Collation/retrieval system, collation/retrieval server, image feature extraction apparatus, collation/retrieval method, and program
The present invention is a collation/retrieval system collating a product manufactured by or delivered from a producer or a distributor with a product to be collated comprising: a storage unit that stores an image feature of a predetermined collation area of the product determined in advance at a position relative to a reference section common in every product; a to-be-collated product feature extraction unit that receives an image of the product to be collated and detecting the reference section of the product from the received image to extract an image feature of the collation area determined by reference to the reference section; and a collation unit that collates the stored image feature with the image feature of the collation area of the product to be collated.
1. A collation apparatus comprising:
a storage device configured to store first image features and management information, wherein
the first image features are generated from first surface images of metal workpieces or semiconductor chips, and
the management information correspond to the metal workpieces or semiconductor chips;
a memory configured to store instructions; and
a processor coupled to the memory and configured to execute the instructions to:
obtain a second surface image of a metal workpiece or a semiconductor chip,
collate a second image feature with the first image features, wherein the second image feature is generated from the second surface image, and
in response to matching the second image feature with one of the first image features, output the management information, wherein the management information includes at least one of a production site, a producer name, a lot number, a production date, a shipping point, and a ship date of the metal workpiece or the semiconductor chip corresponding to the second surface image.
2. The collation apparatus according to claim 1 , wherein the processor is configured to execute the instructions to output the management information to a user's device.
3. The collation apparatus according to claim 1 , wherein each first surface image is a unique surface image of the corresponding metal workpiece or semiconductor chip.
4. A collation method performed by a processor executing instructions stored on a memory coupled to the processor, the collation method comprising:
obtaining a second surface image of a metal workpiece or a semiconductor chip;
collating a second image feature with first image features, wherein
the first image features are stored in a storage device,
the second image feature is generated from the second surface image, and
the storage device stores the first image features and management information, wherein
the first image features are generated from first surface images of metal workpieces or semiconductor chips; and
in response to matching the second image feature with one of the first image features, outputting the management information, wherein the management information includes at least one of a production site, a producer name, a lot number, a production date, a shipping point, and a ship date of the metal workpiece or semiconductor chip corresponding to the second surface image.
5. The collation method according to claim 4 , wherein the outputting step comprises outputting the management information to a user's device.
6. The collation method according to claim 4 , wherein each first surface image is a unique surface image of the corresponding metal workpiece or semiconductor chip.
7. A collation system comprising:
a storage device configured to store first image features and management information, wherein
the first image features are generated from first surface images of metal workpieces or semiconductor chips, and
the management information correspond to the metal workpieces or semiconductor chips;
a memory configured to store instructions; and
a processor coupled to the memory and configured to execute the instructions to:
obtain a second surface image of a metal workpiece or a semiconductor chip,
collate a second image feature with the first image features, wherein the second image feature is generated from the second surface image, and
in response to matching the second image feature with one of the first image features, output the management information, wherein the management information includes at least one of a production site, a producer name, a lot number, a production date, a shipping point, and a ship date of the metal workpiece or the semiconductor chip corresponding to the second surface image.
8. The collation system according to claim 7 , wherein the processor is configured to execute the instructions to output the management information to a user's device.
9. The collation system according to claim 7 , wherein each first surface image is a unique surface image of the corresponding metal workpiece or semiconductor chip.