Imaging system hardware
A sample holder includes a first member featuring a first retaining mechanism configured to retain a first substrate that includes a sample, a second member featuring a second retaining mechanism configured to retain a second substrate that includes a reagent medium, and an alignment mechanism connected to at least one of the first and second members, and configured to align the first and second members such that the sample contacts at least a portion of the reagent medium when the first and second members are aligned.
1. A device comprising:
a first substrate;
a second substrate;
a first support member comprising a first planar surface configured to support the first substrate;
first means for retaining the first substrate on the first planar surface, wherein the first means for retaining is positioned on the first support member;
a second support member comprising a second planar surface configured to support the second substrate;
second means for retaining the second substrate on the second planar surface,
a hinge operably connecting the first support member and the second support member; and
a spacing member connected to the first support member or the second support member,
wherein the first support member comprises an aperture positioned so that when the first substrate is retained by the first means for retaining, the aperture is aligned with a sample region of the first substrate,
wherein the first support member and the second support member have an open configuration and a closed configuration, wherein the hinge is configured to allow relative movement of the first support member and the second support member to bring the first planar surface and the second planar surface toward one another from the open configuration to the closed configuration, and
wherein the first support member, the second support member, the spacing member, and the hinge are arranged such that, in the closed configuration:
the first planar surface is parallel to and faces the second planar surface; and
the spacing member is positioned between the first support member and the second support member such that (i) the first planar surface is disposed at a distance from the second planar surface and (ii) the first substrate is disposed at a distance from the second substrate.
2. The device of claim 1 , wherein the first means for retaining comprises a recess dimensioned to receive the first substrate.
3. The device of claim 1 , wherein at least one of:
the first means for retaining is configured to apply a force to the first substrate to maintain contact between the first substrate and the first support member, or
the second means for retaining is configured to apply a force to the second substrate to maintain contact between the second substrate and the second support member.
4. The device of claim 1 , wherein the second means for retaining comprises a recess dimensioned to receive the second substrate.
5. The device of claim 1 , wherein the second support member comprises at least one additional aperture positioned so that when the first substrate is retained by the first means for retaining and the first and second support members are aligned by the hinge, the at least one additional aperture is aligned with at least a portion of a sample region of the first substrate.
6. The device of claim 1 , further comprising an adjustment mechanism connected to the first support member and configured to translate the first substrate in at least one direction parallel to the first planar surface.
7. The device of claim 1 , wherein the first support member, the second support member, the spacing member, and the hinge are arranged such that, in the closed configuration, the distance from the second substrate is between 50 microns and 1 mm, measured in a direction orthogonal to the first planar surface.
8. The device of claim 1 , wherein a distance between the first and second substrates during operation of the device is between 50 microns and 500 microns.
9. A device comprising:
a first substrate;
a second substrate;
a first support member comprising:
a first planar surface configured to support the first substrate, and
first means for retaining the first substrate on the first planar surface, wherein the first support member comprises an aperture positioned so that when the first substrate is retained, the aperture is aligned with a sample region of the first substrate;
a second support member comprising:
a second planar surface configured to support the second substrate, and
second means for retaining the second substrate on the second planar surface;
a spacing member connected to the first support member or the second support member;
a hinge operably connecting the first support member and the second support member, wherein:
the first support member and the second support member have an open configuration and a closed configuration,
the hinge is configured to allow relative movement of the first support member and the second support member to bring the first planar surface and the second planar surface toward one another from the open configuration to the closed configuration, and
the first support member, the second support member, the spacing member, and the hinge are arranged such that, in the closed configuration:
the first planar surface is parallel to and facing the second planar surface; and
the spacing member is positioned between the first support member and the second support member to maintain (i) a separation between the first planar surface and the second planar surface and (ii) separation between the first substrate and the second substrate; and
means for adjusting a distance of the separation between the first planar surface and the second planar surface in a direction orthogonal to the first planar surface.
10. The device of claim 9 , wherein the means for adjusting comprises a linear actuator.
11. The device of claim 9 , wherein the first means for retaining comprises a recess dimensioned to receive the first substrate.
12. The device of claim 11 , wherein the recess comprises first and second edges that are parallel to one another.
13. The device of claim 9 , wherein the second means for retaining comprises a recess dimensioned to receive the second substrate.
14. The device of claim 9 , wherein:
the first means for retaining comprises a first recess, the first recess being dimensioned to receive the first substrate and comprising parallel edges for engaging edges of the first substrate; and
the second means for retaining comprises a second recess, the second recess being dimensioned to receive the second substrate and comprising parallel edges for engaging edges of the second substrate.
15. The device of claim 9 , wherein at least one of:
the first means for retaining is configured to apply a force to the first substrate to maintain contact between the first substrate and the first support member, or
the second means for retaining is configured to apply a force to the second substrate to maintain contact between the second substrate and the second support member.
16. The device of claim 9 , wherein the second support member comprises at least one additional aperture positioned so that when the first substrate is retained and the first and second support members are aligned by the hinge, the at least one additional aperture is aligned with at least a portion of a sample region of the first substrate.
17. The device of claim 9 , further comprising an adjustment mechanism connected to the first support member and configured to translate the first substrate in at least one direction parallel to the first planar surface.
18. The device of claim 3 , wherein the first retaining member comprises one or more clips configured to apply the force to a surface of the first substrate.
19. The device of claim 1 , wherein the relative movement of the first support member and the second support member is a relative rotation of the first support member and the second support member.
20. The device of claim 1 , wherein:
the first support member is connected to the hinge; and
the second support member is connected to the hinge.
21. The device of claim 1 , wherein the relative movement of the first support member and the second support member comprises a movement of the first support member or the second support member in a direction orthogonal to the first planar surface or the second planar surface, respectively.