IP Library › Granted Patent US 11,961,570
Granted Patent B2
US 11,961,570 · App. 16/912,694 · Granted Apr 16, 2024

Methods and systems of cell-array programming for neural compute using flash arrays

Inventors: Vishal Sarin (Saratoga, CA); Vikram Kowshik (Cupertino, CA); Purval Sule (Santa Clara, CA); Siraj Fulum Mossa (Milipitas, CA)
G11C16/3459G06N3/063G11C11/54G11C16/08G11C16/10G11C16/16G11C16/24G11C16/0466
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Quick Facts
Patent No.
US 11,961,570
App. No.
16/912,694
Granted
Apr 16, 2024
Kind
B2
Abstract

In one aspect, a method for NOR flash cell-array programming in a neural circuit includes the step of erasing a cell array. The method includes the step of programming a set of reference cells of a reference cell array to a target reference threshold voltage (V t_ref ). The method includes the step of generating, with the reference cells, a current or voltage, reference signal. The method includes the step of using the reference signal to bias the neural cells during verification of program state of the neural cells to achieve their respective target threshold voltages (V t_cell ). The method includes the step of programming a set of neural cells of a neural cell array to their respective target threshold voltages.

Claims (11)

1. A method for NOR flash cell-array programming in a neural circuit comprising:

erasing a cell array;

programming a set of reference cells of a reference cell array to a target reference threshold voltage (Vt_ref);

generating, with the reference cells, a current or voltage, reference signal;

using the reference signal to bias a neural cells during verification of program state of the neural cells to achieve their respective target threshold voltages (Vt_cell); and

programming a set of neural cells of a neural cell array to their respective target threshold voltages, wherein a neural cell comprises a flash-cell system, wherein an equation for a neural cell comprises Eq neuron ≡Σ(x i *y i )+b, where, x i is the set of input vectors, y i is parameter which is related to a threshold voltage of individual flash cells, and b is a bias variable,

wherein the cells are first programmed to a pre-final threshold values (Vt_initial_1) as defined in y i in a first sequence on program and program verify pulses as defined in x i ,

wherein the cells are then programmed to a second pre-final threshold values (Vt_initial_2) as defined in y i in a second subsequent sequence of program and program verify pulses as defined in x i , and where the second pre-final threshold values are larger than the final target threshold values, and

wherein the cells are then weak erased to the final target threshold values as defined in y i with a sequence of erase pulses and erase verify pulses,

wherein the final threshold value is considered reached if the threshold value is close to (less than or equal to) the final target threshold value,

wherein the weak erase comprises an erase voltage level only detraps a plurality of shallow traps in an oxide layer or a nitride layer of the flash cell without effectively changing the threshold voltage.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2026
From: ANALOG INFERENCE INC.
To: SAGENCE AI CORPORATION
Reel/Frame 073397/0464 →
SECURITY INTEREST Recorded Dec 8, 2025
From: SAGENCE AI CORPORATION
To: CUSTOMERS BANK
Reel/Frame 073136/0296 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2023
From: SARIN, VISHAL; KOWSHIK, VIKRAM; SULE, PURVAL; MOSSA, SIRAJ
To: ANALOG INFERENCE INC.
Reel/Frame 063478/0569 →
Continuity (8)
Continuation In Part 16452217 · Jun 25, 2019
Provisional Application 63033842 · Jun 3, 2020
Provisional Application 62872864 · Jul 11, 2019
Provisional Application 62803562 · Feb 10, 2019
Provisional Application 62773773 · Nov 30, 2018
Provisional Application 62721116 · Aug 22, 2018
Provisional Application 62689839 · Jun 26, 2018
Related Publication 20210043264A1 · Feb 11, 2021
Cited By (1)
US 12,374,410