Automated test plan validation for object measurement by a coordinate measuring machine

1. A computer-implemented method comprising:

obtaining a test plan for measurement of an object with a coordinate measuring machine that includes a measurement sensor, wherein:

the test plan includes a test feature to be quantified within a scope of the measurement, and

a quantification of the test feature is implemented based on a set of measurement results of a set of reference elements of the object by the coordinate measuring machine;

for each reference element of the set of reference elements, obtaining an accuracy variable that specifies an accuracy of the measurement result of the reference element;

ascertaining an error effect of each reference element of the set of reference elements on the quantification of the test feature based on the respective accuracy variable;

ascertaining whether each of the error effects meets an error criterion;

in response to one of the error effects meeting the error criterion:

classifying the reference element assigned to this error effect as a critical reference element; and

automatically adapting the test plan to measure the critical reference element by at least one of:

adjusting a set of parameters that govern the measurement of the object by the coordinate measuring machine during execution of the test plan to obtain an improved measurement accuracy; and

replacing the critical reference element with a set of other reference elements to be measured by the coordinate measuring machine, wherein the set of other reference elements includes at least one other reference element; and

controlling the coordinate measuring machine to measure the object according to the adapted test plan by moving at least one of the measurement sensor and the object to measure at least one of the critical reference element and the set of other reference elements.

2. The method of claim 1 , wherein:

the measurement result of the reference element is ascertained based on a measurement result of a further reference element; and

an error effect on an achievable accuracy of the quantification is also ascertained for the further reference element.

3. The method of claim 1 , wherein each reference element is a geometric element of the object.

4. The method of claim 1 , wherein the measurement result of a reference element is ascertained in each case based on at least one coordinate value of the reference element.

5. The method of claim 4 , wherein the coordinate value is ascertained based on at least one of a real object measurement and a simulated object measurement.

6. The method of claim 1 , wherein the measurement result of a reference element in each case specifies at least one of a spatial degree of freedom and a dimension of the reference element.

7. The method of claim 1 , wherein the accuracy variable is ascertained based on a statistical characteristic of a distribution of coordinate values that were determined to ascertain the measurement result of a respective reference element.

8. The method of claim 1 , wherein the accuracy variable is ascertained based on a deviation of at least one coordinate value from a measurement result that was calculated from a plurality of coordinate values for a respective reference element.

9. The method of claim 1 , wherein the accuracy variable is ascertained based on an adjustment method that is carried out to calculate the measurement result from a multiplicity of coordinate values.

10. The method of claim 1 , wherein the accuracy variable is ascertained based on a form deviation of a respective reference element.

11. The method of claim 1 , wherein the accuracy variable is ascertained based on an inherent measurement uncertainty of the coordinate measuring machine.

12. The method of claim 1 , wherein:

the error effect of a respective reference element is determined based on a possible value spectrum of the measurement result of a respective reference element; and

the value spectrum is determined based on the accuracy variable.

13. The method of claim 12 , further comprising, based on the value spectrum of a respective reference element, ascertaining a possible quantification value spectrum of the test feature and comparing to an admissible tolerance range of a respective test feature.

14. The method of claim 13 , wherein the error criterion is satisfied when the quantification value spectrum exceeds an admissible portion of the tolerance range of a respective test feature.

15. The method of claim 1 , further comprising:

ascertaining whether the error effect of a respective reference element satisfies an error-free criterion; and

in response to the error effect satisfying the error-free criterion, classifying the corresponding reference element as a noncritical reference element.

16. The method of claim 15 , further comprising, in response to the error-free criterion being satisfied, altering at least one measurement parameter, based on which a measurement result of a reference element assessed as noncritical is ascertainable, to obtain a faster measurement speed.

17. The method of claim 1 , further comprising, in response to the error criterion being satisfied, altering at least one measurement parameter, based on which a measurement result of a reference element assessed as critical is ascertainable, to obtain a higher measurement accuracy.

18. The method of claim 1 , further comprising:

altering at least one measurement parameter to obtain a higher measurement accuracy,

wherein ascertaining a measurement result of the at least one reference element as critical is based on the at least one measurement parameter.

19. The method of claim 1 , further comprising:

at least one of ascertaining, proposing, and implementing countermeasures,

wherein the countermeasures include at least one of (i) an adaptation of the measurement of the reference element, (ii) a redefinition of the test feature, and (iii) a new selection of the reference element.

20. The method of claim 1 , further comprising:

altering at least one measurement parameter to obtain a higher measurement speed,

wherein ascertaining a measurement result of the reference element as non-critical is based on the at least one measurement parameter.

21. The method of claim 1 , wherein the set of reference elements includes a plurality of reference elements.

22. The method of claim 1 , wherein the set of parameters includes at least one of a measurement speed and a number of probed points.

23. A machine comprising:

memory storing a test plan for a coordinate measuring machine to perform an object measurement, wherein:

the coordinate measuring machine includes a measurement sensor,

the test plan includes a test feature to be quantified within a scope of the object measurement, and

a quantification of the test feature is implemented based on a set of measurement results of a set of reference elements of the object; and

at least one processor configured to execute instructions stored in the memory, wherein the instructions include:

for each reference element of the set of reference elements, obtaining an accuracy variable that specifies an accuracy of the measurement result of the reference element;

ascertaining an error effect of each reference element of the set of reference elements on the quantification of the test feature based on the respective accuracy variable;

ascertaining whether each of the error effects meets an error criterion;

in response to one of the error effects meeting the error criterion:

classifying the reference element assigned to this error effect as a critical reference element; and

automatically adapting the test plan to measure the critical reference element by at least one of:

adjusting a set of parameters that govern the measurement of the object by the coordinate measuring machine during execution of the test plan to obtain an improved measurement accuracy; and

replacing the critical reference element with a set of other reference elements to be measured by the coordinate measuring machine, wherein the set of other reference elements includes at least one other reference element; and

controlling the coordinate measuring machine to measure the object according to the adapted test plan by moving at least one of the measurement sensor and the object to measure at least one of the critical reference element and the set of other reference elements.

24. A non-transitory computer-readable medium comprising processor-executable instructions that include:

obtaining a test plan for measurement of an object with a coordinate measuring machine, wherein:

the coordinate measuring machine includes a measurement sensor,

the test plan includes a test feature to be quantified within a scope of the measurement, and

a quantification of the test feature is implemented based on a set of measurement results of a set of reference elements of the object by the coordinate measuring machine;

for each reference element of the set of reference elements, obtaining an accuracy variable that specifies an accuracy of the measurement result of the reference element;

ascertaining an error effect of each reference element of the set of reference elements on the quantification of the test feature based on the respective accuracy variable;

ascertaining whether each of the error effects meets an error criterion;

in response to one of the error effects meeting the error criterion:

classifying the reference element assigned to this error effect as a critical reference element; and

automatically adapting the test plan to measure the critical reference element by at least one of:

adjusting a set of parameters that govern the measurement of the object by the coordinate measuring machine during execution of the test plan to obtain an improved measurement accuracy; and

replacing the critical reference element with a set of other reference elements to be measured by the coordinate measuring machine, wherein the set of other reference elements includes at least one other reference element; and

controlling the coordinate measuring machine to measure the object according to the adapted test plan by moving at least one of the measurement sensor and the object to measure at least one of the critical reference element and the set of other reference elements.