wavelengths at three or more locations in the alignment of the spectra that are output from the spectrometer; and an imaging element composed of an array of pixels that receive the light beams, having passed through the second slit array, each of the light beams having three or more wavelength components. At least two pitches between slits are different in the array of the three or more slits included in the second slit array.

Claims (46)

1. An optical detection device that detects a desired wavelength component included in input light, the optical detection device comprising:

a spectrometer that receives the input light as an input and outputs, at a first pitch, an alignment of spectra each of which is a duplication of a spectrum of the input light;

a slit array including an array of three or more slits that pass light beams of wavelengths at three or more locations in the alignment of the spectra that are output from the spectrometer; and

an imaging element composed of an array of pixels that receive the light beams having passed through the slit array, each of the light beams having three or more wavelength components separated by a fixed wavelength range so that the three or more wavelength components are shifted from each other in a fixed wavelength cycle, wherein

at least two pitches between slits are different in the array of the three or more slits, and

a second pitch that is one of the at least two pitches is different from the first pitch.

2. The optical detection device according to claim 1 , wherein

in the alignment of the spectra, parts of adjacent spectra spatially overlap each other, and

at least one of the three or more slits passes a light beam having wavelength components corresponding to a same spatial location in spectra having parts spatially overlapping each other in the alignment of the spectra.

3. The optical detection device according to claim 1 , wherein

each of the spectra includes a first peak and a second peak, and

the three or more slits include a slit that passes a light beam of a wavelength corresponding to the first peak and a slit that passes a light beam of a wavelength corresponding to the second peak.

4. The optical detection device according to claim 3 , wherein

the array of pixels receives light in a desired wavelength range, and

the first peak and the second peak are separated by a wavelength range greater than a wavelength range equivalent to the first pitch.

5. A sample classification method for classifying a type of a sample, the sample classification method comprising:

obtaining a spectrum for each of samples and determining, through compressed sensing performed on spectra obtained, three or more measurement wavelengths to be used for reconstructing the spectrum, the spectrum being a transmission spectrum or an absorption spectrum;

(i) measuring, for each of samples whose types are known, wavelength components of the three or more measurement wavelengths, using the optical detection device according to claim 1 , and (ii) generating reference data in which a measurement result obtained by measuring the samples whose types are known is associated with a corresponding one of the types; and

(i) measuring, for a sample whose type is unknown, wavelength components of the three or more measurement wavelengths, using the optical detection device, and (ii) determining a type of the sample by performing matching between a measurement result obtained by measuring the sample whose type is unknown and the reference data.

6. A defect detection method for detecting a defective sample, the defect detection method comprising:

obtaining a spectrum for each of samples and determining, through compressed sensing performed on spectra obtained, three or more measurement wavelengths to be used for reconstructing the spectrum, the spectrum being a transmission spectrum or an absorption spectrum;

(i) measuring, for each of samples that are good products, wavelength components of the three or more measurement wavelengths, using the optical detection device according to claim 1 , and (ii) generating reference data indicating a measurement result obtained by measuring the samples that are good products; and

(i) measuring, for a sample that whether the sample is a good product or a defective product is unknown, wavelength components of the three or more measurement wavelengths, using the optical detection device, and (ii) determining whether the sample is a good product or a defective product by performing matching between a measurement result obtained by measuring the sample that whether the sample is a good product or a defective product is unknown and the reference data.

7. An optical detection method for detecting a desired wavelength component included in input light, the optical detection method comprising:

upon receiving the input light as an input, outputting, at a first pitch, an alignment of spectra, each of which is a duplication of a spectrum of the input light;

passing, by a slit array including an array of three or more slits, light beams of wavelengths at three or more locations in the alignment of the spectra that are output; and

detecting, by an imaging element composed of an array of pixels, the light beams that have passed through the slit array, each of the light beams having three or more wavelength components separated by a fixed wavelength range so that the three or more wavelength components are shifted from each other in a fixed wavelength cycle, wherein

at least two pitches between slits are different in the array of the three or more slits, and

a second pitch that is one of the at least two pitches is different from the first pitch.

8. A method for designing an optical detection device that detects a desired wavelength component included in input light, the optical detection device including:

a spectrometer that receives the input light as an input and outputs, at a first pitch, an alignment of spectra each of which is a duplication of a spectrum of the input light;

a slit array including an array of three or more slits that pass light beams of wavelengths at three or more locations in the alignment of the spectra that are output from the spectrometer; and

an imaging element composed of an array of pixels that receive the light beams having passed through the slit array, each of the light beams having three or more wavelength components separated by a fixed wavelength range so that the three or more wavelength components are shifted from each other in a fixed wavelength cycle, wherein

at least two pitches between slits are different in the array of the three or more slits, and

a second pitch that is one of the at least two pitches is different from the first pitch,

the method comprising:

determining positions of the three or more slits in the slit array so that the three or more slits include a slit that passes a light beam of a wavelength corresponding to a location that is characteristic to the spectrum of the input light; and

fabricating the optical detection device in accordance with a final design obtained by performing the method.

9. The method according to claim 8 , wherein

each of the spectra includes a first peak and a second peak, and

in the determining of the positions, the positions of the three or more slits in the slit array are determined so that the three or more slits include a slit that passes a light beam of a wavelength corresponding to the first peak and a slit that passes a light beam of a wavelength corresponding to the second peak.

10. The method according to claim 8 , further comprising:

prior to the determining of the positions, obtaining the spectra of the input light, and determining, through compressed sensing performed on the spectra obtained, three or more measurement wavelengths to be used for reconstructing each of the spectra, wherein

in the determining of the positions, the positions of the three or more slits in the slit array are determined so that the three or more slits include slits each of which passes a light beam of a different one of the three or more measurement wavelengths determined in the determining of the three or more measurement wavelengths.

11. The method according to claim 10 , wherein

in the determining of the three or more measurement wavelengths, the three or more measurement wavelengths in each of the spectra are determined by applying a sparse principal component analysis to the spectra obtained.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2021
From: KONISHI, TSUYOSHI
To: OSAKA UNIVERSITY
Reel/Frame 057531/0055 →
Priority Claims (1)
JP 2019-068251 · Mar 29, 2019 · national
Continuity (1)
Related Publication 20220155237A1 · May 19, 2022