X-ray fluorescence analyzer

1. An X-ray fluorescence analyzer comprising:

an analyzing crystal configured to spectrally disperse X-ray fluorescence emitted from a sample;

an X-ray detector configured to detect the X-ray fluorescence spectrally dispersed by the analyzing crystal;

a warm air generator configured to generate warm air to maintain a temperature of the analyzing crystal at a target temperature; and

a Peltier element configured to cool the X-ray detector such that a temperature of the X-ray detector is set to a temperature lower than the target temperature,

wherein the Peltier element includes:

a heat absorption portion configured to absorb heat of the X-ray detector to cool the X-ray detector; and

a heat dissipation portion configured to dissipate heat of the heat absorption portion to an outside, the heat dissipation portion being provided on a side farther from the X-ray detector than the heat absorption portion,

wherein the X-ray fluorescence analyzer further comprises a heat sink in contact with the heat dissipation portion of the Peltier element, and

wherein the warm air generator is arranged such that the warm air sent from the warm air generator is brought into contact with the heat sink.

2. The X-ray fluorescence analyzer as recited in claim 1 ,

wherein the analyzing crystal, the X-ray detector, the warm air generator, and the Peltier element are provided inside an analysis chamber covered with a housing.

3. The X-ray fluorescence analyzer as recited in claim 1 , further comprising:

a temperature sensor arranged at a position closer to the analyzing crystal than the Peltier element; and

a controller configured to control the warm air generator such that the temperature detected by the temperature sensor is maintained at the target temperature.