IP Library › Granted Patent US 11,933,821
Granted Patent B2
US 11,933,821 · App. 17/476,054 · Granted Mar 19, 2024

Non-contact electrical parameter measurement device with radial dual mounted sensors

Inventors: Ronald Steuer (Hinterbruhl, AT); Christian K. Schmitzer (Brunn am Gebirge, AT)
Assignee: Fluke Corporation
G01R15/181G01R19/0092G01R33/09
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Quick Facts
Patent No.
US 11,933,821
App. No.
17/476,054
Granted
Mar 19, 2024
Kind
B2
Abstract

Systems and methods for operating and calibrating electrical parameter measurement devices are provided herein. The devices may include a current sensor that includes a plurality of magnetic field sensors positioned around a measurement area that receive a current carrying conductor under test. The sensor may include a plurality of concentric rings of magnetic field sensors that provide accurate measurements that ignore magnetic fields from conductors or other components outside of the measurement area. The sensors may be used to determine the position of a conductor under test, and such information may be used to produce accurate measurements by accounting for the conductor's position. A calibration system may also be provided that is operative to generate calibration data that is subsequently used to provide more accurate measurements. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, or other types of data.

Claims (43)

1. An electrical parameter measurement device, comprising:

a front end that includes an opening that is sized and dimensioned to receive a conductor under test;

a plurality of magnetic field sensors disposed around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and

control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to:

receive sensor signals from the plurality of magnetic field sensors;

determine a physical position of the conductor under test within the opening of the front end based at least in part on the sensor signals;

determine a position-dependent calibration factor based at least in part on the physical position of the conductor under test within the opening of the front end of the electrical parameter measurement device; and

apply the position-dependent calibration factor to determine a current parameter of the conductor based at least in part on the sensor signals and the physical position.

2. The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined by triangulation of at least three sensor signals received from at least three magnetic field sensors.

3. The electrical parameter measurement device of claim 1 , wherein the physical position of the conductor under test is determined at least in part by mechanical means.

4. The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine the physical position of the conductor under test using sensor signals from exactly three of the magnetic field sensors.

5. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors comprises a first sub-sensor and a second sub-sensor, the second sub-sensor being arranged at a 90 degree angle relative to the first sub-sensor.

6. The electrical parameter measurement device of claim 1 wherein each of the plurality of magnetic field sensors of the first set is formed in an integrated circuit that includes a respective one of the plurality of magnetic field sensors of the second set.

7. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors of the first set is mounted to a support with a corresponding, radially aligned magnetic field sensor of the second set.

8. The electrical parameter measurement device of claim 1 , wherein the magnetic field sensors of the first set of magnetic field sensors are coupled in a first series, and the magnetic field sensors of the second set of magnetic field sensors are coupled in a second series.

9. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is separately coupled to the control circuitry.

10. The electrical parameter measurement device of claim 1 , wherein the plurality of magnetic field sensors comprises a third set of magnetic field sensors positioned a third radial distance from the center of the opening that is greater than the second radial distance, and the control circuitry is operative to:

determine that at least one of the magnetic field sensors of the first set of magnetic field sensors is saturated due to an amount of current in the conductor under test; and

determine the current parameter of the conductor based at least in part on sensor signals from the second and third sets of the magnetic field sensors.

11. The electrical parameter measurement device of claim 1 , wherein determining a position-dependent calibration factor comprises utilizing a lookup table.

12. The electrical parameter measurement device of claim 1 , wherein the control circuitry is configured to determine that at least one of the plurality of magnetic field sensors is saturated, and to ignore the at least one of the plurality of magnetic field sensors in determining the current parameter of the conductor under test.

13. The electrical parameter measurement device of claim 1 , further comprising a plurality of non-contact voltage sensors operatively coupled to the control circuitry, wherein the control circuitry determines the physical position of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors.

14. The electrical parameter measurement device of claim 13 , wherein the control circuitry is configured to determine a voltage parameter of the conductor under test based at least in part on sensor signals received from the plurality of non-contact voltage sensors.

15. The electrical parameter measurement device of claim 1 , wherein each of the plurality of magnetic field sensors is operative to determine a direction of a magnetic field generated by the conductor under test.

16. The electrical parameter measurement device of claim 1 , wherein the control circuitry applies a unique calibration factor for each of the plurality of magnetic field sensors.

17. An electrical parameter measurement device, comprising:

a front end that includes an opening that is sized and dimensioned to receive a conductor under test;

a plurality of magnetic field sensors disposed around the opening, the plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set; and

control circuitry operatively coupled to the plurality of magnetic field sensors, the control circuitry being configured to:

receive sensor signals from the plurality of magnetic field sensors;

determine a physical position of the conductor under test within the opening of the front end based at least in part on the sensor signals or using mechanical means; and

determine a current parameter of the conductor based at least in part on the sensor signals and the physical position,

wherein the control circuitry is configured to identify a saturated magnetic field sensor from the plurality of magnetic field sensors, and to replace a sensor signal of the saturated magnetic field sensor with an interpolated sensor signal obtained using sensor signals from magnetic field sensors positioned adjacent to the saturated magnetic field sensor.

18. A method of operating an electrical parameter measurement device, the method comprising:

placing a conductor under test in an opening of a support member of the electrical parameter measurement device;

sensing one or more electrical parameters of the conductor under test, wherein the sensing comprises using a plurality of magnetic field sensors comprising a first set of magnetic field sensors positioned at a first radial distance from a center of the opening, and a second set of magnetic field sensors positioned at a second radial distance from the center of the opening, the second radial distance being greater than the first radial distance, and each magnetic field sensor in the first set is radially aligned with a corresponding magnetic field sensor in the second set;

receiving sensor signals from the plurality of magnetic field sensors;

determining a physical position of the conductor under test within the opening of the support member, wherein the determining is performed based at least in part on the sensor signals;

determining a position-dependent calibration factor based at least in part on the physical position of the conductor under test within the opening of the front end of the electrical parameter measurement device; and

applying the position-dependent calibration factor to determine a current parameter of the conductor based at least in part on the one or more electrical parameters sensed and the physical position.

19. The method of claim 18 , wherein determining the physical position of the conductor under test comprises using sensor signals from exactly three of the magnetic field sensors.

20. The method of claim 18 , wherein determining the physical position of the conductor under test comprises determining a direction of a magnetic field generated by the conductor under test by at least three of the plurality of magnetic field sensors.

21. The method of claim 18 wherein the first set of magnetic field sensors are equally spaced apart from each other, and the second set of magnetic field sensors are equally spaced apart from each other.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 15, 2021
From: STEUER, RONALD; SCHMITZER, CHRISTIAN KARL
To: FLUKE CORPORATION
Reel/Frame 057494/0360 →
Continuity (2)
Provisional Application 63078727 · Sep 15, 2020
Related Publication 20220082590A1 · Mar 17, 2022