Techniques for correcting oversaturated pixels in shutterless FIR cameras

1. A method for correcting oversaturated pixels in far-infrared (FIR) images captured by a shutterless FIR camera, comprising:

capturing thermal images by a FIR sensor in the shutterless FIR camera;

processing the thermal images, by the shutterless FIR camera to determine pixel value and at least a shutterless sunburn correction, wherein the shutterless sunburn correction removes oversaturated pixels based on pixel-by-pixel analysis of the thermal image; and

sending the processed thermal images to an output device.

2. The method of claim 1 , further comprising:

performing a pixel value analysis to determine an exposure value of each pixel in the thermal image, wherein the exposure values are determined based on a captured resistance value of each pixel;

identifying oversaturated pixels, wherein an oversaturated pixel has an exposure value that exceeds a predetermined threshold value for any of: a predetermined time period and a predetermined video frame;

identifying oversaturated pixels based on neighboring pixels, wherein the oversaturated pixel has exposure value not exceeding the predetermined threshold value and the neighboring pixels has exposure value that exceeds the predetermined threshold;

creating an oversaturated pixel mask, wherein the oversaturated pixel mask includes the identified oversaturated pixels and excludes pixels not identified as oversaturated pixels; and

correcting the oversaturated pixels of the thermal image base on the oversaturated pixel mask by scene-based nonuniformity correction (SBNC).

3. The method of claim 2 , further comprising:

adjusting to a lower predetermined threshold to identify residual non-uniformity in the thermal image and for faster correction;

comparing the oversaturated pixels with the neighboring pixels that are not designated as oversaturated pixels in the thermal image, wherein the neighboring pixels surround the oversaturated pixel;

monitoring correction polarity, wherein change in the correction polarity indicate conclusion of the oversaturated pixel correction; and

returning to the predetermined threshold used to determine oversaturation of pixels in the thermal image.

4. The method of claim 1 , wherein the oversaturated pixel mask is saved in a memory and a storage.

5. The method of claim 4 , further comprising:

deleting the oversaturated pixel mask from the memory when the oversaturated pixel is below a predetermined threshold value, wherein the predetermined threshold value indicates correction of the thermal image.

6. A non-transitory computer readable medium having stored thereon instructions for causing a processing circuitry to perform a process, the process comprising:

capturing thermal images by a FIR sensor in the shutterless FIR camera;

processing the thermal images, by the shutterless FIR camera to determine pixel value and at least a shutterless sunburn correction, wherein the shutterless sunburn correction removes oversaturated pixels based on pixel-by-pixel analysis of the thermal image; and

sending the processed thermal images to an output device.

7. A system for correcting oversaturated pixels in far-infrared (FIR) images captured by a shutterless FIR camera, comprising:

a processing circuitry; and

a memory, the memory containing instructions that, when executed by the processing circuitry, configure the system to:

capture thermal images by a FIR sensor in the shutterless FIR camera;

process the thermal images, by the shutterless FIR camera to determine pixel value and at least a shutterless sunburn correction, wherein the shutterless sunburn correction removes oversaturated pixels based on pixel-by-pixel analysis of the thermal image; and

send the processed thermal images to an output device.

8. The system of claim 7 , wherein the system is further configured to:

perform a pixel value analysis to determine an exposure value of each pixel in the thermal image, wherein the exposure values are determined based on a captured resistance value of each pixel;

identify oversaturated pixels, wherein an oversaturated pixel has an exposure value that exceeds a predetermined threshold value for any of: a predetermined time period and a predetermined video frame;

identify oversaturated pixels based on neighboring pixels, wherein the oversaturated pixel has exposure value not exceeding the predetermined threshold value and the neighboring pixels has exposure value that exceeds the predetermined threshold;

create an oversaturated pixel mask, wherein the oversaturated pixel mask includes the identified oversaturated pixels and excludes pixels not identified as oversaturated pixels; and

correct the oversaturated pixels of the thermal image base on the oversaturated pixel mask by scene-based nonuniformity correction (SBNC).

9. The system of claim 8 , wherein the system is further configured to:

adjust to a lower predetermined threshold to identify residual non-uniformity in the thermal image and for faster correction;

compare the oversaturated pixels with the neighboring pixels that are not designated as oversaturated pixels in the thermal image, wherein the neighboring pixels surround the oversaturated pixel;

monitor correction polarity, wherein change in the correction polarity indicate conclusion of the oversaturated pixel correction; and

return to the predetermined threshold used to determine oversaturation of pixels in the thermal image.

10. The system of claim 7 , wherein the oversaturated pixel mask is saved in a memory and a storage.

11. The system of claim 10 , wherein the system is further configured to:

delete the oversaturated pixel mask from the memory when the oversaturated pixel is below a predetermined threshold value, wherein the predetermined threshold value indicates correction of the thermal image.