Semiconductor memory device

1. A semiconductor memory device comprising:

a substrate;

a plurality of conductive layers arranged in a first direction intersecting with a surface of the substrate;

a first semiconductor layer that extends in the first direction and is opposed to the plurality of conductive layers;

an electric charge accumulating layer disposed between the plurality of conductive layers and the first semiconductor layer;

a first wiring electrically connected to one end portion in the first direction of the first semiconductor layer; and

a control circuit electrically connected to the plurality of conductive layers and the first wiring, wherein

the control circuit is configured to be able to perform a write operation and an erase operation,

the write operation includes a plurality of first write loops,

each of the plurality of first write loops includes a first program operation, and the first program operation applies a first program voltage to a first conductive layer as one of the plurality of conductive layers and applies a write pass voltage smaller than the first program voltage to a second conductive layer as one of the plurality of conductive layers,

the first program voltage increases by a first offset voltage together with an increase in a number of times of execution of the first write loop,

the erase operation includes:

a program voltage control operation; and

an erase voltage supply operation that applies an erase voltage to the first wiring after performing the program voltage control operation,

the program voltage control operation includes a plurality of second write loops,

each of the plurality of second write loops includes a second program operation, and the second program operation applies a second program voltage to a third conductive layer as one of the plurality of conductive layers and applies the write pass voltage to a fourth conductive layer as one of the plurality of conductive layers,

the second program voltage increases by a second offset voltage together with an increase in a number of times of execution of the second write loop, and

when the first program voltage in the first write loop performed first in the write operation is set as a third program voltage and the second program voltage in the second write loop performed last in the program voltage control operation is set as a fourth program voltage,

a magnitude of the third program voltage is adjusted according to a magnitude of the fourth program voltage.

2. The semiconductor memory device according to claim 1 , wherein

each of the plurality of first write loops includes a first verify operation, and the first verify operation applies a first verify voltage to the first conductive layer and applies a read pass voltage smaller than the first program voltage to the second conductive layer, and

each of the plurality of second write loops includes a second verify operation, and the second verify operation applies a second verify voltage to the third conductive layer and applies the read pass voltage to the fourth conductive layer.

3. The semiconductor memory device according to claim 2 , wherein

second verify data obtained by the second verify operation includes first data corresponding to a bit of verify PASS and second data corresponding to a bit of verify FAIL, and

each of the plurality of second write loops includes a second determination operation, and the second determination operation determines whether a count of the first data or the second data is within a second reference value or not.

4. The semiconductor memory device according to claim 1 , wherein

the program voltage control operation includes a pre-read operation, and the pre-read operation applies a read voltage to the third conductive layer before performing the second program operation and applies a read pass voltage smaller than the first program voltage to the fourth conductive layer.

5. The semiconductor memory device according to claim 3 , wherein

the program voltage control operation includes a pre-read operation, and the pre-read operation applies a read voltage to the third conductive layer before performing the second program operation and applies the read pass voltage to the fourth conductive layer,

the read data obtained by the pre-read operation includes third data and fourth data, the third data corresponds to a bit of an ON state, and the fourth data corresponds to a bit of an OFF state, and

the second reference value is changed according to a count of the third data or the fourth data.

6. The semiconductor memory device according to claim 1 , wherein

at least one of a magnitude of the erase voltage and a supply time of the erase voltage is changed according to the magnitude of the fourth program voltage.

7. The semiconductor memory device according to claim 1 , wherein

the control circuit includes a sense amplifier electrically connected to the first wiring,

the erase operation includes an erase verify operation, and the erase verify operation applies an erase verify voltage smaller than the erase voltage to the plurality of conductive layers and senses a voltage of the first wiring by the sense amplifier after performing the erase voltage supply operation, and

a sense time of the sense amplifier is changed according to the magnitude of the fourth program voltage.

8. The semiconductor memory device according to claim 1 , wherein

the write operation includes a first verify operation, and the first verify operation applies a first voltage to the first wiring, applies a first verify voltage smaller than the write pass voltage to the first conductive layer, and applies a read pass voltage larger than the first verify voltage to the second conductive layer after performing the first program operation, and

at least one of a magnitude of the first voltage and a condition for skipping the first verify operation is changed according to the magnitude of the fourth program voltage.

9. The semiconductor memory device according to claim 2 , wherein

the control circuit includes a sense amplifier electrically connected to the first wiring,

in the first verify operation, the sense amplifier senses a voltage of the first wiring, and

a sense time of the sense amplifier is changed according to the magnitude of the fourth program voltage.

10. The semiconductor memory device according to claim 8 , wherein

first verify data obtained by the first verify operation includes fifth data and sixth data, the fifth data corresponds to a bit of verify PASS, and sixth data corresponds to a bit of verify FAIL, and

the write operation includes a first determination operation that determines whether a count of the fifth data or the sixth data is less than a first reference value or not, and

the first reference value is changed according to the magnitude of the fourth program voltage.

11. The semiconductor memory device according to claim 1 , wherein

in the first program operation, a supply time of the first program voltage is changed according to the magnitude of the fourth program voltage.

12. The semiconductor memory device according to claim 1 , wherein

the write operation includes a precharge operation that applies a precharge voltage to the first conductive layer and the second conductive layer before performing the first program operation, and

at least one of the precharge voltage and a supply time of the precharge voltage is changed according to the magnitude of the fourth program voltage.