Semiconductor device

1. A semiconductor device comprising:

an insulating circuit substrate;

a semiconductor element including a first main electrode bonded to a top surface of a first conductor layer of the insulating circuit substrate via a first bonding material, a semiconductor substrate deposited on a top surface of the first main electrode, and a second main electrode deposited on a top surface of the semiconductor substrate; and

a resistive element including a bottom surface electrode bonded to a top surface of a second conductor layer of the insulating circuit substrate via a second bonding material, a resistive layer with one end electrically connected to the bottom surface electrode, and a first top surface electrode electrically connected to another end of the resistive layer,

wherein the first main electrode includes a first bonded layer bonded to the first bonding material,

the bottom surface electrode includes a second bonded layer bonded to the second bonding material, and

the first bonded layer and the second bonded layer have a common structure.

2. The semiconductor device of claim 1 , wherein the semiconductor substrate is made of silicon carbide or silicon.

3. The semiconductor device of claim 1 , wherein the resistive element includes a semiconductor substrate made of silicon or silicon carbide.

4. The semiconductor device of claim 1 , wherein the first bonded layer and the second bonded layer each include:

a first electrode layer made of gold; and

a second electrode layer deposited on a top surface of the first electrode layer and made of nickel or an alloy mainly including nickel.

5. The semiconductor device of claim 1 , wherein the first bonding material and the second bonding material are each solder.

6. The semiconductor device of claim 1 , wherein the resistive element is used as a temperature sensor.

7. The semiconductor device of claim 6 , wherein:

the first top surface electrode is electrically connected to a first temperature detection terminal; and

the bottom surface electrode is electrically connected to as a second temperature detection terminal.

8. The semiconductor device of claim 6 , wherein:

the second main electrode is electrically connected to an auxiliary source terminal;

the first top surface electrode is electrically connected to a temperature detection terminal; and

the bottom surface electrode is electrically connected to the auxiliary source terminal.

9. The semiconductor device of claim 1 , wherein the resistive element is used as a source resistor of the semiconductor element.

10. The semiconductor device of claim 9 , wherein:

the second main electrode is electrically connected to the first top surface electrode; and

the bottom surface electrode is electrically connected to an auxiliary source terminal.

11. The semiconductor device of claim 1 , wherein the resistive element is used as a temperature sensor and is used as a source resistor of the semiconductor element.

12. The semiconductor device of claim 11 , wherein the resistive element further includes:

a diode with a cathode electrically connected to the bottom surface electrode; and

a second top surface electrode electrically connected to an anode of the diode.

13. A semiconductor device comprising:

an insulating circuit substrate;

a semiconductor element including a first main electrode bonded to a top surface of a first conductor layer of the insulating circuit substrate via a first bonding material, a semiconductor substrate deposited on a top surface of the first main electrode, and a second main electrode deposited on a top surface of the semiconductor substrate; and

a resistive element including a bottom surface electrode bonded to a top surface of a second conductor layer of the insulating circuit substrate via a second bonding material, a resistive layer with one end electrically connected to the bottom surface electrode, and a first top surface electrode electrically connected to another end of the resistive layer,

wherein the second main electrode is electrically connected to an auxiliary source terminal,

the first top surface electrode is electrically connected to a temperature detection terminal, and

the bottom surface electrode is electrically connected to the auxiliary source terminal.

14. A semiconductor device comprising:

an insulating circuit substrate;

a semiconductor element including a first main electrode bonded to a top surface of a first conductor layer of the insulating circuit substrate via a first bonding material, a semiconductor substrate deposited on a top surface of the first main electrode, and a second main electrode deposited on a top surface of the semiconductor substrate; and

a resistive element including a bottom surface electrode bonded to a top surface of a second conductor layer of the insulating circuit substrate via a second bonding material, a resistive layer with one end electrically connected to the bottom surface electrode, and a first top surface electrode electrically connected to another end of the resistive layer,

wherein the resistive element includes, in one chip, a diode with a cathode or an anode electrically connected to the bottom surface electrode, and a second top surface electrode electrically connected to the anode or the cathode of the diode.