IP Library › Granted Patent US 12,055,730
Granted Patent B2
US 12,055,730 · App. 18/135,585 · Granted Aug 6, 2024

Image sensor including color separating lens array and electronic apparatus including the image sensor

Inventors: Hongkyu Park (Yongin-si, KR); Seokho Yun (Seoul, KR); Minwoo Lim (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G02B3/0006G02B1/115H04N23/60H04N25/11
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Quick Facts
Patent No.
US 12,055,730
App. No.
18/135,585
Granted
Aug 6, 2024
Kind
B2
Abstract

Provided is an image sensor including a color separating lens array. The image sensor includes: a sensor substrate including a first pixel configured to sense light of a first wavelength and a second pixel configured to sense light of a second wavelength; a transparent spacer layer on the sensor substrate; and a color separating lens array on the spacer layer, wherein the color separating lens array condenses the light of the first wavelength toward the first pixel, and includes a first lens layer on the spacer layer, a second lens layer on the first lens layer, and an etch prevention layer between the first lens layer and the second lens layer.

Claims (21)

1. A method of manufacturing an image sensor, the method comprising:

forming a spacer layer on a sensor substrate, the sensor substrate including a first pixel, configured to sense light of a first wavelength, and a second pixel configured to sense light of a second wavelength;

forming a first lens layer on the spacer layer;

forming a first etch prevention layer on the first lens layer;

forming a first dielectric layer on the first etch prevention layer;

forming an engraved pattern in the first dielectric layer; and

forming a second lens layer by filling a first high-refractive material in the engraved pattern.

2. The method of claim 1 , wherein the first etch prevention layer has a thickness of about 3 nm to about 30 nm.

3. The method of claim 1 , wherein the first etch prevention layer has a thickness of about 5 nm to about 15 nm.

4. The method of claim 1 , wherein the first etch prevention layer includes HfO 2 .

5. The method of claim 1 , wherein the forming of the first lens layer comprises:

forming a second etch prevention layer on the spacer layer;

forming a second dielectric layer on the first etch prevention layer;

forming an engraved pattern in the second dielectric layer; and

filling a second high-refractive material in the engraved pattern in the second dielectric layer.

6. The method of claim 1 , further comprising forming an anti-reflection layer on the second lens layer.

7. The method of claim 6 , wherein the anti-reflection layer includes a SiO 2 layer.

8. The method of claim 6 , wherein the anti-reflection layer has a thickness of about 80 nm to about 120 nm.

9. The method of claim 6 , wherein the forming of the anti-reflection layer includes forming a first anti-reflection layer, and forming a second anti-reflection layer on the first anti-reflection layer.

10. The method of claim 9 , wherein the first anti-reflection layer includes SiO 2 and the second anti-reflection layer includes Si 3 N 4 .

11. The method of claim 9 , wherein the first anti-reflection layer has a thickness of about 80 nm to about 120 nm and the second anti-reflection layer has a thickness of about 20 nm to about 60 nm.

Priority Claims (2)
KR 10-2020-0143875 · Oct 30, 2020 · national
KR 10-2021-0083125 · Jun 25, 2021 · national
Continuity (2)
Division 17514780 · Oct 29, 2021
Related Publication 20230251403A1 · Aug 10, 2023