Semiconductor radiation detector
View Patent ↗Disclosed herein is a radiation detector comprising: an electronics layer comprising a first set of electric contacts and a second set of electric contacts; a radiation absorption layer configured to absorb radiation; a first set of electrodes and a second set of electrodes, wherein the first set of electrodes and the second set of electrodes are interdigitated and extend into the radiation absorption layer in a direction of thickness thereof; wherein the electronics layer and the radiation absorption layer are bonded such that the first set of electrodes are electrically connected to the first set of electric contacts and the second set of electrodes are electrically connected to the second set of electric contacts.
1. A radiation detector, comprising:
an electronics layer comprising a first set of electric contacts and a second set of electric contacts;
a radiation absorption layer configured to absorb radiation;
a first set of electrodes and a second set of electrodes, wherein the first set of electrodes and the second set of electrodes are interdigitated and extend into the radiation absorption layer in a direction of thickness thereof;
wherein the electronics layer and the radiation absorption layer are bonded such that the first set of electrodes are electrically connected to the first set of electric contacts and the second set of electrodes are electrically connected to the second set of electric contacts;
wherein the second set of electrodes are discrete;
wherein the electronics layer comprises:
a first voltage comparator configured to compare a voltage of an electric contact of the second set of electric contacts to a first threshold;
a second voltage comparator configured to compare the voltage to a second threshold;
a counter configured to register a number of particles of radiation received by the radiation absorption layer;
a controller, wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
wherein the controller is configured to activate the second voltage comparator during the time delay;
wherein the controller is configured to cause the number registered by the counter to increase by one, upon determination by the second voltage comparator that an absolute value of the voltage equals or exceeds an absolute value of the second threshold.
2. The radiation detector of claim 1 , wherein the radiation absorption layer comprises GaAs, CdTe, CZT, or a combination thereof.
3. The radiation detector of claim 1 , wherein the first set of electrodes and the second set of electrodes comprise a metal or a semiconductor.
4. The radiation detector of claim 1 , wherein the first set of electrodes and the second set of electrodes are configured to be differentially biased.
5. The radiation detector of claim 1 , wherein a distance between one of the first set of electrodes to its nearest neighbor of the second set of electrodes does not exceed 2λ, wherein λ is the mean free path of charge carriers in the radiation absorption layer.
6. The radiation detector of claim 1 , wherein the second set of electrodes are cylindrical in shape.
7. The radiation detector of claim 1 , wherein the second set of electrodes are prismatic in shape.
8. The radiation detector of claim 1 , wherein the first set of electrodes comprises a grid.
9. The radiation detector of claim 1 , wherein the first set of electrodes and the second set of electrodes are coextensive in the direction of thickness.
10. The radiation detector of claim 1 , further comprising an insulating layer at a surface of the radiation absorption layer distal from the electronics layer; wherein the first set of electrodes and the second set of electrodes are attached to the insulating layer.
11. The radiation detector of claim 1 , wherein the radiation absorption layer comprises a polycrystalline semiconductor.
12. The radiation detector of claim 1 , wherein the electronics layer is configured to bias the first set of electrodes and the second set of electrodes to different electric voltages through the first set of electric contacts and the second set of electric contacts.
13. The radiation detector of claim 1 , wherein the radiation is X-ray.
14. The radiation detector of claim 1 , further comprising an integrator electrically connected to the electric contact, wherein the integrator is configured to collect charge carriers from the electric contact.
15. The radiation detector of claim 1 , wherein the controller is configured to activate the second voltage comparator at a beginning or expiration of the time delay.
16. The radiation detector of claim 1 , wherein the controller is configured to connect the electric contact to an electrical ground.
17. The radiation detector of claim 1 , wherein a rate of change of the voltage is substantially zero at expiration of the time delay.