IP Library › Granted Patent US 12,033,550
Granted Patent B2
US 12,033,550 · App. 18/082,187 · Granted Jul 9, 2024

Method of testing display device

Inventors: Ahnho Jee (Hwaseong-si, KR); Heebum Park (Seongnam-si, KR); Sang-Woo Park (Cheonan-si, KR); Keunhyuk Youn (Hwaseong-si, KR); Sungho Cho (Yongin-si, KR)
Assignee: SAMSUNG DISPLAY CO., LTD.
G09G3/006G09G2310/0267G09G2330/12
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Quick Facts
Patent No.
US 12,033,550
App. No.
18/082,187
Granted
Jul 9, 2024
Kind
B2
Abstract

A method of testing a display device including a display panel which displays an image and a driver which drives the display panel including measuring a driving operating current in a state where the driver is enabled and the display panel is disabled, and determining whether the driver is defective, based on the driving operating current and measuring a display operating current in a state where the driver and the display panel are enabled, and determining whether the display panel is defective, based on the display operating current.

Claims (60)

1. A method of testing a display device including a display panel which displays an image and a driver which drives the display panel, the method comprising:

measuring a driving operating current in a state where the driver is enabled and the display panel is disabled, and determining whether the driver is defective, based on the driving operating current, wherein the driver comprises:

a logic part which receives an image signal and changes the image signal into an image data signal corresponding to the display panel; and

an analog part which changes the image data signal into a data signal for driving the display panel; and

wherein determining whether the driver is defective comprises:

measuring a first sub driving current in a state where the logic part is enabled and the analog part is disabled; and

determining whether the logic part is defective, based on the first sub driving current.

2. The method of claim 1 , further comprising measuring a display operating current in a state where the driver and the display panel are enabled, and determining whether the display panel is defective, based on the display operating current, wherein the determining whether the display panel is defective is performed when the driver is determined to be normal.

3. The method of claim 1 , wherein the driver includes a driver chip which includes the logic part and the analog part, and a scan block which generates a scan signal for displaying the image, and

wherein the determining whether the driver is defective includes:

determining whether the driver chip is defective; and

determining whether the scan block is defective.

4. The method of claim 3 , wherein the determining whether the driver chip is defective further includes:

measuring a second sub driving current in a state where the logic part and the analog part are enabled; and

determining whether the analog part is defective, based on the second sub driving current.

5. The method of claim 4 , wherein the determining whether the analog part is defective is performed after the determining whether the logic part is defective.

6. The method of claim 4 , wherein the display panel includes a plurality of pixels which displays the image, and a plurality of data lines and a plurality of scan lines which are electrically connected to the pixels,

wherein the scan block provides the scan signal to the display panel through the scan lines, and

wherein the determining whether the scan block is defective includes:

measuring a third sub driving current in a state where the scan block is enabled and the display panel is disabled; and

determine whether the scan block is defective, based on the third sub driving current.

7. The method of claim 6 , wherein the determining whether the scan block is defective is performed after the determining whether the analog part is defective.

8. The method of claim 6 , wherein the driver chip further includes a data output part which provides the data signal to the display panel,

wherein

the determining whether the driver is defective further includes:

determining whether the data output part is defective, and

wherein the determining whether the data output part is defective includes:

measuring a fourth sub driving current in a state where the data output part is enabled and the display panel is disabled; and

determining whether the data output part is defective, based on the fourth sub driving current.

9. The method of claim 8 , wherein the determining whether the data output part is defective is performed after the determining whether the scan block is defective.

10. The method of claim 2 , wherein the display panel includes a plurality of pixels which displays the image, a plurality of write scan lines, a plurality of emission scan lines, and a plurality of driving voltage lines which are electrically connected to the pixels,

wherein the driver includes a gate driving block which provides a write scan signal to the pixels through the write scan lines, and an emission driving block which provides an emission scan signal to the pixels through the emission scan lines, and

wherein the determining whether the display panel is defective includes:

measuring a first sub display current in a state where the emission scan signal is provided to the pixels and the write scan signal is not provided to the pixels; and

determining a connection state between the pixels and the emission scan lines based on the first sub display current.

11. The method of claim 10 , wherein the determining whether the display panel is defective is performed after the determining whether the driver is defective.

12. The method of claim 10 , wherein the determining whether the display panel is defective further includes:

measuring a second sub display current in a state where the write scan signal is provided to the pixels and a driving voltage for driving the pixels is not provided to the pixels; and

determining a connection state between the pixels and the write scan lines based on the second sub display current.

13. The method of claim 12 , wherein the determining the connection state between the pixels and the write scan lines is performed after the determining the connection state between the pixels and the emission scan lines.

14. The method of claim 12 , wherein the determining whether the display panel is defective further includes:

measuring a third sub display current in a state where the driving voltage is provided to the pixels and the display panel does not display the image; and

determining a connection state between the pixels and the driving voltage lines based on the third sub display current.

15. The method of claim 14 , wherein the determining the connection state between the pixels and the driving voltage lines is performed after the determining the connection state between the pixels and the write scan lines.

16. The method of claim 14 , wherein the determining whether the display panel is defective further includes:

measuring a fourth sub display current in a state the image is displayed on the display panel; and

determining whether the image is detective, based on the fourth sub display current.

17. The method of claim 16 , wherein the determining whether the image is defective is performed after the determining the connection state between the pixels and the driving voltage lines.

18. The method of claim 16 , wherein the display device further includes an input sensing layer disposed on the display panel, wherein the input sensing layer detects an external input,

the method further comprises:

measuring an input operating current in a state the driver, the display panel and the input sensing layer are enabled; and

determining whether the input sensing layer is defective, based on the input operating current.

19. The method of claim 18 , wherein, the determining whether the input sensing layer is defective is performed when the display panel is determined to be normal.

20. A method of testing a display device including a display panel which includes a plurality of pixels which displays an image, a plurality of write scan lines, a plurality of emission scan lines, and a plurality of driving voltage lines which are electrically connected to the pixels, and a driver which drives the display panel, the method comprising:

measuring a display operating current in a state where the driver and the display panel are enabled, and determining whether the display panel is defective, based on the display operating current, wherein determining whether the display panel is defective includes:

measuring a first sub display current in a state where an emission scan signal is provided from the driver to one or more pixels of the display panel and a write scan signal is not provided by the driver to the one or more pixels;

determining a connection state between the one or more pixels and the emission scan lines based on the first sub display current; and

responsive to determining the connection state between the one or more pixels and the emission scan lines:

measuring a second sub display current in a state where the write scan signal is provided to the one or more pixels and a driving voltage is not provided to the one or more pixels; and

determining a connection state between the one or more pixels and the write scan lines based on the second sub display current.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2023
From: JEE, AHNHO; PARK, HEEBUM; PARK, SANG-WOO; YOUN, KEUNHYUK; CHO, SUNGHO
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 063749/0041 →
Priority Claims (1)
KR 10-2022-0037942 · Mar 28, 2022 · national
Continuity (1)
Related Publication 20230316965A1 · Oct 5, 2023
Cited By (1)
US 12,664,920