Resistive memory device for writing data and operating method thereof

1. A resistive memory device comprising:

a resistive memory cell connected between a first bit line and a first source line;

a reference cell including a reference resistor and connected between a second bit line and a second source line;

a write driver connected to the first bit line or the first source line, connected to the second bit line or the second source line, and configured to generate a write current for writing target data in the resistive memory cell;

a level shifter connected to a word line of the resistive memory cell and configured to receive a word line selection voltage and output a first voltage higher than a power supply voltage of the resistive memory device,

a word line driver including a first word line driver module connected to the first source line and a second word line driver module connected to the first bit line and configured to provide a second voltage higher than the first voltage to the word line of the resistive memory cell; and

a boosted capacitor having one end connected to the level shifter and the first word line driver module and another end connected to the second word line driver module,

wherein the write driver comprises a comparator configured to receive the write current, compare previous data written in the resistive memory cell with the target data by comparing a voltage of the first source line with a voltage of the second source line or compare a voltage of the first bit line with a voltage of the second bit line, and determine whether the target data is written in the resistive memory cell in accordance with a result of comparing the previous data with the target data.

2. The resistive memory device of claim 1 , wherein the write driver is further configured not to write the target data in the resistive memory cell when the previous data is the same as the target data and write the target data in the resistive memory cell when the previous data is different from the target data.

3. The resistive memory device of claim 2 , wherein the comparator is further configured to control an output of the write current in accordance with whether the previous data is the same as the target data.

4. The resistive memory device of claim 3 , wherein the comparator is further configured to block the write current flowing through the resistive memory cell when the previous data is the same as the target data and apply the write current to the resistive memory cell when the previous data is different from the target data.

5. The resistive memory device of claim 1 , wherein the comparator comprises:

an amplifier configured to receive the first source line voltage and the second source line voltage or the first bit line voltage and the second bit line voltage;

a latch circuit configured to receive output values of the amplifier; and

a logic gate configured to receive an output value of the latch circuit and the target data.

6. The resistive memory device of claim 1 , wherein the write driver comprises a first write driver module and a second write driver module, and

wherein the first write driver module and the second write driver module are each configured to selectively operate in accordance with the target data.

7. The resistive memory device of claim 6 , wherein the first write driver module is further configured to supply the write current to the resistive memory cell, and

wherein the second write driver module is further configured to supply a current to the reference cell.

8. The resistive memory device of claim 6 , wherein each of the first and second write driver modules comprises a PMOS transistor and an amplifier connected to each other via a feedback structure.

9. The resistive memory device of claim 1 , wherein the reference cell further comprises a selection transistor, and

wherein a reference resistance value is an interval value between a resistance value in a state in which data of the resistive memory cell is 1 and a resistance value in a state in which data of the resistive memory cell is 0.

10. The resistive memory device of claim 1 , wherein a driving feature of the resistive memory cell varies in accordance with a temperature, and

wherein a capacitance value of the boosted capacitor varies in order to compensate for the driving feature of the resistive memory cell in accordance with the temperature.

11. The resistive memory device of claim 10 , wherein the boosted capacitor comprises a plurality of capacitor modules connected to one another in accordance with binarized temperature information.

12. The resistive memory device of claim 1 , wherein the resistive memory device is magnetic random access memory (MRAM).

13. An operating method of a resistive memory device, the operating method comprising:

receiving a write command for writing target data in a resistive memory cell connected between a first bit line and a first source line from a memory controller;

generating a write current in accordance with the write command;

activating a word line in the resistive memory cell by outputting a word line driving voltage from a level shifter connected to the word line, the word line driving voltage being higher than a power supply voltage of the resistive memory device;

receiving the write current and comparing previous data written in the resistive memory cell with the target data by comparing a voltage of the first source line with a voltage of a second source line or comparing a voltage of the first bit line with a voltage of a second bit line;

determining whether the target data is written in the resistive memory cell in accordance with a result of comparing the previous data with the target data;

outputting control signals to a pair of word line drivers connected to the memory cell; and

controlling at least one control signal of the control signals, the at least one control signal being output to a word line driver of the pair of word line drivers, the at least one control signal being controlled by a boosted capacitor configured to compensate for a variable resistance in the resistive memory cell,

wherein the second source line is a source line of a reference cell including a reference resistor and the second bit line is a bit line of the reference cell.

14. The operating method of claim 13 , wherein a reference resistance value is an interval value between a resistance value in a state in which data of the resistive memory cell is 1 and a resistance value in a state in which data of the resistive memory cell is 0.

15. The operating method of claim 13 , wherein, in the determining whether the target data is written in the resistive memory cell in accordance with the result of comparing the previous data with the target data,

the target data is not written in the resistive memory cell when the previous data is the same as the target data and is written in the resistive memory cell when the previous data is different from the target data.

16. A resistive memory device comprising:

a level shifter connected to a word line of a resistive memory cell connected between a first bit line and a first source line, and configured to receive a word line selection voltage, and output a first voltage higher than a power supply voltage of the resistive memory device;

a word line driver including a first word line driver module connected to the first source line and a second word line driver module connected to the first bit line and configured to provide a second voltage higher than the first voltage to a word line of the resistive memory cell; and

a boosted capacitor having one end connected to the level shifter and the first word line driver module and another end connected to the second word line driver module.

17. The resistive memory device of claim 16 , wherein a driving feature of the resistive memory cell varies in accordance with a temperature, and

wherein a capacitance value of the boosted capacitor varies in order to compensate for the driving feature of the resistive memory cell in accordance with the temperature.

18. The resistive memory device of claim 17 , wherein the boosted capacitor comprises a plurality of capacitor modules connected to one another in accordance with binarized temperature information.

19. The resistive memory device of claim 16 , further comprising:

a reference cell including a reference resistor and connected between a second bit line and a second source line; and

a write driver connected to the first bit line or the first source line, connected to the second bit line or the second source line, and configured to generate a write current for writing target data in the resistive memory cell,

wherein the write driver comprises a comparator configured to receive the write current, compare previous data written in the resistive memory cell with the target data by comparing a voltage of the first source line with a voltage of the second source line or by comparing a voltage of the first bit line with a voltage of the second bit line, and determine whether the target data is written in the resistive memory cell in accordance with a result of comparing the previous data with the target data, and

wherein the target data is not written in the resistive memory cell when the previous data is the same as the target data and is written in the resistive memory cell when the previous data is different from the target data.