IP Library › Granted Patent US 12,111,153
Granted Patent B2
US 12,111,153 · App. 17/344,295 · Granted Oct 8, 2024

Angle sensor

Inventors: Yannick Vuillermet (Voglans, FR); Andreas P. Friedrich (Metz-Tessy, FR)
Assignee: Allegro MicroSystems, LLC
G01B7/30G01R33/0047G01R33/072G01R33/091
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Quick Facts
Patent No.
US 12,111,153
App. No.
17/344,295
Granted
Oct 8, 2024
Kind
B2
Abstract

Methods and apparatus for prosing a sensor IC package having first and second sets of magnetic field sensing elements and a third set of magnetic field sensing elements located between the first and second positions, wherein the first, second, and third sets of magnetic field sensing elements have a first axis of sensitivity and a second axis of sensitivity, wherein the first and second axes of sensitivity are orthogonal. The sensor IC package is positioned in relation to a target comprising a two-pole magnet and the first and second axes of sensitivity are perpendicular to an axis about which the target rotates. Differential signals are processed to determine an absolute position of the target. A first secondary angle position is generated from the first and third sets of magnetic field sensing elements.

Claims (38)

1. A method, comprising:

employing in a sensor IC package a first set of magnetic field sensing elements located at a first position and, a second set of magnetic field sensing elements located at a second position, and a third set of magnetic field sensing elements located at a third position, wherein the first, second, and third sets of magnetic field sensing elements each have a first magnetic field sensing element, not shared with any other of the first, second or third sets, with a first axis of sensitivity and a second magnetic field sensing element, not shared with any other of the first, second or third sets, with a second axis of sensitivity, wherein the first and second axes of sensitivity are orthogonal, and wherein the first, second, and third sets of magnetic field sensing elements are aligned and spaced apart from each other on a common line, wherein the sensor IC package is positioned in relation to a target comprising a two-pole magnet, and wherein the first and second axes of sensitivity and the common line are perpendicular to an axis about which the target rotates;

processing a first differential signal comprising signals for the first axis of sensitivity from the first and second sets of magnetic field sensing elements and a second differential signal comprising signals for the second axis of sensitivity from the first and second sets of magnetic field sensing elements to determine an absolute position of the target, said processing including performing offset and gain correction on the first and second differential signals;

generating a first secondary angle position from the first and third sets of magnetic field sensing elements;

comparing a difference between the absolute position of the target and the first secondary angle position to a first threshold; and

identifying a fault in the sensor IC package based on said comparison.

2. The method according to claim 1 , wherein the target comprises a shaft.

3. The method according to claim 1 , further including determining the absolute position of the target within a quadrant from positive or negative signs of the first and second differential signals.

4. The method according to claim 3 , wherein the quadrant of the target is determined without arctangent processing of the first and second differential signals for low power operation.

5. The method according to claim 1 , wherein the third set of magnetic field sensing elements is located halfway between the first and second sets of magnetic field sensing elements.

6. The method according to claim 1 , wherein the processing of the first and second differential signals includes arctangent processing.

7. The method according to claim 1 , wherein the target comprises a ring magnet.

8. The method according to claim 1 , wherein the target comprises a cylindrical magnet.

9. The method according to claim 1 , wherein the first set of magnetic field sensing elements comprises a left side set of magnetic field sensing elements, the second set of magnetic field sensing elements comprises a right side set magnetic field sensing elements, and the third set of magnetic field sensing elements comprises an in between set of magnetic field sensing elements.

10. The method according to claim 1 , further comprising generating a second secondary angle position from the second and third sets of magnetic field sensing elements.

11. A sensor, comprising:

a sensor IC package having a first set of magnetic field sensing elements located at a first position and a second set of magnetic field sensing elements located at a second position, and a third set of magnetic field sensing elements located at a third position between the first and second positions, wherein the first, second, and third sets of magnetic field sensing elements each have a first magnetic field sensing element, not shared with any other of the first, second or third sets, with a first axis of sensitivity and a second magnetic field sensing element, not shared with any other of the first, second or third sets, with a second axis of sensitivity, wherein the first and second axes of sensitivity are orthogonal, and wherein the first, second, and third sets of magnetic field sensing elements are aligned and spaced apart from each other on a common line,

wherein the sensor IC package is configured to:

process a first differential signal comprising signals for the first axis of sensitivity from the first and second sets of magnetic field sensing elements and a second differential signal comprising signals for the second axis of sensitivity from the first and second sets of magnetic field sensing elements to determine an absolute position of a target comprising a two-pole magnet, wherein the first and second axes of sensitivity and the common line are perpendicular to an axis about which the target rotates, said processing including performing offset and gain correction on the first and second differential signals;

generate a first secondary angle position from the first and third sets of magnetic field sensing elements;

compare a difference between the absolute position of the target and the first secondary angle position to a first threshold; and

identify a fault in the sensor IC package based on said comparison.

12. The sensor according to claim 11 , wherein the absolute position of the target is determined within a quadrant from positive or negative signs of the first and second differential signals.

13. The sensor according to claim 12 , wherein the quadrant of the target is determined without arctangent processing of the first and second differential signals for low power operation.

14. The sensor according to claim 11 , wherein the third set of magnetic field sensing elements is located halfway between the first and second sets of magnetic field sensing elements.

15. The sensor according to claim 11 , wherein the processing of the first and second differential signals includes arctangent processing.

16. The sensor of claim 11 , wherein the sensor IC package is further configured to generate a second secondary angle position from the second and third sets of magnetic field sensing elements.

17. A sensor, comprising:

a sensor IC package having a first magnetic field sensing means located at a first position and a second magnetic field sensing means located at a second position, and a third magnetic field sensing means located at a third position between the first and second positions, wherein the first, second, and third magnetic field sensing means each have a first magnetic field sensing element, not shared with any other of the first, second or third sets, with a first axis of sensitivity and a second magnetic field sensing element, not shared with any other of the first, second or third sets, with a second axis of sensitivity, wherein the first and second axes of sensitivity are orthogonal, and

wherein the first, second, and third magnetic field sensing means are aligned on a common line,

wherein the sensor IC package is configured to:

process a first differential signal comprising signals for the first axis of sensitivity from the first and second magnetic field sensing means and a second differential signal comprising signals for the second axis of sensitivity from the first and second magnetic field sensing means to determine an absolute position of the target comprising a two-pole magnet, wherein the first and second axes of sensitivity and the common line are perpendicular to an axis about which the target rotates, said processing including performing offset and gain correction on the first and second differential signals;

generate a first secondary angle position from the first and third magnetic field sensing means;

compare a difference between the absolute position of the target and the first secondary angle position to a first threshold; and

identify a fault in the sensor IC package based on said comparison.

18. The sensor according to claim 17 , wherein the absolute position of the target is determined within a quadrant from positive or negative signs of the first and second differential signals.

19. The sensor according to claim 18 , wherein the quadrant of the target is determined without arctangent processing of the first and second differential signals for low power operation.

20. The sensor of claim 17 , wherein the sensor IC package is further configured to generate a second secondary angle position from the second and third sets of magnetic field sensing elements.

Assignments (3)
PATENT SECURITY AGREEMENT Recorded Jun 22, 2023
From: ALLEGRO MICROSYSTEMS, LLC
To: MORGAN STANLEY SENIOR FUNDING, INC., AS THE COLLATERAL AGENT
Reel/Frame 064068/0459 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 4TH INVENTOR'S NAME PREVIOUSLY RECORDED AT REEL: 56541 FRAME: 0067. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Oct 8, 2021
From: VUILLERMET, YANNICK; FRIEDRICH, ANDREAS P.; ALLEGRO MICROSYSTEMS FRANCE SAS; ALLEGRO MICROSYSTEMS EUROPE LIMITED
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 057895/0671 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2021
From: VUILLERMET, YANNICK; FRIEDRICH, ANDREAS P.; ALLEGRO MICROSYSTEMS FRANCE SAS; ALLEGRO MICROSYSTEMS EUROPE SAS
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 056541/0067 →
Continuity (1)
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