Test data generation apparatus, test data generation method and program

1. A test data generation device comprising a storage device and a processor configured to execute a method comprising:

storing, in the storage device, a tacit knowledge test data dictionary including, for a tacit knowledge category, a generation process, test data information, and an input value constraint of an input field to be used as a generation condition; and

generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring the tacit knowledge test data dictionary, test data for the target input field when an input value constraint of the target input field in a test target application matches with an input value constraint of the generation condition associated with the tacit knowledge category, except when the input value constraint of the target input field and the input value constraint of the generation condition associated with the tacit knowledge category do not match.

2. The test data generation device according to claim 1 , wherein the generating further includes generating the test data for the target input field when no generation condition for the tacit knowledge category is present in the tacit knowledge test data dictionary.

3. The test data generation device according to claim 2 , wherein the test data is associated with an input variation test of the test target application.

4. The test data generation device according to claim 2 , wherein the matching of the input value constraint of the target input field in the test target application and the input value constraint of the generation condition associated with the tacit knowledge category is based at least on an input data type.

5. The test data generation device according to claim 2 , wherein the generation process is based on a regular expression.

6. The test data generation device according to claim 1 , wherein the test data is associated with an input variation test of the test target application.

7. The test data generation device according to claim 1 , wherein the matching of the input value constraint of the target input field in the test target application and the input value constraint of the generation condition associated with the tacit knowledge category is based at least on an input data type.

8. The test data generation device according to claim 1 , wherein the generation process is based on a regular expression.

9. A test data generation device comprising a storage device and a processor configured to execute a method comprising:

storing, in the storage device, a tacit knowledge test data dictionary including, in a tacit knowledge category, a generation process and test data information; and

generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring to the tacit knowledge test data dictionary, test data satisfying an input value constraint of the target input field based on a regular expression.

10. The test data generation device according to claim 9 , wherein the input value constraint includes a character string length or a numerical value range.

11. The test data generation device according to claim 10 , wherein the test data is associated with an input variation test of a test target application.

12. The test data generation device according to claim 10 , wherein the generation process is based on a regular expression.

13. The test data generation device according to claim 9 , wherein the test data is associated with an input variation test of a test target application.

14. The test data generation device according to claim 9 , wherein the generation process is based on a regular expression.

15. A computer-implemented method for generating test data, comprising:

storing a tacit knowledge test data dictionary including, in a tacit knowledge category, a generation process, test data information, and an input value constraint of an input field to be used as a generation condition; and

generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring to the tacit knowledge test data dictionary, test data for the target input field when an input value constraint of the target input field in a test target application matches with an input value constraint of a generation condition associated with the tacit knowledge category, except when the input value constraint of the target input field and the input value constraint of the generation condition associated with the tacit knowledge category do not match.

16. The computer-implemented method according to claim 15 , wherein the test data is associated with an input variation test of the test target application.

17. The computer-implemented method according to claim 15 , wherein the matching of the input value constraint of the target input field in the test target application and the input value constraint of the generation condition associated with the tacit knowledge category is based at least on an input data type.

18. The computer-implemented method according to claim 15 , wherein the generation process is based on a regular expression.