IP Library › Granted Patent US 12,083,361
Granted Patent B2
US 12,083,361 · App. 17/411,832 · Granted Sep 10, 2024

Systems, devices, and methods for unified modular beam diagnostics

Inventors: Konstantin Pirogov (Foothill Ranch, CA); Andrey A. Korepanov (Foothill Ranch, CA); Alexander Dunaevsky (Corona, CA)
Assignee: TAE TECHNOLOGIES, INC.
A61N5/1048A61N5/1067A61N5/1075A61N5/1078G01T1/29G21K5/00A61N2005/1074A61N2005/1087A61N2005/1089A61N2005/109
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Quick Facts
Patent No.
US 12,083,361
App. No.
17/411,832
Granted
Sep 10, 2024
Kind
B2
Abstract

Embodiments of systems, devices, and methods relate to a modular diagnostics interface system. An example modular diagnostics interface system includes one or more insertable measurement boards configured to communicably couple with a backplane of a modular measurement rack, and configured to collect a measured current from a component of a beamline.

Claims (32)

1. A modular diagnostics interface system, comprising:

a rack comprising a backplane; and

one or more insertable modules, each insertable module configured to communicably couple with the backplane of the rack and comprising at least one cross communication module configured to route a signal from a first communication port to a second communication port, wherein at least one insertable module of the one or more insertable modules is configured to collect a measured current from a component of a beam system when the at least one insertable module is communicably coupled with the component.

2. The modular diagnostics interface system of claim 1 , wherein the rack comprises a plurality of slots, wherein each slot of the plurality of slots is configured to receive an insertable module of the one or more insertable modules.

3. The modular diagnostics interface system of claim 1 , wherein the backplane routes signals from the one or more insertable modules to the at least one cross communication module.

4. The modular diagnostics interface system of claim 1 , wherein at least one of the one or more insertable modules is a single channel measurement board.

5. The modular diagnostics interface system of claim 4 , wherein the single channel measurement board comprises a shunt resistor, a first power supply, and a differential amplifier for measuring a differential voltage drop experienced across the shunt resistor electrically coupled between the first power supply and a measured signal from the component of the beam system.

6. The modular diagnostics interface system of claim 1 , wherein at least one of the one or more insertable modules is a multiple channel measurement board.

7. The modular diagnostics interface system of claim 6 , wherein the multiple channel measurement board comprises a plurality of shunt resistors, a first power supply, and a plurality of differential amplifiers for measuring a plurality of differential voltage drops experienced across the plurality of shunt resistors, wherein each shunt resistor of the plurality of shunt resistors is electrically coupled between the first power supply and a measured signal of a plurality of measured signals from the component of the beam system.

8. The modular diagnostics interface system of claim 6 , wherein the multiple channel measurement board comprises one of two or four channels.

9. The modular diagnostics interface system of claim 1 , wherein at least one of the one or more insertable modules comprises one or more programmable gain amplifiers.

10. The modular diagnostics interface system of claim 9 , wherein the one or more programmable gain amplifiers are manually controllable or remotely controllable.

11. The modular diagnostics interface system of claim 10 , further comprising one or more additional cross connection modules, wherein a cross connection module of the one or more additional cross connection modules comprises one or more switches configured to set manual control or remote control of the one or more programmable gain amplifiers.

12. The modular diagnostics interface system of claim 9 , wherein a programmable gain amplifier of the one or more programmable gain amplifiers is configured to operate with one of a plurality of gain settings.

13. The modular diagnostics interface system of claim 12 , wherein the plurality of gain settings comprise at least two values between 1 V/V and 500 V/V.

14. The modular diagnostics interface system of claim 1 , wherein the component of the beam system comprises one or more of a beam position monitor, an aperture, a water cooled aperture, a faraday cup, an XY beam profiler, or a beam dump.

15. The modular diagnostics interface system of claim 1 , wherein at least one of the one or more insertable modules is configured to be biased using a biasing voltage of one of positive polarity or negative polarity.

16. The modular diagnostics interface system of claim 1 , wherein at least one of the one or more insertable modules is configured to be biased using a biasing voltage serving as one of a current source or a current sink for the measured current.

17. The modular diagnostics interface system of claim 1 , wherein an insertable module of the one or more insertable modules comprises a power supply module configured for an external biasing based on an external biasing power supply that is external to the rack.

18. The modular diagnostics interface system of claim 17 , wherein the external biasing power supply provides a range of voltage of up to 1000 V.

19. The modular diagnostics interface system of claim 1 , further comprising communications circuitry configured to provide the collected measured current collected from the component of the beam system to a digital acquisition system.

20. The modular diagnostics interface system of claim 19 , wherein the digital acquisition system is external to the rack.

21. The modular diagnostics interface system of claim 1 , wherein at least one of the one or more insertable modules comprises a front panel having a user interface.

22. The modular diagnostics interface system of claim 21 , wherein the user interface comprises at least one indicator and at least one port.

23. The modular diagnostics interface system of claim 1 , further comprising a multi-shelf rack, and wherein the rack is a sub rack of the multi-shelf rack.

24. The modular diagnostics interface system of claim 1 , further comprising one or more connections comprising one or more of galvanic isolations to prevent ground loops or shielding to reduce an electromagnetic noise, wherein the measured current collected from the component of the beam system is provided to a digital acquisition system via the one or more connections.

25. The modular diagnostics interface system of claim 1 , further comprising:

the component of the beam system.

26. A beam system, comprising:

the modular diagnostics interface system according to claim 1 positioned along the beam system;

a digital acquisition system communicably coupled to the modular diagnostics interface system; and

a control system configured to receive one or more signals from the digital acquisition system.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2022
From: PIROGOV, KONSTANTIN; KOREPANOV, ANDREY A.; DUNAEVSKY, ALEXANDER
To: TAE TECHNOLOGIES, INC.
Reel/Frame 059024/0701 →
Continuity (2)
Provisional Application 63070702 · Aug 26, 2020
Related Publication 20220062657A1 · Mar 3, 2022
Cited By (1)
US 12,447,359