Low-temperature method for transfer and healing of a semiconductor layer

1. A method for creating a substrate of semiconductor on insulator type, comprising:

a) providing a donor substrate comprising a monocrystalline support substrate, a smoothing layer and a semiconductor layer, the smoothing layer forming an etch stop layer having etch selectivity with respect to a material of the monocrystalline support substrate, and the smoothing layer comprising silicon and germanium;

a′) implantation of fs ion species through the semiconductor layer so as to form a fragilisation plane;

b) creating an assembly by placing the donor substrate and a receiver substrate in contact; and

c) transferring the semiconductor layer and at least a part of the smoothing layer by detachment along the fragilization plane,

wherein the semiconductor layer of the donor substrate provided in step a) is monocrystalline and wherein the method further comprises the following steps:

before step b), amorphization of at least a part of the semiconductor layer to form an amorphous layer by implantation of second ion species different than the first ion species; and

after step c), recrystallization in solid phase of the amorphous layer to form a transferred monocrystalline semiconductor layer comprising the semiconductor of the semiconductor on insulator substrate.

2. The method according to claim 1 , wherein said recrystallisation is followed by an amorphization of the transferred monocrystalline semiconductor layer to form a new amorphous layer and by a recrystallization in solid phase of the new amorphous layer to form a new transferred monocrystalline semiconductor layer.

3. The method according to claim 1 , further comprising a removal of a layer rich in interstitial atoms present on a surface of the transferred monocrystalline semiconductor layer.

4. The method according to claim 3 , wherein said removal comprises plasma-assisted oxidation followed by chemical etching.

5. The method according to claim 1 , wherein the amorphization of at least a part of the semiconductor layer comprises the amorphization of the entirety of the semiconductor layer.

6. The method according to claim 1 , wherein the amorphization of at least a part of the semiconductor layer comprises joint amorphization of the semiconductor layer and of the smoothing layer.

7. The method according to claim 1 , wherein the donor substrate provided in step a) further comprises an intermediate layer and a thinning layer interposed between the intermediate layer and the semiconductor layer, the thinning layer forming an etch stop layer with respect to the material of the semiconductor layer and wherein step d) further comprises the successive carrying out of a selective etching of the smoothing layer with respect to the intermediate layer, of a selective etching of the intermediate layer with respect to the thinning layer and of a selective etching of the thinning layer with respect to the semiconductor layer.

8. The method according to claim 7 , wherein the amorphization of at least a part of the semiconductor layer comprises joint amorphization of the semiconductor layer and of at least a part of the thinning layer.

9. The method according to claim 7 , wherein the amorphization of at least a part of the semiconductor layer comprises the joint amorphization of the semiconductor layer, of the thinning layer and of at least a part of the intermediate layer.

10. The method according to claim 7 , wherein the amorphization of at least a part of the semiconductor layer comprises the joint amorphization of the semiconductor layer, of the thinning layer, of the intermediate layer and of at least a part of the smoothing layer.

11. The method according claim 1 , wherein during the step a′) of implantation of ion species, the fragilization plane is formed in the support substrate, and wherein the method further comprises, after step c) of transferring, the following step:

d) carrying out a selective etching of said part of the support substrate with respect to the smoothing layer.

12. The method according to claim 11 , wherein step d) further comprises performing of selective etching of the smoothing layer.

13. The method according to claim 1 , wherein during step a′) of implantation of ionic species, the fragilization plan is formed in the smoothing layer.

14. The method according to claim 1 , comprising, before the amorphization of at least a part of the semiconductor layer, formation on the semiconductor layer, by thermal oxidation at a temperature lower than 800° C., of a dielectric layer having a thickness between 5 nm and 25 nm, said dielectric layer being in step b) at the interface of the donor and receiver substrates placed in contact.

15. The method according to claim 14 , wherein said formation further comprises, after the amorphization of at least a part of the semiconductor layer, a thickening of the dielectric layer via a deposition of a dielectric at low temperature.

16. The method according to claim 1 , further comprising, after the formation of the amorphous layer and before said implantation, deposition of one or more layers on the donor substrate.

17. The method according to claim 1 , wherein the receiver substrate integrates a level of microelectronic components.

18. The method according to claim 1 , wherein the semiconductor layer comprises silicon.

19. The method according to claim 1 , wherein a germanium content of the smoothing layer is between 20 and 40%.

20. A method for creating a substrate of semiconductor on insulator type, comprising:

providing a donor substrate comprising a monocrystalline support substrate, a smoothing layer and a semiconductor layer, the smoothing layer forming an etch stop layer having etch selectivity with respect to a material of the monocrystalline support substrate;

implantation of first ion species through the semiconductor layer so as to form a fragilisation plane;

creating an assembly by placing the donor substrate and a receiver substrate in contact;

transferring the semiconductor layer and at least a part of the smoothing layer by detachment along the fragilization plane; and

removing the smoothing layer,

wherein the semiconductor layer of the donor substrate is monocrystalline and wherein the method further comprises the following steps:

before the creating, amorphization of at least a part of the semiconductor layer to form an amorphous layer by implantation of second ion species different than the first ion species; and

after the transferring, recrystallization in solid phase of the amorphous layer to form a transferred monocrystalline semiconductor layer comprising the semiconductor of the semiconductor on insulator substrate.