Resonance device and manufacturing method
A method of manufacturing a resonance device includes preparing a resonance device and adjusting a frequency of the resonator. The resonance device includes a lower lid, an upper lid joined to the lower lid, and a resonator with vibration arms that vibrate in bending vibration in an interior space between the lower and upper lids. The adjusting of the frequency of the resonator includes vibrating the vibration arms in bending vibration and thereby causing respective ends of the arms to strike the lower lid at an impact speed of 3.5×10 3 μm/sec or more. The ends of the vibration arms are made of silicon oxide, and the lower lid is made of silicon.
1. A method of manufacturing a resonance device, the method comprising:
preparing a resonance device that includes:
a lower lid formed of silicon,
an upper lid joined to the lower lid, and
a resonator having at least one vibration arm that includes an end formed of silicon oxide and that is configured to vibrate in bending vibration in an interior space formed between the lower lid and the upper lid; and
adjusting a frequency of the resonator by vibrating the at least one vibration arm in bending vibration to cause the end of the at least one vibration arm to strike the lower lid at an impact speed of 3.5×10 3 μm/sec or more.
2. The method of manufacturing the resonance device according to claim 1 , wherein the adjusting of the frequency comprises vibrating the at least one vibration arm to cause the end to strike the lower lid at an impact speed of 4.5×10 3 μm/sec or more.
3. The method of manufacturing the resonance device according to claim 1 , wherein preparing the resonance device comprises forming a gap width G 1 between the end of the at least one vibration arm and the lower lid and a length L 1 of the at least one vibration arm, such that 0.11<G 1 /L 1 .
4. The method of manufacturing the resonance device according to claim 1 , wherein preparing the resonance device comprises forming a gap width G 1 between the end of the at least one vibration arm and the lower lid and a length L 1 of the at least one vibration arm, such that G 1 /L 1 <0.16.
5. The method of manufacturing the resonance device according to claim 1 , wherein preparing the resonance device comprises forming a gap width G 1 between the end of the at least one vibration arm and the lower lid and a gap width G 2 between the end of the at least one vibration arm and the upper lid, such that G 1 <G 2 .
6. The method of manufacturing the resonance device according to claim 1 , further comprising forming a metal film on a surface of the end of the at least one vibration arm that faces the upper lid.
7. The method of manufacturing the resonance device according to claim 1 , wherein preparing the resonance device comprises forming the resonator to have a base with the at least one vibration arm extending therefrom, and wherein the end of the at least one vibration arm has a width greater than a width of an arm portion that connects the end to the base.
8. The method of manufacturing the resonance device according to claim 7 , wherein preparing the resonance device comprises forming the end of the at least one vibration arm to have a substantially rectangular shape with four rounded corners.
9. The method of manufacturing the resonance device according to claim 1 , wherein preparing the resonance device comprises forming the resonator, the upper lid and the lower lid of a substrate other than a silicon substrate.
10. The method of manufacturing the resonance device according to claim 1 , further comprising forming excitation electrodes on the resonator.
11. The method of manufacturing the resonance device according to claim 10 , wherein the adjusting of the frequency of the resonator comprises applying a voltage to the excitation electrodes to cause the bending vibration of the at least one vibration arm.
12. The method of manufacturing the resonance device according to claim 11 , wherein the adjusting of the frequency comprises applying the voltage that is greater than a voltage required for normal operation of the resonance device.
13. The method of manufacturing the resonance device according to claim 11 , wherein the adjusting of the frequency comprises adjusting the voltage applied to the excitation electrodes to change an amplitude of the bending vibration.
14. The method of manufacturing the resonance device according to claim 6 , wherein the adjusting of the frequency comprises trimming a portion of the metal film on the surface of the end of the at least one vibration arm.
15. The method of manufacturing the resonance device according to claim 3 , wherein a maximum amplitude of vibration of the at least one vibration arm is equal to the gap width G 1 .
16. The method of manufacturing the resonance device according to claim 1 , wherein the adjusting of the frequency of the resonator comprises abrading the end of the at least one vibration arm to have an inclined or circular shape.
17. A method of manufacturing a resonance device, the method comprising:
preparing a resonance device that includes:
a lower lid,
an upper lid joined to the lower lid, and
a resonator that has at least one vibration arm configured to vibrate in bending vibration in an interior space formed between the lower lid and the upper lid; and
adjusting a frequency of the resonator by vibrating the at least one vibration arm in bending vibration to cause the at least one vibration arm to strike the lower lid so as to produce dust of the lower lid and dust of the at least one vibration arm,
wherein a portion of the lower lid that a portion of the at least one vibration arm strikes has a breaking stress that is lower than a breaking stress of the portion of the at least one vibration arm that strikes the portion of the lower lid, and
wherein, in the interior space, a volume of the dust derived from the lower lid is 2.5 times or less of a volume of the dust derived from the vibration arm.
18. A resonance device comprising:
a lower lid;
an upper lid coupled to the lower lid; and
a resonator that has at least one vibration arm that includes an end and that is configured to vibrate in bending vibration in an interior space between the lower lid and the upper lid,
wherein a portion of the lower lid that the end of the at least one vibration arm strikes during the bending vibration has a breaking stress that is smaller than a breaking stress of the end of the at least one vibration arm, and
wherein, in the interior space, a volume of dust derived from the lower lid is 2.5 times or less than a volume of dust derived from the at least one vibration arm when the end of the at least one vibration arm strikes the lower lid.
19. The resonance device according to claim 18 , wherein, in the interior space, the volume of dust derived from the lower lid is equal to or smaller than the volume of dust derived from the at least one vibration arm.
20. The resonance device according to claim 18 , wherein:
the portion of the lower lid that the end of the at least one vibration arm strikes is silicon, and
the end of the at least one vibration arm that strikes the portion of the lower lid is silicon oxide.