Semiconductor packages

1. A semiconductor package, comprising:

an interposer;

a die, bonded to the interposer, the die having a protective layer thereon, wherein the protective layer and the interposer are disposed on opposite sides of the die;

a first encapsulant, disposed aside the die and the protective layer; and

at least one through via in the first encapsulant, wherein a surface of the at least one through via is substantially coplanar with a surface of the protective layer.

2. The semiconductor package according to claim 1 , wherein a surface of the first encapsulant is substantially coplanar with the surface of the protective layer.

3. The semiconductor package according to claim 1 , wherein the protective layer is protruded from the first encapsulant.

4. The semiconductor package according to claim 1 , wherein the at least one through via comprises a plurality of through vias surrounding the die.

5. The semiconductor package according to claim 1 , wherein a material of the protective layer is different from a material of the first encapsulant.

6. The semiconductor package according to claim 1 , further comprising at least one surface mount device, wherein the at least one surface mount device is disposed opposite to the die with respect to the interposer.

7. The semiconductor package according to claim 1 , wherein a sidewall of the protective layer is substantially flush with an outer sidewall of the die.

8. A semiconductor package, comprising:

an interposer;

a die, bonded to the interposer, the die having a protective layer thereon;

a redistribution layer structure, wherein the die is disposed between and electrically connected to the interposer and the redistribution layer structure; and

a first encapsulant, encapsulating the die, wherein a surface of the protective layer is substantially coplanar with a surface of the redistribution layer structure.

9. The semiconductor package according to claim 8 , wherein the protective layer is disposed between the die and the redistribution layer structure, and the protective layer is physically separated from the redistribution layer structure by a vertical gap.

10. The semiconductor package according to claim 8 , further comprising at least one through via in the first encapsulant, wherein a surface of the at least one through via is substantially coplanar with the surfaces of the protective layer and the redistribution layer structure.

11. The semiconductor package according to claim 10 , wherein the at least one through via is physically separated from the protective layer by a horizontal gap.

12. The semiconductor package according to claim 8 , further comprising at least one surface mount device, wherein the at least one surface mount device is encapsulated by a second encapsulant.

13. The semiconductor package according to claim 8 , wherein the first encapsulant is physically separated from the redistribution layer structure by a vertical gap.

14. The semiconductor package according to claim 8 , wherein the surface of the protective layer is disposed at a height between a surface of the first encapsulant and a recessed surface of the redistribution layer structure.

15. A semiconductor package, comprising:

a die, having a protective layer thereon;

a plurality of through vias, surrounding the die;

a redistribution layer structure, wherein the die is electrically connected to the redistribution layer structure through at least one of the through vias; and

a first encapsulant, encapsulating the die and the through vias, wherein the through vias are protruded from the first encapsulant, and a surface of the first encapsulant and a first surface of the redistribution layer structure facing the surface of the first encapsulant are physically separated by a first gap therebetween.

16. The semiconductor package according to claim 15 , wherein the protective layer faces the redistribution layer structure.

17. The semiconductor package according to claim 8 , further comprising a second encapsulant, disposed opposite to the first encapsulant with respect to the interposer, wherein a sidewall of the first encapsulant is substantially flush with a sidewall of the second encapsulant.

18. The semiconductor package according to claim 15 , wherein the through vias are in direct contact with the first surface the redistribution layer structure, and a second gap is formed between the protective layer and a second surface lower than the first surface of the redistribution layer structure.

19. The semiconductor package according to claim 15 , wherein the protective layer is protruded from the first encapsulant encapsulating.

20. The semiconductor package according to claim 15 , wherein a portion of a sidewall of the through via is physically separated from the first encapsulant.