Test apparatus, test method, and computer-readable storage medium
A test apparatus includes: an electrical connection unit to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; a measuring unit for measuring a photoelectric signal obtained by photoelectrically converting light irradiated by the light source unit and output via the electrical connection unit by each light emitting device; an acquisition unit for acquiring a correction map including a correction value for correcting a variation in intensity of light with which a position of each light emitting device is irradiated by the light source unit; and a determination unit for determining a quality of each light emitting device on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit.
1. A test apparatus comprising:
an electrical connection unit configured to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested;
a light source unit configured to collectively irradiate the plurality of light emitting devices with light;
a measuring unit configured to measure a photoelectric signal which is obtained by photoelectrically converting the light irradiated by the light source unit and output via the electrical connection unit by each of the plurality of light emitting devices;
an acquisition unit configured to acquire a correction map including a correction value for correcting a variation in intensity of light with which a position of each of the plurality of light emitting devices is irradiated by the light source unit; and
a determination unit configured to determine a quality of each of the plurality of light emitting devices on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit;
a second measuring unit configured to measure an intensity of light with which a position of each of the plurality of light emitting devices is irradiated by the light source unit; and
a generation unit configured to generate the correction map on a basis of a second measurement result by the second measuring unit.
2. The test apparatus according to claim 1 , wherein
the determination unit is configured to:
correct a measurement value of the photoelectric signal measured for each of the plurality of light emitting devices by the measuring unit using the correction value for the position of each of the plurality of light emitting devices in the correction map, and
determine the quality of each of the plurality of light emitting devices on a basis of the measurement value of the photoelectric signal that has been corrected.
3. The test apparatus according to claim 1 , wherein
the determination unit is configured to determine at least one light emitting device in which a correction value obtained by correcting the measured photoelectric signal by the correction map is out of a normal range among the plurality of light emitting devices as defective.
4. The test apparatus according to claim 3 , wherein
the determination unit is configured to use, as the normal range, a range based on a statistic corresponding to a correction value obtained by correcting the photoelectric signal output by each of the plurality of light emitting devices by the correction map.
5. The test apparatus according to claim 3 , wherein
the determination unit is configured to use, as the normal range, a range based on a statistic corresponding to a correction value obtained by correcting the photoelectric signals output by the light emitting devices disposed at a same position among sets of the plurality of light emitting devices by the correction map in measurement results obtained by performing a plurality of measurements by the measuring unit while sequentially changing the set of the plurality of light emitting devices to be tested from a light emitting device group.
6. The test apparatus according to claim 1 , wherein
the second measuring unit includes a same number of sensors as the plurality of light emitting devices, and
each of the plurality of sensors is disposed at a same position as the position of each of the plurality of light emitting devices.
7. The test apparatus according to claim 6 , further comprising:
a calibration unit configured to calibrate measurement values by the plurality of sensors of the second measuring unit by a surface light source of which uniformity has been calibrated.
8. The test apparatus according to claim 1 , wherein
the second measuring unit includes a two-dimensional luminance meter for collectively measuring an intensity of light with which the position of each of the plurality of light emitting devices is irradiated.
9. The test apparatus according to claim 1 , further comprising:
a generation unit configured to generate the correction map on a basis of an average value of the photoelectric signals output by the light emitting devices disposed at a same position among sets of the plurality of light emitting devices in measurement results obtained by performing a plurality of measurements by the measuring unit while sequentially changing the set of the plurality of light emitting devices to be tested from the light emitting device group.
10. The test apparatus according to claim 1 , further comprising:
a temperature control unit configured to suppress temperature rise of the plurality of light emitting devices due to irradiation with the light.
11. The test apparatus according to claim 10 , wherein
the temperature control unit includes an air blowing mechanism that blows air toward the plurality of light emitting devices, the test apparatus further comprising:
a static electricity removing unit configured to prevent the plurality of light emitting devices from being charged with static electricity when air is blown by the air blowing mechanism.
12. A test apparatus comprising:
an electrical connection unit configured to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested;
a light source unit configured to collectively irradiate the plurality of light emitting devices with light;
a measuring unit configured to measure a photoelectric signal which is obtained by photoelectrically converting the light irradiated by the light source unit and output via the electrical connection unit by each of the plurality of light emitting devices;
an acquisition unit configured to acquire a correction map including a correction value for correcting a variation in intensity of light with which a position of each of the plurality of light emitting devices is irradiated by the light source unit; and
a determination unit configured to determine a quality of each of the plurality of light emitting devices on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit, and further comprising:
a second measuring unit configured to measure an intensity of light with which positions of several light emitting devices are irradiated, which is a part of the light with which the position of each of the plurality of light emitting devices is irradiated by the light source unit; and
a generation unit configured to interpolate an intensity of light with which positions of rest of the light emitting devices are irradiated other than the several light emitting devices, among the plurality of light emitting devices on a basis of a second measurement result by the second measuring unit, and to generate the correction map.
13. The test apparatus according to claim 12 , wherein
the second measuring unit includes a smaller number of sensors than the plurality of light emitting devices,
each of the plurality of sensors is disposed at a position of the several light emitting devices, and
the plurality of sensors are separated from each other by a predetermined interval.
14. The test apparatus according to claim 12 , wherein
the second measuring unit includes a two-dimensional luminance meter for collectively measuring an intensity of light with which positions of the several light emitting devices are irradiated, and
a number of pixels of the two-dimensional luminance meter is smaller than a number of pixels of another two-dimensional luminance meter for collectively measuring an intensity of light with which a position of each of the plurality of light emitting devices is irradiated.
15. A test apparatus comprising:
an electrical connection unit configured to be electrically connected to a terminal of each of a plurality of light emitting devices to be tested;
a light source unit configured to collectively irradiate the plurality of light emitting devices with light;
a measuring unit configured to measure a photoelectric signal which is obtained by photoelectrically converting the light irradiated by the light source unit and output via the electrical connection unit by each of the plurality of light emitting devices;
an acquisition unit configured to acquire a correction map including a correction value for correcting a variation in intensity of light with which a position of each of the plurality of light emitting devices is irradiated by the light source unit; and
a determination unit configured to determine a quality of each of the plurality of light emitting devices on a basis of a measurement result by the measuring unit and the correction map acquired by the acquisition unit, and further comprising:
a second measuring unit configured to sequentially measure an intensity of light with which a position of each of the plurality of light emitting devices is irradiated by the light source unit by sequentially moving the position of each of the plurality of light emitting devices; and
a generation unit configured to generate the correction map on a basis of a second measurement result by the second measuring unit.