IP Library › Granted Patent US 11,960,435
Granted Patent B2
US 11,960,435 · App. 17/692,147 · Granted Apr 16, 2024

Skew matching in a die-to-die interface

Inventors: Pradeep Jayaraman (Santa Clara, CA); Dean Gonzales (Fort Collins, CO); Gerald R. Talbot (Boxborough, MA); Ramon A. Mangaser (Boxborough, MA); Michael J. Tresidder (Austin, TX); Prasant Kumar Vallur (Bangalore, IN); Srikanth Reddy Gruddanti (Bangalore, IN); Krishna Reddy Mudimela Venkata (Bangalore, IN); David H. McIntyre (Santa Clara, CA)
Assignee: ADVANCED MICRO DEVICES, INC.
G06F13/4291G06F13/4286H01L25/0652
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Quick Facts
Patent No.
US 11,960,435
App. No.
17/692,147
Granted
Apr 16, 2024
Kind
B2
Abstract

A semiconductor package for skew matching in a die-to-die interface, including: a first die; a second die aligned with the first die such that each connection point of a first plurality of connection points of the first die is substantially equidistant to a corresponding connection point of a second plurality of connection points of the second die; and a plurality of connection paths of a substantially same length, wherein each connection path of the plurality of connection paths couples a respective connection point of the first plurality of connection points to the corresponding connection point of the second plurality of connection points.

Claims (30)

1. A semiconductor package for skew matching in a die-to-die interface, comprising:

a first die;

a second die aligned with the first die such that each connection point of a first plurality of connection points of the first die is equidistant to a corresponding connection point of a second plurality of connection points of the second die, wherein a transmit block of the first die is linearly aligned with a receive block of the second die and a transmit block of the second die is linearly aligned with a receive block of the first die; and

a plurality of connection paths of a same length, wherein each connection path of the plurality of connection paths couples a respective connection point of the first plurality of connection points to the corresponding connection point of the second plurality of connection points.

2. The semiconductor package of claim 1 , wherein a layout of the first plurality of connection points is different from a layout of the second plurality of connection points.

3. The semiconductor package of claim 1 , wherein an interface between the first die and the second die includes a bridge die.

4. The semiconductor package of claim 1 , further comprising a clock coupled to the first die and the second die.

5. The semiconductor package of claim 4 , wherein the first plurality of connection points and the second plurality of connection points each comprise a first subset of connection points for data transfer and a second subset of connection points for clocking.

6. The semiconductor package of claim 5 , wherein the first die and the second die each provide a respective source-synchronous clocking signal with a respective data signal.

7. The semiconductor package of claim 6 , wherein the respective source-synchronous clocking signal is in quadrature with the respective data signal.

8. A method of skew matching in a die-to-die interface, the method comprising:

aligning a first die with a second die such that each connection point of a first plurality of connection points of the first die is equidistant to a corresponding connection point of a second plurality of connection points of the second die, wherein, after aligning the first die with the second die, a transmit block of the first die is linearly aligned with a receive block of the second die and a transmit block of the second die is linearly aligned with a receive block of the first die; and

coupling each connection point of the first plurality of connection points to the corresponding connection point of the second plurality of connection points using a connection path, wherein each of the connection paths comprises a same length.

9. The method of claim 8 , wherein a layout of the first plurality of connection points is different from a layout of the second plurality of connection points.

10. The method of claim 8 , wherein an interface between the first die and the second die includes a bridge die.

11. The method of claim 9 , further comprising coupling a clock to the first die and the second die.

12. The method of claim 11 , wherein the first plurality of connection points and the second plurality of connection points each comprise a first subset of connection points for data transfer and a second subset of connection points for clocking.

13. The method of claim 12 , wherein coupling the clock the first die and the second die comprises configuring the first die and the second die to each provide a respective source-synchronous clocking signal with a respective data signal.

14. The method of claim 13 , wherein the respective source-synchronous clocking signal is in quadrature with the respective data signal.

15. An apparatus for skew matching in a die-to-die interface, comprising:

computer memory;

a semiconductor package operatively coupled to the computer memory, comprising:

a first die;

a second die aligned with the first die such that each connection point of a first plurality of connection points of the first die is equidistant to a corresponding connection point of a second plurality of connection points of the second die, wherein a transmit block of the first die is linearly aligned with a receive block of the second die and a transmit block of the second die is linearly aligned with a receive block of the first die; and

a plurality of connection paths of a same length, wherein each connection path of the plurality of connection paths couples a respective connection point of the first plurality of connection points to the corresponding connection point of the second plurality of connection points.

16. The apparatus of claim 15 , wherein a layout of the first plurality of connection points is different from a layout of the second plurality of connection points.

17. The apparatus of claim 15 , wherein an interface between the first die and the second die includes a bridge die.

18. The apparatus of claim 15 , wherein the semiconductor package further comprises a clock coupled to the first die and the second die.

19. The apparatus of claim 18 , wherein the first plurality of connection points and the second plurality of connection points each comprise a first subset of connection points for data transfer and a second subset of connection points for clocking.

20. The apparatus of claim 19 , wherein the first die and the second die each provide a respective source-synchronous clocking signal with a respective data signal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2022
From: JAYARAMAN, PRADEEP; GONZALES, DEAN; TALBOT, GERALD R.; MANGASER, RAMON A.; TRESIDDER, MICHAEL J.; VALLUR, PRASANT KUMAR; GRUDDANTI, SRIKANTH REDDY; MUDIMELA VENKATA, KRISHNA REDDY; MCINTYRE, DAVID H.
To: ADVANCED MICRO DEVICES, INC.
Reel/Frame 060205/0229 →
Priority Claims (1)
IN 202111059016 · Dec 17, 2021 · national
Continuity (1)
Related Publication 20230195678A1 · Jun 22, 2023