Method for monitoring transport vehicle and maintenance thereof

1. A method for monitoring a transport vehicle, the method comprising:

positioning a plurality of monitors nearby a rail in a semiconductor manufacturing factory, wherein at least one of the plurality of monitors is positioned under the rail, and the plurality of monitors are fixed nearby the rail and are separated from the transport vehicle;

performing a plurality of scanning operations to scan surface features of the transport vehicle by the plurality of monitors when the transport vehicle is lifting up an object or lowering the object by the monitor disposed between the rail and the transport vehicle when the transport vehicle passes through to acquire a vehicle pattern of the transport vehicle, wherein the transport vehicle comprises:

a gripping member;

a hoisting member configured to lift and lower the object from and to a load port of a semiconductor process machine station by the gripping member; and

a housing surrounding the gripping member and the hoisting member;

analyzing the vehicle pattern of the transport vehicle; and

determining if the transport vehicle is an abnormal transport vehicle based on the vehicle pattern, wherein the determination includes:

identifying a particle source from the vehicle pattern of the transport vehicle, and

identifying the abnormal transport vehicle through comparing a width of the gripping member of the transport vehicle from the vehicle pattern acquired by the monitor positioned under the rail and disposed between the rail and the transport vehicle to a corresponding desirable width of the gripping member of the transport vehicle,

wherein the particle source comprises crack or scratch of a surface of the housing.

2. The method of claim 1 , further comprising:

moving the abnormal transport vehicle out of the rail.

3. The method of claim 1 , wherein the vehicle pattern further comprises a serial number, a main body profile, a tyre tread profile, a travelling wheel size, and a guide wheel size of the transport vehicle.

4. The method of claim 1 , wherein the object comprises semiconductor wafers, semiconductor work-in-process (WIP) parts, semiconductor substrates, semiconductor structures, or semiconductor packages.

5. The method of claim 1 , wherein the hoisting member is extendable to move the gripping member out of the housing and retractable to move the gripping member back to the housing.

6. The method of claim 1 , wherein the corresponding desirable width of the gripping member of the transport vehicle comprises a first width range when the gripping member is open, and a second width range when the gripping member is closed, and the width of the gripping member of the abnormal transport vehicle acquired by the monitor positioned under the rail and disposed between the rail and the transport vehicle is free from within the first width range and the second width range.

7. The method of claim 1 , wherein each of the monitors and the rail are stationary relative to the transport vehicle when the transport vehicle is traveled on the rail.

8. The method of claim 1 , wherein the monitor positioned under the rail is configured to acquire a bottom view of the gripping member from a distance below a bottom of the transport vehicle.

9. The method of claim 1 , wherein the plurality of monitors are positioned to acquire a top view, a bottom view, a left view, and a right view of the transport vehicle.

10. A method for monitoring transport vehicles, the method comprising:

positioning a plurality of monitors nearby a rail in a semiconductor manufacturing factory, wherein at least one of the plurality of monitors is positioned under the rail, and the plurality of monitors are fixed nearby the rail and are separated from the transport vehicles;

collecting a plurality of vehicle patterns of each of the plurality of transport vehicles by scanning surface features of the transport vehicles through the plurality of monitors when the transport vehicles are lifting up an object or lowering the object by each of the monitors disposed between the rail and the transport vehicle when the transport vehicle passes through, wherein each of the transport vehicles comprises:

a gripping member;

a hoisting member configured to lift and lower the object from and to a load port of a semiconductor process machine station by the gripping member; and

a housing surrounding the gripping member and the hoisting member;

analyzing the vehicle patterns of the transport vehicles to generate a remaining lifetime forecast of transport vehicle; and

determining a potential abnormal transport vehicle according to the remaining lifetime forecast of transport vehicle, wherein the determination includes:

identifying a particle source from the vehicle patterns of the transport vehicles, and

identifying the potential abnormal transport vehicle through comparing a width of the gripping member of the transport vehicles from the vehicle patterns acquired by the monitor positioned under the rail and disposed between the rail and the transport vehicle to a corresponding desirable width of the gripping member of the transport vehicles,

wherein the particle source comprises crack or scratch of a surface of the housing, and

wherein the object is held by the gripping member during the collection of the vehicle patterns, and the corresponding desirable width of the gripping member of the transport vehicle comprises a first width range when the gripping member is open, and a second width range when the gripping member is closed, and the width of the gripping member of the abnormal transport vehicle acquired by the monitor positioned under the rail and disposed between the rail and the transport vehicle is out of the first width range and the second width range.

11. The method of claim 10 , further comprising:

moving the potential abnormal transport vehicle out of the rail.

12. The method of claim 11 , further comprising:

collecting a plurality of operating statuses of each of the transport vehicles;

wherein the operating status comprises a total hours of each of the transport vehicles operated on the rail, a total distance of each of the transport vehicles traveled on the rail, an accumulated weight of each of the transport vehicles loaded during an operation period, or a maintenance time of each of the transport vehicles.

13. The method of claim 12 , wherein the remaining lifetime forecast is generated by a correlation between the vehicle patterns and the operating statuses.

14. The method of claim 11 , further comprising:

generating a maintenance schedule according to the remaining lifetime forecast of transport vehicle to replace a potential failure part of the potential abnormal transport vehicle.

15. The method of claim 10 , wherein the potential abnormal transport vehicle comprises a travelling wheel size, a guide wheel size, or the width of the gripping member of the transport vehicle different from a corresponding desirable size of the transport vehicle.

16. A method for transport vehicle maintenance, the method comprising:

receiving a remaining lifetime forecast of transport vehicle transporting in a semiconductor manufacturing factory;

collecting a plurality of operating statuses of a plurality of transport vehicles by scanning the transport vehicles through a plurality of monitors positioned nearby a rail in the semiconductor manufacturing factory when each of the transport vehicles is lifting up an object or lowering the object by the monitors disposed between the rail and the transport vehicle when the transport vehicle passes through, wherein at least one of the monitors is positioned under the rail, and the plurality of monitors are fixed nearby the rail, are separated from the transport vehicles, and are stationary relative to the transport vehicle when the transport vehicle is traveled on the rail, and wherein each of the transport vehicles comprises:

a gripping member;

a hoisting member configured to lift and lower the object from and to a load port of a semiconductor process machine station by the gripping member; and

a housing surrounding the gripping member and the hoisting member; and

determining a potential abnormal transport vehicle from the transport vehicles according to the remaining lifetime forecast of transport vehicle, wherein the determination includes:

identifying a particle source from the potential abnormal transport vehicle, and

identifying the potential abnormal transport vehicle through comparing a width of the gripping member of each of the transport vehicles acquired by the monitor positioned under the rail and disposed between the rail and the transport vehicle to a corresponding desirable width of the gripping member of the transport vehicles;

wherein the operating status comprises a total hours of each of the transport vehicles operated on the rail, a total distance of each of the transport vehicles traveled on the rail, an accumulated weight of each of the transport vehicles loaded during an operation period, or a maintenance time of each of the transport vehicles, and

wherein the particle source comprises crack or scratch of a surface of the housing.

17. The method of claim 16 , wherein the remaining lifetime forecast is generated by:

scanning the transport vehicles by the plurality of monitors to acquire a plurality of vehicle patterns of each of the transport vehicles; and

analyzing the vehicle patterns of the transport vehicles to generate the remaining lifetime forecast of transport vehicle.

18. The method of claim 17 , further comprising:

updating the remaining lifetime forecast of transport vehicle by scanning the transport vehicles and analyzing the vehicle patterns of the transport vehicles repeatedly.

19. The method of claim 16 , wherein the remaining lifetime forecast of transport vehicle comprises a plurality of remaining lifetimes corresponding to each of a plurality of parts of the transport vehicle.

20. The method of claim 16 , wherein the transport vehicles are operating on the rail when the potential abnormal transport vehicle is identified, and the potential abnormal transport vehicle is moved out from the rail after being identified.