Test socket assemblies with liquid cooled frame for semiconductor integrated circuits

1. A socket assembly for a semiconductor integrated circuit (IC) chip, comprising:

a socket frame including a metallic frame body defining an opening sized to receive the semiconductor IC chip, wherein the frame body includes one or more channels transversely positioned through the frame body and positioned in an interior of the frame body, the channels defining a fluid path; and

a socket cartridge including a metallic cartridge body defining a plurality of cavities each sized to receive a test probe therein, the socket frame covering a portion of the socket cartridge and exposing the plurality of cavities at the opening.

2. The socket assembly of claim 1 , further comprising:

an inlet coupled to the socket frame at a beginning of the fluid path; and

an outlet coupled to the socket frame at an end of the fluid path.

3. The socket assembly of claim 1 , wherein the socket frame includes one or more plugs each positioned at an exterior of the socket frame and at an end of one of the channels.

4. The socket assembly of claim 1 , wherein the socket frame and the socket cartridge are fabricated as a single piece.

5. The socket assembly of claim 1 , further comprising thermal paste positioned between the socket frame and the socket cartridge.

6. The socket assembly of claim 1 , wherein the socket frame further comprises a first insulation layer positioned at a surface of the frame body except at a side interfacing with the socket cartridge, the socket cartridge further comprises a second insulation layer positioned at a surface of the cartridge body except at a side interfacing with the socket frame.

7. The socket assembly of claim 6 , wherein the cavities include ground cavities that are not insulated.

8. The socket assembly of claim 6 , wherein the cavities include signal cavities that are not insulated.

9. A method of assembling a socket assembly for a semiconductor integrated circuit (IC) chip, comprising:

forming a socket frame including a metallic frame body that defines an opening sized to receive the semiconductor IC chip, wherein the frame body includes one or more channels transversely positioned through the frame body and positioned in an interior of the frame body, the channels defining a fluid path;

forming a socket cartridge including a metallic cartridge body that defines a plurality of cavities each sized to receive a test probe therein; and

mounting the socket frame on the socket cartridge by covering a portion of the socket cartridge and exposing the plurality of cavities at the opening.

10. The method of claim 9 , wherein forming a socket frame further comprises:

drilling one of the channels from an exterior of the socket frame; and

joining the channels to form the fluid path.

11. The method of claim 9 , further comprising:

coupling an inlet with the socket frame at a beginning of the fluid path; and

coupling an outlet with the socket frame at an end of the fluid path.

12. The method of claim 9 , wherein forming a socket frame further comprises positioning a plug at an exterior of the socket frame and at an end of one of the channels.

13. The method of claim 9 , wherein forming a socket cartridge further comprises forming the socket frame and the socket cartridge as a single piece.

14. The method of claim 9 , wherein mounting the socket frame further comprises placing thermal paste on at least one of the socket frame or the socket cartridge.

15. The method of claim 9 , wherein:

forming a socket frame further comprises coating the socket frame with a first insulation layer;

forming a socket cartridge further comprises coating the socket cartridge with a second insulation layer;

removing the first insulation layer of the socket frame at a side interfacing with the socket cartridge;

removing the second insulation layer of the socket cartridge at a side interfacing with the socket frame; and

mounting the socket frame further comprises mounting the socket frame on the socket cartridge by facing the interfacing side of the socket frame and the interfacing side of the socket cartridge with one another.

16. The method of claim 15 , wherein the cavities include ground cavities that are not insulated.

17. The method of claim 15 , wherein the cavities include signal cavities that are not insulated.