IP Library › Granted Patent US 12,009,280
Granted Patent B2
US 12,009,280 · App. 17/547,698 · Granted Jun 11, 2024

IC package with heat spreader

Inventors: Rongwei Zhang (Plano, TX); Woochan Kim (San Jose, CA); Patrick Francis Thompson (Allen, TX)
Assignee: TEXAS INSTRUMENTS INCORPORATED
H01L23/3677H01L21/4882H01L24/48H01L25/0655H01L2224/48138H01L2224/48158
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,009,280
App. No.
17/547,698
Granted
Jun 11, 2024
Kind
B2
Abstract

An integrated circuit (IC) package includes a molding having a first surface and a second surface, the first surface opposing the second surface. An interconnect is encased in the molding. The interconnect includes pads situated at a periphery of a side of the IC package. A portion of the pads are exposed at the first surface of the molding. A die pad is situated proximal to the second surface of the molding. The die pad has a first surface and a second surface, the first surface opposing the second surface, and the second surface is circumscribed by the second surface of the molding. A die is mounted on the first surface of the die pad. A heat spreader is mounted on the second surface of the molding and the second surface of the die pad. The heat spreader extends between edges of the second surface of the molding.

Claims (38)

1. An integrated circuit (IC) package comprising:

a molding having a first surface and a second surface, the first surface opposing the second surface;

an interconnect encased in the molding, the interconnect comprising:

pads situated at a periphery of a first surface of the IC package, wherein a portion of the pads are exposed at the first surface of the molding; and

a die pad situated proximal to the second surface of the molding, the die pad having a first surface and a second surface, the first surface opposing the second surface, and the second surface is circumscribed by the second surface of the molding;

a die mounted on the first surface of the die pad; and

a heat spreader mounted on the second surface of the molding and the second surface of the die pad, wherein the heat spreader extends between edges of the second surface of the molding, and the heat spreader provides a second surface of the IC package.

2. The IC package of claim 1 , wherein the die is a first die, and the IC package comprises a second die mounted on the first surface of the die pad.

3. The IC package of claim 2 , wherein the first die and the second die are spaced apart.

4. The IC package of claim 2 , wherein the first die has a first supply voltage, and the second die has a second supply voltage, greater than the first supply voltage.

5. The IC package of claim 4 , wherein wire bonds electrically couple the first die to the second die.

6. The IC package of claim 5 , wherein the wire bonds electrically couple the first die and the second die to the pads of the interconnect.

7. The IC package of claim 1 , wherein a plane perpendicular to the second surface and the first surface of the molding crosses the heat spreader and a pad of the pads of the interconnect.

8. The IC package of claim 7 , wherein a heat sink is mountable on the heat spreader.

9. The IC package of claim 1 , wherein the IC package is a quad flat no leads (QFN) package.

10. The IC package of claim 1 , wherein the heat spreader extends to the edges of the second surface of the molding.

11. The IC package of claim 1 , further including a heat sink mounted on the heat spreader.

12. The IC package of claim 11 , wherein the heat sink is a castellated structure.

13. The IC package of claim 1 , further including traces of a printed circuit board electrically connected to the pads situated at the periphery of the first surface of the IC package.

14. An apparatus comprising:

an integrated circuit (IC) package comprising:

a molding having a first surface and a second surface, the first surface opposing the second surface;

an interconnect encased in the molding, the interconnect comprising:

pads situated at a periphery of a first surface of the IC package, wherein a portion of the pads are exposed at the first surface of the molding; and

a die pad situated proximal to the second surface of the molding, the die pad having a first surface and a second surface, the first surface opposing the second surface, and the second surface is circumscribed by the second surface of the molding;

a die mounted on the first surface of the die pad;

a heat spreader mounted on the second surface of the molding and the second surface of the die pad, wherein the heat spreader extends between edges of the second surface of the molding, and the heat spreader provides a second surface of the IC package; and

a printed circuit board (PCB) having traces on a surface of the PCB, at least some of the pads being electrically connected to at least some of the traces.

15. The apparatus of claim 14 , wherein the IC package is a quad flat no leads (QFN) package.

16. The apparatus of claim 14 , wherein the heat spreader extends to the edges of the second surface of the molding.

17. The apparatus of claim 14 , further including a heat sink mounted on the heat spreader.

18. The apparatus of claim 14 , wherein a plane perpendicular to the second surface and the first surface of the molding crosses the heat spreader and a pad of the pads of the interconnect.

19. The apparatus of claim 18 , wherein a heat sink is mountable on the heat spreader.

20. The apparatus of claim 14 , wherein the die is a first die, and the IC package comprises a second die mounted on the first surface of the die pad.

21. The apparatus of claim 20 , wherein the first die and the second die are spaced apart.

22. The apparatus of claim 20 , wherein the first die has a first supply voltage, and the second die has a second supply voltage, greater than the first supply voltage.

23. The apparatus of claim 22 , wherein wire bonds electrically couple the first die to the second die.

24. The apparatus of claim 23 , wherein the wire bonds electrically couple the first die and the second die to the pads of the interconnect.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 10, 2021
From: ZHANG, RONGWEI; KIM, WOOCHAN; THOMPSON, PATRICK FRANCIS
To: TEXAS INSTRUMENTS INCORPORATED
Reel/Frame 059082/0483 →
Continuity (1)
Related Publication 20230187306A1 · Jun 15, 2023