IP Library Granted Patent US 12,012,660
Granted Patent B2
US 12,012,660 · App. 17/042,337 · Granted Jun 18, 2024

Method for manufacturing LCP-based flexible copper-clad plate, and article thereof

Inventors: Nianqun Yang (Zhuhai, CN); Zhigang Yang (Zhuhai, CN); Zhiqiang Zhang (Zhuhai, CN); Honglin Song (Zhuhai, CN)
Assignee: Richview Electronics Co., Ltd.
C23F17/00C23C14/022C23C14/024C23C14/205C23C14/35C23C14/48C25D3/38
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Quick Facts
Patent No.
US 12,012,660
App. No.
17/042,337
Granted
Jun 18, 2024
Kind
B2
Abstract

Disclosed is a method for manufacturing an LCP-based flexible copper-clad laminate, comprising: providing an LCP substrate and subjecting the LCP substrate to a Hall ion source pre-treatment; forming an ion-implanted layer in a certain depth range below the surface of the LCP substrate via ion implantation; performing plasma deposition to form a plasma deposition layer onto the ion-implanted layer; performing magnetron sputtering deposition to deposit copper ions onto the plasma deposition layer and form a magnetron sputtering deposition layer; and plating the magnetron sputtering deposition layer with a thickened copper layer to obtain the LCP-based flexible copper-clad laminate. Also disclosed is an LCP-based flexible copper-clad laminate, wherein a peeling strength between a copper foil and the LCP substrate of the LCP-based flexible copper-clad laminate is greater than or equal to 0.5 N/mm, a surface roughness between the two is smaller than or equal to 0.3 μm, a thickness tolerance of double-sided copper foil is not more than 4.3 μm, and a thickness tolerance of single-sided copper foil is not more than 3.4 μm.

Claims (35)

1. A method for manufacturing an LCP-based flexible copper-clad laminate, comprising:

providing an LCP substrate, and subjecting the LCP substrate to a Hall ion source pre-treatment, to clean a surface of the LCP substrate;

implanting first metal ions into the LCP substrate via ion implantation, to form an ion-implanted layer in a certain depth range below the surface of the LCP substrate;

performing plasma deposition on the LCP substrate subjected to the ion implantation, to deposit second metal ions onto the ion-implanted layer and form a plasma deposition layer;

performing magnetron sputtering deposition to deposit copper ions onto the plasma deposition layer and form a magnetron sputtering deposition layer; and

plating the magnetron sputtering deposition layer with a thickened copper layer to obtain the LCP-based flexible copper-clad laminate,

wherein a temperature of the LCP substrate is controlled to be always lower than 200° C. during the process of manufacturing the LCP-based flexible copper-clad laminate; and

wherein during the ion implantation, an ion implantation voltage is set to 10 kV to 20 kV, an ion implantation current is set to 1 mA to 4 mA, and an implantation time is set to 40 s to 3 min.

2. The method according to claim 1 , wherein a peeling strength between a copper foil and the LCP substrate of the LCP-based flexible copper-clad laminate is greater than or equal to 0.5 N/mm.

3. The method according to claim 1 , wherein a thickness tolerance of double-sided copper coil in the LCP-based flexible copper-clad laminate is not more than 4.3 μm, while a thickness tolerance of single-sided copper foil is not more than 3.4 μm.

4. The method according to claim 1 , wherein the Hall ion source pre-treatment comprises: increasing a temperature within a Hall source chamber to 40° C. to 120° C., by way of heating with a vacuum heating pipe.

5. The method according to claim 4 , wherein while the temperature within the Hall source chamber is increased to 40° to 70° C., a treatment voltage is set to 1500V to 2000V, a treatment current is set to 1.5 A to 2 A, and a treatment time is set to 20 min to 30 min.

6. The method according to claim 4 , wherein while the temperature within the Hall source chamber is increased to 70° C. to 100° C., a treatment voltage is set to 1000V to 1500V, a treatment current is set to 1 A to 1.5 A, and a treatment time is set to 10 min to 20 min.

7. The method according to claim 4 , wherein while the temperature within the Hall source chamber is increased to 100° C. to 120° C., a treatment voltage is set to 500V to 1000V, a treatment current is set to 0.04 A to 1 A, and a treatment time is set to 30 s to 10 min.

8. The method according to claim 1 , wherein the Hall ion source pre-treatment comprises: controlling a temperature of the LCP substrate at a range of 40° C. to 80° C., by controlling parameters of the Hall ion source.

9. The method according to claim 8 , wherein a treatment voltage is set to 1500V to 2000V, a treatment current is set to 1.5 A to 2 A, and a treatment time is set to 30 s to 20 min, and wherein the LCP substrate is controlled at a range of 40° C. to 80° C.

10. The method according to claim 8 , wherein a treatment voltage is set to 1000V to 1500V, a treatment current is set to 1 A to 1.5 A, and a treatment time is set to 10 s to 20 min, and wherein the LCP substrate is controlled at a range of 40° C. to 80° C.

11. The method according to claim 8 , wherein a treatment voltage is set to 500V to 1000V, a treatment current is set to 0.04 A to 1 A, and a treatment time is set to 20 s to 30 min, and wherein the LCP substrate is controlled at a range of 40° C. to 80° C.

12. The method according to claim 1 , wherein a working gas of the Hall ion source includes argon, nitrogen, hydrogen, oxygen, carbon dioxide, and a mixed gas composed of a combination thereof.

13. The method according to claim 1 , wherein during the plasma deposition, the plasma deposition is configured to adopt a deposition current of 45 A to 70 A, a deposition energy of 10 eV to 30 eV, and a deposition time of 40 s to 3 min.

14. The method according to claim 1 , wherein during the magnetron sputtering deposition, a deposition current is set to 2 A to 10 A, a deposition voltage is set to 200V to 500V, and a deposition time is set to 40 s to 3 min.

15. The method according to claim 1 , further comprising: performing high temperature annealing treatment on the LCP-based flexible copper-clad laminate at a temperature of 200° C. to 300° C. for 30 s to 10 minutes, such that a bending resistance property of the LCP-based flexible copper-clad laminate shows at least more than 400 times of bending.

16. The method according to claim 1 , wherein a bonding surface between a copper foil and the LCP substrate of the LCP-based flexible copper-clad laminate has a surface roughness of ≤0.3 μm.

17. An LCP-based flexible copper-clad laminate manufactured according to the method of claim 1 , the LCP-based flexible copper-clad laminate comprising:

an LCP substrate;

an ion-implanted layer implanted into the LCP substrate below a surface of the LCP substrate;

a plasma deposition layer deposited onto the ion-implanted layer;

a magnetron sputtering deposition layer deposited onto the plasma deposition layer; and

a thickened copper layer plated onto the magnetron sputtering deposition layer,

wherein a bonding surface between a copper foil and the LCP substrate of the LCP-based flexible copper-clad laminate can reach a surface roughness of ≤0.3 μm.

18. The LCP-based flexible copper-clad laminate according to claim 17 , wherein a peeling strength between the copper foil and the LCP substrate of the LCP-based flexible copper-clad laminate is greater than or equal to 0.5 N/mm.

19. The LCP-based flexible copper-clad laminate according to claim 17 , wherein a thickness tolerance of double-sided copper foil in the LCP-based flexible copper-clad laminate is not more than 4.3 μm, while a thickness tolerance of single-sided copper foil is not more than 3.4 μm.

20. The method according to claim 1 , wherein a working gas of the Hall ion source includes oxygen.

21. The method according to claim 1 , wherein the first metal ions are copper ions.

22. The method according to claim 1 , wherein the second metal ions are copper ions.

Assignments (2)
CHANGE OF NAME Recorded Jun 16, 2025
From: RICHVIEW ELECTRONICS CO., LTD.
To: THINKTRANS ELECTRONIC MATERIALS (SHENZHEN) CO., LTD.
Reel/Frame 071635/0751 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 28, 2020
From: YANG, NIANQUN; YANG, ZHIGANG; ZHANG, ZHIQIANG; SONG, HONGLIN
To: RICHVIEW ELECTRONICS CO., LTD.
Reel/Frame 053899/0972 →
Priority Claims (1)
CN 201810291943.2 · Mar 30, 2018 · national
Continuity (1)
Related Publication 20210025061A1 · Jan 28, 2021