Identifying arrangement errors of detector elements within a gamma-ray detector system
In a gamma-ray detector system, such as a PET detector, coincidence events between multiple detector elements can be caused by inter-detector scattering and/or energy escape of the multi-stage radiation background in the scintillator crystals. Because these types of coincidence events are more likely to happen between nearby elements, they can be measured, analyzed and ultimately used to identify arrangement errors of detector elements in a gamma-ray detector system.
1. A method for identifying arrangement errors of detector elements within a gamma-ray detector ring, the method comprising:
acquiring detector element event data associated with radiation events within the detector elements of the gamma-ray detector ring;
identifying, based on the detector element event data, assembly events between the detector elements of the gamma-ray detector ring;
calculating a metric based on each of the assembly events between the detector elements of the gamma-ray detector ring; and
identifying, based on the calculating, an arrangement error of the detector elements.
2. The method of claim 1 , wherein the detector element event data comprises a deposited energy of each of the radiation events, a time of energy deposition of each of the radiation events, and an energy deposition position of each of the radiation events.
3. The method of claim 1 , wherein the assembly events between the detector elements are coincidence events that occur between two or more detector elements within geometrically-cut sub-regions of the gamma-ray detector ring.
4. The method of claim 3 , wherein the detector element event data comprises a deposited energy of each of the radiation events and the geometrically-cut sub-regions for each of the assembly events are centered on a radiation event of the radiation events having a maximal deposited energy.
5. The method of claim 3 , wherein the geometrically-cut sub-regions of the gamma-ray detector ring are marginally larger than a diagonal length of the detector elements.
6. The method of claim 3 , wherein the geometrically-cut sub-regions of the gamma-ray detector ring are marginally larger than a longest dimension of the detector elements.
7. The method of claim 1 , wherein the calculating calculates, as the metric, a distance metric defining a distance between assembly events for each detector element.
8. The method of claim 1 , wherein the calculating calculates, as the metric, a relative correlation score between the detector elements.
9. The method of claim 8 , further comprising:
calculating the relative correlation score for all detector element layout combinations,
identifying, based on the relative correlation score for all the detector element layout combinations, a correct detector element layout, and
adjusting, based on the correct detector element layout, one or more look up tables used to relate each detector element to its physical location.
10. The method of claim 1 , further comprising:
collecting radiation events data at multiple time coincidence windows,
identifying, based on the collecting, a contribution from random assembly events to the metric, and
removing the contribution from random assembly events from the metric.
11. The method of claim 1 , further comprising
collecting radiation events data from a gamma-ray detector ring that is known to be defect-free, and
removing, based on the collecting, a contribution from random assembly events from the metric of the gamma-ray detector ring.
12. The method of claim 1 , further comprising:
generating training data by creating defective look up tables used to relate each of the detector elements to its physical location, and
training a machine learning system, using the training data, to identify arrangement errors.
13. The method of claim 1 , further comprising:
performing, prior to the acquiring, a partial position calibration when the gamma-ray detector ring is a Category 1 detector.
14. The method of claim 8 , wherein the relative correlation score is a comparison between a number of coincidence events between a first detector element and a second detector element to a summation of a total number of radiation events in the first detector element and the second detector element.
15. The method of claim 1 , wherein the detector elements are crystals.
16. The method of claim 1 , wherein the detector elements are modules.
17. The method of claim 1 , wherein the detector elements are detector units.
18. A gamma-ray detector system for identifying arrangement errors of detector elements within a gamma-ray detector ring comprising:
processing circuitry configured to
acquire detector element event data associated with radiation events within the detector elements of the gamma-ray detector ring;
identify based on the detector element event data, assembly events between the detector elements of the gamma-ray detector ring;
calculate a metric based on the assembly events between the detector elements of the gamma-ray detector ring; and
identify an arrangement error of the detector elements.
19. The gamma-ray detector system of claim 18 , wherein the processing circuitry is further configured to train a machine learning system based on training data generated by creating defective look up tables to identify an arrangement error.